Applications and Technologies of All-Solid State Blue Laser

1 Introduction Along with the matureness of laser diode (LD) manufacturing technology, the performance of LD has been improved greatly since 1980s, so various kinds of laser devices based on LD have been developed rapidly, especially the all-solid state lasers. After early experiments and researches, the all-solid state lasers have been commercialized successfully.     

插补法CAI研究

数字程序控制计算机辅助教学是将计算机技术用于数字程序控制的教学过程，它帮助学生学习并模拟教学实验．本文介绍了数字程序控制中直线插补和圆孤插补的ＣＡＩ实现方法．     

一种新的基于PARC技术的MIMO系统

MIMO (Multiple-Input Multiple-Output)的显著优点就是在不增加带宽的情况下,能够成倍地提高通信系统容量和频谱利用率,是未来移动通信与个人通信系统实现高速率数据传输,提高高传输质量的重要途径,也是未来移动通信系统广泛采用的关键技术.文中简要介绍了MIMO系统及其一种新的MIMO系统中的应用技术,即PARC(Per-antenna Rate Control)技术.     

基于FPGA乘法器架构的RNS与有符号二进制量转换

RNS(余数数制系统)是一种整数运算系统,在粒度精确性,能源损耗和响应速度上有很大的优势.从RNS到二进制数的输入输出转换是基于余数算法的专用架构实现的关键.本文提出了一个基于N类模的RNS与有符号二进制量的通用转换算法在FPGAs的乘法器上的实现过程.该算法能更有效地进行有符号数与RNS的转换.基于该算法类型乘法器在同类型乘法器中显示出了速度优势.文章中该架构被映射到Altera的10K系列的FPGA上.     

Estimation for the number of components in a mixture model using stepwise split-and-merge EM algorithm

The main difficulty with EM algorithm for mixture model concerns the number of components, say g. This is the question of model selection, and the EM algorithm itself could not estimate g. On the contrary, the algorithm requires g to be specified before the remaining parameters can be estimated. To solve this problem, a new algorithm, which is called stepwise split-and-merge EM (SSMEM) algorithm, is proposed. The SSMEM algorithm alternately splits and merges components, estimating g and other parameters of components simultaneously. Also, two novel criteria are introduced to efficiently select the components for split or merge. Experimental results on simulated and real data demonstrate the effectivity of the proposed algorithm.     

在传统中探寻当代海报的本土设计

在设计国际化的影响下,中国现代视觉设计中充满了受西方影响的视觉语言,“国际化”视觉符号的泛滥与“本土化”视觉语言的失语视觉现象非常突出。作为当今社会人与人交流载体的海报设计,要走出一条“民族个性”的道路,就必须根植于民族文化土壤中,向传统学习,并进行具有创造性的转化,使传统文化符号在当代海报设计中既具有“民族个性”又有“时代性”,这样,我们海报设计才能真正走“国际化”。     

Transient hot-electron effect and its impact on circuit reliability

Transient hot-electron effect and its impact on circuit reliability are investigated. The rate of device decay is monitored as a function of the gate pulse transient period. Simulation results reveal that excess charges during a fast turn off time may cause an increase in the maximum substrate current. This, along with our experimental data, identifies that transient excess carrier may cause the enhancement of device degradation under certain stress conditions. The enhancement factor of the degradation is a function of the gate pulse transient time. Correlation between the analysis based upon AC/DC measurement and calculations based upon transient simulation are shown in the paper. Better agreement with experimental data is obtained by using the transient analysis and on chip test/stress structures. The correlation between AC and DC stress data is also shown based on the impact ionization model. A hot-electron design guideline is proposed based on the circuit reliability analysis. This guideline can help improve the circuit reliability without adversely effecting the circuit performance.     

SISAK快速化学分离装置的建立

SISAK(Short-lived Isotopes Studies by the AKUFVE technique)技术是目前使用最广泛的快速化学分离方法之一,主要应用在短寿命核素的分离和鉴别、超重元素的人工合成以及化学性质研究等方面的工作中.本文简单地叙述了SISAK技术的流程、原理和发展现状,介绍了自行建立的国内第一套基于SISAK技术的快速化学分离装置,并通过从裂变产物中分离短寿命核素这一实例验证了SISAK技术在快速化学分离中的优越性.