High-isolation CPW MEMS shunt switches. 1. Modeling

This paper, the first of two parts, presents an electromagnetic model for membrane microelectromechanical systems (MEMS) shunt switches for microwave/millimeter-wave applications. The up-state capacitance can be accurately modeled using three-dimensional static solvers, and full-wave solvers are used to predict the current distribution and inductance of the switch. The loss in the up-state position is equivalent to the coplanar waveguide line loss and is 0.01-0.02 dB at 10-30 GHz for a 2-μm-thick Au MEMS shunt switch. It is seen that the capacitance, inductance, and series resistance can be accurately extracted from DC-40 GHz S-parameter measurements. It is also shown that dramatic increase in the down-state isolation (20⁺ dB) can be achieved with the choice of the correct LC series resonant frequency of the switch. In part 2 of this paper, the equivalent capacitor-inductor-resistor model is used in the design of tuned high isolation switches at 10 and 30 GHz     

$Ka$-Band Low-Loss and High-Isolation Switch Design in 0.13-$mu{hbox {m}}$ CMOS

This paper presents designs and measurements of Ka-band single-pole single-throw (SPST) and single-pole double-throw (SPDT) 0.13-CMOS switches. Designs based on series and shunt switches on low and high substrate resistance networks are presented. It is found that the shunt switch and the series switch with a high substrate resistance network have a lower insertion loss than a standard designs. The shunt SPST switch shows an insertion loss of 1.0 dB and an isolation of 26 dB at >35 GHz. The series SPDT switch with a high substrate resistance network shows excellent performance with 2.2-dB insertion loss and isolation at 35 GHz, and this is achieved using two parallel resonant networks. The series-shunt SPDT switch using deep n-well nMOS transistors for a high substrate resistance network results in an insertion loss and isolation of 2.6 and 27 dB, respectively, at 35 GHz. For series switches, the input 1-dB compression point (1P₁) can be significantly increased to with the use of a high substrate resistance design. In contrast, of shunt switches is limited by the self-biasing effect to 12 dBm independent of the substrate resistance network. The paper shows that, with good design, several 0.13- CMOS designs can be used for state-of-the-art switches at 26-40 GHz.     

Wideband DC-contact MEMS series switch

The demonstration of a wideband DC-contact MEMS series switch on an alumina substrate is reported. The switch is based on a cantilever beam design. The tip of the cantilever beam was formed into a fork tip design, and its RF performance was measured and compared with a regular rectangular tip. This design reduced up-state capacitance from 10 to 3.8 fF. The beam with fork tip exhibited high isolation: -39, -32 and -17.3 dB at 5, 10 and 77 GHz, respectively. The measured insertion loss was -0.142, -0.172 and 0.36 dB at 5, 10 and 77 GHz, respectively. The switch had low actuation voltage (⩽39 V) and a relatively fast switching time of 45 s. To our knowledge, this is the first demonstration of a high-performance cantilever beam design DC-contact MEMS series switch at W-band frequencies.     

A novel loss compensation technique analysis and design for 60 GHz CMOS SPDT switch

A novel loss compensation technique for a series-shunt single-pole double-throw (SPDT) switch is presented operating in the 60 GHz. The feed-forward compensation network which is composed of an NMOS, a couple capacitance and a shunt inductance can reduce the impact of the feed forward capacitance to reduce the insertion loss and improve the isolation of the SPDT switch. The measured insertion loss and isolation characteristics of the switch somewhat deviating from the 60 GHz are analyzed revealing that the inaccuracy of the MOS model can greatly degrade the performance of the switch. The switch is implemented in TSMC 90-nm CMOS process and exhibits an isolation of above 27 dB at transmitter mode, and the insertion loss of 1.8-3 dB at 30-65 GHz by layout simulation. The measured insertion loss is 2.45 dB at 52 GHz and keeps<4 dB at 30-64 GHz. The measured isolation is better than 25 dB at 30-64 GHz and the measured return loss is better than 10 dB at 30-65 GHz. A measured input 1 dB gain compression point of the switch is 13 dBm at 52 GHz and 15 dBm at 60 GHz. The simulated switching speed with rise time and fall time are 720 and 520 ps, respectively. The active chip size of the proposed switch is 0.5×0.95 mm².     

High-isolation CPW MEMS shunt switches. 2. Design

For pt.1 see ibid., vol.48, no.6, p.1045-1052 (2000). In this paper, the second of two parts, the equivalent RLC model of the shunt switch is used in the design of tuned two- and four-bridge “cross” switches from 10 to 40 GHz. The cross switch attained an insertion loss of less than 0.3-0.6 dB, a return loss below -20 dB from 22 to 38 GHz in the up state, and a down-state isolation of 45-50 dB with only 1.5 pF of down-state capacitance (C_d). Also, an X-band microelectromechanical system (MEMS) switch with an insertion loss of less than 0.2 dB and an isolation of 35 dB is presented. This is done by inductively tuning the LC series resonance of the shunt switch. The MEMS bridge height is 1.5-2.5 μm, resulting in a pull-down voltage of 15-25 V. Application areas are in low-loss high-isolation communication and radar     

