化学助剂作用下银纳米线生长机制与尺寸控制的研究进展

介绍了液相法制备银纳米线(AgNW)过程中常用的阳离子型控制剂、阴离子型控制剂和分子型控制剂三类化学控制剂对银纳米线尺寸的影响;阐述了不同种类化学控制剂的作用机理,总结了化学控制剂作用下银纳米线的形成机制,分别是:多孪晶颗粒单轴生长机制、溶解平衡机制、定向附着机制以及自组装机制;对液相法制备银纳米线过程中常用的高分子包覆剂的种类及作用机制进行了归纳;最后结合实际问题,分别指出化学控制剂与包覆剂在制备银纳米线时的优点与不足。     

一种用于ATM网的UPC模糊逻辑监控机制

在ＡＴＭ网络中，用户参数控制（ＵＰＣ）确保信源业务流遵守呼叫接纳控制中达成的协约。根据监察机制的要求，对漏桶机制跳跃式窗口机制、指数加权滑动平均机制以及本提出的一种模糊逻辑监控机制进行了分析和仿真，结果表明模糊逻辑监控机制在选择性和动态性上优于其它几种控制机制。     

一种嵌入式流媒体播放器VCR控制的设计与实现

提出一种嵌入式流媒体播放器VCR控制的设计和实现方案,主要对控制文件的生成方法、系统工作原理、网络传输机制、QoS控制机制进行介绍.     

一种嵌入式流媒体播放器VCR控制的设计与实现

提出一种嵌入式流媒体播放器VCR控制的设计和实现方案 ,主要对控制文件的生成方法、系统工作原理、网络传输机制、QoS控制机制进行介绍     

无线网络接纳控制算法研究

介绍了接纳控制算法在无线资源管理中的控制机制,同时说明了接纳机制的作用、组成以及分类,最后分析了传统无线网络中的几种接纳控制机制的优缺点和应用环境。     

建立和实施一体化管理体系的方法(下)

(上接2003年第4期第57页)4 一体化管理体系的运行控制一个组织的体系建立标志是：文件编制完成并经正式批准发布。体系运行的过程就是执行文件，按文件要求去组织实施，即“做所写”的过程。体系运行的有效性是持续改进并不断追求卓越的基础和前提，保持体系有效性的手段是实施运行控制。其主要方式可分为内部控制机制和外部控制机制，内部控制机制主要有：过程监测、内部审核、管理评审;外部控制机制主要有：相关方(或第二方)依据法规或合同对组织进行的监督检查和审核、认证机构进行的第三方审核。下面对内部控制机制中的过程监测、内审、…     

综合业务接入网关引入资源动态分配机制

文章提出综合业务接入网关在现有流量控制前提下,引入资源动态分配的机制,优化综合业务接入网关关流量控制机制,包括综合业务接入网关现网中发现的问题、现有流量控制机制,以及资源动态分配机制和实现流程等内容。基于资源动态分配机制,可以更有效地使用综合业务接入网关的资源,促进网络资源的合理利用,提升业务收入。     

TCP的发展与改进

TCP是因特网上最通用的传输层协议之一，其核心是拥塞控制机制。文中在介绍TCP基本机制的基础上。对TCP拥塞控制的改进机制进行了讨论，这些改进包括：避免不必要的重传超时、撤销不必要的拥塞控制、显式拥塞通知和数据损伤通知等。     

基于网络控制的分层多点播送速率控制机制研究

本文在视频分层编码及分层传输协议的基础上，将基于网络控制与接收端控制机制相结合，提出一种新的分层多点播送速率控制机制。文中给出了该机制的拥塞检测、流行度权衡和数据层增加和丢弃算法。实验结果表明，该速率控制机制通史对拥塞做也快速响应，并在较好利用宽带的基础上保证高流行度的会话流具有较好的服务质量。     

ASON控制平面生存性研究

自动交换光网络ASON的生存性机制是其核心和最重要的内容之一.目前对于ASON传送平面生存性机制研究较多,而对于控制平面的生存性机制研究较少.文章首先分析了ASON基本结构及其生存性策略,然后从控制平面与传送平面关系着手,深入研究了ASON控制平面的生存性机制,提出了一种逻辑独立的控制平面生存性机制解决方案.     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.