AVR单片机串行加载DDS芯片AD9835的实现

设计了AVR单片机AT90S8515串行加载DDS芯片AD9835的硬件电路,根据AD9835要求的串行加载数据时序图,给出了串行加载子程序的方框图并列出了AT90S8515串行加载AD9835芯片的子程序清单。     

一种通用可调预热定时模块的设计

预热定时模块是电真空管发射机的重要组成部件,传统的预热定时模块受到了专一性和人机交互不良的制约,用户使用起来不太方便。本文介绍了一种利用AT90S8515单片机实现的可调预热定时模块,体现了模块化、通用化和人性化的设计思想。     

基于单片机的蔬菜大棚监控系统设计

设计了一个基于AT89S52单片机控制的蔬菜大棚监控系统,可实现红外防盗报警、温湿度测量和LCD显示功能。系统主要包括单片机最小系统、红外热释电传感器、温湿度传感器、液晶显示电路和声光报警电路。该设计简单实用,抗干扰能力强、灵敏度高、安全可靠,具有较高的实用价值。     

AVR单片机在雷达伺服系统中的应用研究

本文利用ATMEL新一代AVR单片机(AT90S8515)的新特性实现了对雷达伺服码盘系统的数据处理和对伺服直流电机的控制等应用,并给出了软硬件设计方法,使用C语言程序编程,在单片机软件设计中引入了消息的概念,简化了设计流程和硬件电路,提高了伺服系统的效率和稳定性,具有较大的推广应用价值。     

无线数据传输系统的实现

介绍了一种无线数据传输系统的实现方法,并结合无线调制解调器芯片MSM6948和AT90S8515单片机的特点及其工作原理,给出了具体的电路和主程序流程图。该方案可通过音频接口与常规调频电台相连,还可与具有标准RS-232接口的数据设备相连,实现数据信号的无线传输。     

无线数据传输系统的实现

介绍了一种无线数据传输系统的实现方法,并结合无线调制解调器芯片MSM6948和AT90S8515单片机的特点及其工作原理,给出了具体的电路和主程序流程图.该方案可通过音频接口与常规调频电台相连,还可与具有标准RS-232接口的数据设备相连,实现数据信号的无线传输.     

基于GSM网络短消息的汽车防盗系统设计

TC35T是SIEMENS公司推出的GSM无线调制解调器。文中介绍了它的主要特性，同时结合AT89S52单片机给出了TC35T在汽车防盗系统方面的应用方案，给出了一个汽车防盗系统的设计方法。     

基于AT90S8535单片机数据采集及通信的应用

以AT90S8535单片机的A/D转换器和通用串行接口UART为重点，介绍了AT90S8535的主要性能特点，并给出了基于AT90S8535的数据采集及通信的硬件电路和相应的软件设计。     

大容量FLASH在飞行体参数记录仪中的应用

介绍大容量闪存在飞行体参数记录仪中的应用。在简单介绍飞行体参数记录仪的基础上详细描述K9F1G08U0A芯片的结构特点及主要功能,通过运用单片机AT90S8515及CPLD对闪存K9F1G08U0A进行控制,实现对闪存的读取、编程、擦除的操作,完成数据的实时记录、数据采集等功能,使得该记录仪具有容量大、低功耗、集成度高等优点,在未来有更好的发展前景。     

基于AT90S8515单片机的蛇形机器人控制系统设计

介绍了一种基于AT90S8515单片机控制的蛇形机器人的结构原理和软硬件实现方法,该机器人采用遥控方式操作,能够良好地模拟蛇的直线运动,并能以设定的速度完成预先编排的抬头、摆尾等动作.由于采用了RISC结构的控制器,该机器人运动控制算法简单实用,成本较低,具有广阔的应用前景.     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.