一种DC～5GHz串联微波开关的温度特性和功率处理能力的测试与分析

描述了一种串联微波MEMS开关的设计、制造过程,它制作在玻璃衬底上,采用金铂触点,在DC～5GHz,插损小0.6dB,隔离度大于30dB,开关时间小于30μs.对这种微波开关的温度特性和功率处理能力进行了测试,在DC～4GHz,85℃下的插损增加了0.2dB,-55℃下的插损增加了0.4dB,而隔离度基本保持不变.在开关中流过的连续波功率从10dBm上升到35.1dBm,开关的插损下降了0.1～0.6dB,并且在35.1dBm(3.24W)下开关还能工作.和所报道的并联开关最大处理功率(420mW)相比,该结果说明串联开关具有较大的功率处理能力.     

高隔离度X波段RF MEMS电容式并联开关

研究了一种新型的、应用于X波段的高隔离度RF MEMS电容式并联开关结构。相比于普通的并联结构,该开关通过共面波导(CPW)传输线与地平面之间的衬底刻槽结构将隔离度提高了7dB,关态时在13.5GHz谐振频率处的隔离度为-54.6dB,执行电压为26V。弹簧梁结构开关的执行电压下降为14V,在11GHz处其隔离度为-42.8dB。通过两个并联开关级联与开关间的高阻传输线构成的π型调谐开关电路,在11.5GHz处的隔离度为-81.6dB。     

Inline capacitive and DC-contact MEMS shunt switches

This paper presents inline capacitive MEMS shunt switches suitable for X/K-band and Ka/V-band applications. The inline switch allows for a low- or high-inductance connection to the ground plane without changing the mechanical characteristics of the MEMS bridge. Excellent isolation and loss are achieved with this design, and the performance is very similar to the standard capacitive MEMS shunt switch. Also, a new metal-to-metal contact MEMS shunt switch is presented. A novel pull-down electrode is used which applies the electrostatic force at the same location as the metal-to-metal contact area. A contact resistance of 0.15-0.35 Ω is repeatable, and results in an isolation of -40 dB at 0.1-3 GHz. The measured isolation is still better than -20 dB at 40 GHz. The application areas are in high-isolation/low-loss switches for telecommunication and radar systems     

A DC-contact MEMS shunt switch

This paper presents the design, fabrication, and performance of a metal-to-metal contact micro-electro-mechanical (MEMS) shunt switch. The switch is composed of a fixed-fixed metal beam with two pull-down electrodes and a central DC-contact area. The switch is placed in an in-line configuration in a coplanar waveguide transmission line. This topology results in a compact DC-contact shunt switch and high isolation at 0.1-18 GHz. The isolation at MM-wave frequencies is limited by the inductance to ground and is -20 dB at 18 GHz. The application areas are in wireless communications and high-isolation switching networks for satellite systems     

高隔离度宽频带MEMS双膜桥开关

利用一种新型双边加直流驱动电极的电容耦合式MEMS并联膜开关与直接接触式并联膜开关进行级联,形成MEMS双膜开关.通过对其尺寸和结构的优化,降低开关阈值电压,Coventor软件模拟表明,开关的阈值电压小于20V;通过对其匹配设计改善开关的高频性能,HFSS软件模拟的结果表明,在DC～20GHz整个频带内,开关的插入损耗优于-0.1dB,反射损耗低于-30dB,隔离度低于-20dB,在 谐振点处隔离度能达到-40dB.     

A high-performance 40-85 GHz MMIC SPDT switch using FET-integrated transmission line structure

A compact ultra-broadband distributed SPDT switch has been developed using GaAs PHEMTs. An FET-integrated transmission line structure, where the source pad of the shunt FET has been integrated into the signal line while the drain has been grounded to a via-hole with minimum parasitic inductance, has been proposed to extend the operating bandwidth of the distributed switches. SPDT and SPST switches using this structure have been fabricated using a commercial GaAs PHEMT foundry. The SPDT switch showed low insertion loss (<2 dB) and good isolation (>30 dB) over an octave bandwidth from 40 to 85 GHz. At 77 GHz, the SPDT switch showed extremely low insertion loss of 1.4 dB and high isolation of 38 dB. The chip size was as small as 1.45/spl times/1.0 mm/sup 2/. To the best of our knowledge, this is among the best performance ever reported for an octave-band SPDT switch at this frequency range. SPST switch also showed the excellent performance with the insertion loss of 0.4 dB and isolation of 34 dB at 60 GHz.     

