基于MCGS组态技术的PLC实践教学改革

针对目前PLC实践教学中存在的问题,如设备投入不足、学生学习兴趣不高等,提出将MCGS组态软件与PLC控制技术相结合来设计监控系统,并以混料简易控制为例,讲解组态控制系统的构造过程。实践证明,该上位机监控系统可以模拟现场自动设备系统的工艺流程,可以与PLC实施信息交互,可以实时监控PLC工作。此改革既可缓解高校PLC实践教学设备投入不足的困难,又可提高学生的学习兴趣,培养学生PLC控制系统的综合开发能力。     

基于工控组态软件的PLC虚拟实验系统设计与实现

针对职业院校PLC实验硬件设备不足,实验项目有限,实验教学力度不断增强这种现状,提出了利用MCGS组态软件,设计并开发PLC虚拟实验系统的方法。包括虚拟实验系统的组成、实验项目的设计流程,PLC实验在虚拟实验平台的实现。     

基于PLC的无级调速控制系统设计

以无级调速为对象,基于S7-200PLC与MCGS进行了控制系统的设计。首先介绍PLC、无级调速和MCGS组态软件的现状,以PLC控制技术为核心,进行无级调速的控制系统设计。接着对控制系统进行编程调试,最后对运动过程进行MCGS组态监控,来验证设计的可行性。．所采取方法对工业调速的自动控制具有重要的意义。     

基于PLC的无级调速控制系统设计

以无级调速为对象,基于S7-200PLC与MCGS进行了控制系统的设计。首先介绍PLC、无级调速和MCGS组态软件的现状,以PLC控制技术为核心,进行无级调速的控制系统设计。接着对控制系统进行编程调试,最后对运动过程进行MCGS组态监控,来验证设计的可行性。所采取方法对工业调速的自动控制具有重要的意义。     

基于行为导向教学法PLC课程实训单元设计

从高职院校机电专业PLC课程的教学现状出发,为更好地培养高职院校学生的实践动手能力,根据PLC课程的特点,把行为导向教学法应用到此课程中,结合组态技术,设计PLC教学实训单元。给出了实训单元的硬件组成、软件控制流程以及组态画面,描述了利用该单元PLC教学项目实训的开展。由此使PLC课程教学实训达到优化,教学的效率和质量得到提高。     

基于MCGS的水箱液位监控系统的设计

液位控制是工业生产中比较常见的一种控制任务。为了加强液位控制的自动化程度和对液位控制的实时监控,文章将操作性很高的PLC和可视度很直观的组态软件MCGS相结合,由PLC进行液位控制,MCGS实现远程监控、数据曲线观测和超限报警等功能。通过实验证明,这套基于MCGS的PLC水箱液位监控系统具有及时调节、监控方便的特点,具有一定的研究和应用价值。     

基于MCGS的PLC实验教学系统的构建

根据PLC课程的教学特点,针对目前很多高校该课程实践环节的现状,提出运用MCGS组态软件技术构建PLC实验教学系统构想及现实意义并予以实现.文章通过实例,给出了系统的结构框图、组态软件虚拟PLC被检对象变量设置方法等,图文并茂,较详细介绍了系统开发过程.     

基于PLC控制的五车位升降横移式立体车库设计

本文主要以五车位升降横移式立体车库为研究对象,对其进行控制系统研究与设计。文章详细介绍了车库PLC控制系统和监控系统,其中控制部分工作任务由西门子PLC完成,监控部分采用基于WINDOWS平台的工控组态软件MCGS。系统具有友好的人机交互界面,控制灵活,系统的安全性和可靠性高。     

基于MCGS和三菱PLC的洗衣机控制仿真系统设计

本设计借助MCGS组态软件平台,对PLC课程教学中用到的发光二极管模拟洗衣机动作的实验板进行虚拟系统开发,介绍了虚拟系统开发的具体步骤,并调试分析了虚拟系统。开发的虚拟系统画面直观,操作简单,有利于学生提高编写PLC控制程序的效率,降低学校办学成本。     

基于PLC/MCGS的交通灯控制仿真系统设计

针对交通控制系统中交通灯控制这一核心问题,选择三菱FX1S可编程控制器为控制核心部件,同时结合MCGS组态软件,构建了交通灯监控系统。利用梯形图进行下位机软件设计,在MCGS组态软件中进行上位机监控界面设计,同时将硬件与MCGS组态软件联机调试,实现了交通灯监控,系统界面友好,控制效果良好。     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.