视频压缩技术与标准

随着H.264/AVC草案的推出，视频压缩技术及标准的发展成为热点。本文简单介绍与分析了现有的视频压缩技术与标准，并对我国在多媒体技术的研究与相关标准的制定作了讨论。     

802.20标准步履维艰FLASH-OFDM另辟蹊径

IEEE 802．20标准曾经被认为是与3G乃至4G竞争的技术，然而最近一段时间却一直默默无闻，反而是WiMAX后来居上，声势日益浩大。难道802．20就从此沉寂下去了?本文对802．20标准及其相关技术FLASH-OFDM进行了分析，并就未来发展进行了讨论。     

企业信息化标准技术采纳实证框架研究

在对企业信息化标准的技术采纳进行现状分析的基础上，给出了企业信息化标准技术采纳的实证框架，介绍了企业信息化标准技术采纳研究方案的实施与实证结果。     

汽车计算平台工程国内相关标准体系

介绍了我国汽车计算平台的技术框架及其标准体系的制定原则，并对我国与汽车计算机平台相关的标准现状进行分析，对我国汽车产业的标准化发展提出建议。     

家庭网络的联网技术与标准探究

家庭网络的联网技术可分为家庭网络接入技术、家庭网络高速信息主网联网技术和家庭网络低速控制子网联网技术三大类。文中针对不同类别的主要联网技术与相关标准进行了简要的对比、分析,特别是对家庭网络控制子网的总线技术以及相关的国内外标准进行了着重描述,并对不同技术、标准间的关系进行了归纳、分析。     

国外交互数字电视标准的现状分析与研究

着重介绍了国内外交互数字电视标准DVB—RC和DOCSIS的相关技术和特点，并对基本特性进行了比较，为制定我国相关技术标准提供技术基础。     

远程网络教育标准体系结构

伴随着网络和远程教育的发展，教学资源的共享和教学系统的互操作成为了一个十分重要也十分迫切的问题。在教育部的领导下，我国开始了远程教育技术规范的研究和制定工作，着重解决上述两个问题。对国际上的教育技术规范作了简单的介绍，着重阐述了我国现代远程教育技术系列规范(DLTS)的总体框架，对各个子标准作了简要的介绍，同时阐明了各个子标准之间的相互关系。最后，还对标准的应用作了相关的说明，并给出了一个应用的实例。     

测试仪器总线标准应用及发展

通过对适合于测试仪器的各类总线标准和规范进行研究，分析了测试仪器总线技术的发展前景及相关标准的发展趋势。     

标准互感器的定置管理技术研究与应用

本文通过对供电公司营销系统互感器实验室标准互感器设备管理的现状分析研究了基于无线射频技术的互感器实验室标准互感器的定置管理技术与方法，提出了这样一种解决方案，利用机械结构进行存放位置管理，利用无线射频技术进行互感器的识别和取用及送回管理，采用指示灯的不同颜色指示标准互感器当前状态。利用微控制器进行实时信号采集与处理，将相关参数信息上传给主机系统控制软件。系统自动记录标准互感器取走、送回等信息，并控制对应互感器指示灯的颜色，从而实现标准互感器设备的有效管理。     

33G技术及标准正加速完善

在全球3G及增强型3G网络商用化进程稳步推进的同时，为满足移动宽带数据业务对传输速率的要求，研究开发速率更高、性能更先进的新一代移动通信技术正成为世界各国和相关机构关注的重点。后3G相关技术及标准的超前研究已经被提上了议事日程。目前，在多方协力推进下，B3G技术及标准的预研工作已经取得较大进展。在移动通信高速发展的背景下，业界普遍认为，移动通信市场特别是移动数据通信市场仍然有巨大的发展空间。[第一段]     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.