一种X波段GaAs单片单刀双掷开关

采用0.2μmGaAsPHEMT工艺设计了一种X波段单刀双掷开关单片集成电路。在片测试结果为8～11GHz范围内,隔离度>30dB,在中心频率9.5GHz能够达到45dB,插损<1.2dB。芯片结构非常简单紧凑,仅用了两个并联的PHEMT管。     

一种双波段MEMS低噪声放大器设计

本文利用一种MEMS电容式开关并联实现双波段2．1GHz／4．6GHz微机械低噪声放大器。根据MEMS电容开关的电容特性,实现LNA电路匹配阻抗的变化、在不同的波段实现谐振匹配,从而实现双波段分别放大的功能。首先提出一种电容式开关的设计,理论、仿真分析了开关的特性,开关在2．21GHz和4．8GHz具有良好的插入损耗和隔离度、插损为2．2dB左右,隔离度达到30dB以上。其次将开关引入于基于Casoode放大管的LNA电路中、和CMOS电路具有很好的兼容性,设计了LNA的电路模型和仿真分析、分析结果表明,在频率为2．21GHz时、增益达到11．4dB,4．8GHz时、增益达12．5dB,二波段隔离度在30dB以上、噪声在4．1dB左右,该研究方法和设计克服了普通双波段LNA需要两路单独电路的缺点,该器件可应用在Wimax,WiFi等3．5G、4G无移动通信网络中。     

DC－40GHzMMIC开关

ＤＣ－４０ＧＨｚＭＭＩＣ开关叶禹康，俞土法，伍祥冰（南京电子器件研究所，２１００１６）提要＊用微波单片集成电路（ＭＭＩＣ）技术设计制作了高隔离度、超快速ＤＣ－４０ＧＨｚＭＭＩＣ开关（ＳＰＳＴ）。开关采用串联、并联单元ＭＥＳＦＥＴ兼用的电路结构。芯片尺...     

DC－40GHzMMIC开关

ＤＣ－４０ＧＨｚＭＭＩＣ开关叶禹康，俞土法，伍祥冰（南京电子器件研究所，２１００１６）提要＊用微波单片集成电路（ＭＭＩＣ）技术设计制作了高隔离度、超快速ＤＣ－４０ＧＨｚＭＭＩＣ开关（ＳＰＳＴ）。开关采用串联、并联单元ＭＥＳＦＥＴ兼用的电路结构。芯片尺...     

A Si MMIC compatible ferroelectric varactor shunt switch for microwave applications

This letter describes a ferroelectric thin-film based varactor shunt switch, for microwave and millimeterwave switching applications. Our implementation is based on a coplanar waveguide transmission line shunted by a ferroelectric varactor. The concept of switching ON and OFF is based on the dielectric tunability of the ferroelectric barium strontium titanium oxide (BST) thin-films. From experimental verification, the isolation of a switch with a varactor area of 75/spl mu/m/sup 2/ was approximately 20dB at 35GHz and the insertion loss was below 4.5dB up to 35GHz. This letter addresses the design and experimental verification of the first ferroelectric varactor shunt switch with an Si monolithic microwave integrated circuit compatible process.     

Novel high-isolation FET switches

This paper describes novel high-isolation monolithic microwave/millimeter-wave integrated circuit (MMIC) field-effect transistor (FET) switches that have higher isolation characteristics than conventional switches without much insertion loss degradation. The newly developed switches consist of series/shunt FETs and T-shaped R-C-R circuit. Each FET switch utilizes the parasitic capacitive component of the FETs in the off-state to produce a band-rejection filter at the operating frequency. The design method of the newly proposed switches and their characteristics are described herein. With this method, the isolation characteristics are improved by more than 15 dB between 5.4 GHz and 6.4 GHz and more than 20 dB between 5.5 GHz and 6.1 GHz over conventional values     

MEM relay for reconfigurable RF circuits

We describe a microelectromechanical (MEM) relay technology for high-performance reconfigurable RF circuits. This microrelay, fabricated using surface micromachining, is a metal contact relay with electrical isolation between signal and drive lines. This relay provides excellent switching performance over a broad frequency band (insertion loss of 0.1 dB and isolation of 30 dB at 40 GHz), versatility in switch circuit configurations (microstrip and coplanar, shunt and series), and the capability for monolithic integration with high-frequency electronics. In addition, this MEM relay technology has demonstrated yields and lifetimes that are promising for RF circuit implementation     

一种串联RFMEMS开关的隔离度补偿措施

提出了采用陷波电路结构来补偿串联RFMEMS开关断开时的耦合电容,提高其隔离度的一种方法。理论分析显示,采用这种方法,在2～5GHz的频率范围内,可以使开关的隔离度最多提高15郾6dB,而插入损耗只受到0郾07dB的影响。     

Small‐Sized High‐Power PIN Diode Switch with Defected Ground Structure for Wireless Broadband Internet

This letter presents a small‐sized, high‐power single‐pole double‐throw (SPDT) switch with defected ground structure (DGS) for wireless broadband Internet application. To reduce the circuit size by using a slow‐wave characteristic, the DGS is used for the quarter‐wave (°/4) transmission line of the switch. To secure a high degree of isolation, the switch with DGS is composed of shunt‐connected PIN diodes. It shows an insertion loss of 0.8 dB, an isolation of 50 dB or more, and power capability of at least 50 W at 2.3 GHz. The switch shows very similar performance to the conventional shunt‐type switch, but the circuit size is reduced by about 50% simply with the use of DGS patterns.