以一种新的距离度量作为反馈的相关跟踪方法

基于相关的模板匹配方法在图像跟踪中得到了广泛的应用,但是这种方法的主要缺点是对图像噪声非常敏感,而且由这种方法得出的相关曲面比较平坦。为了有效抑制噪声和局部遮挡对图像的影响,提出用鲁棒统计中的一个值代替相关值作为距离度量。它不是计算两幅图像的对应像素差值,而是计算两幅图像中差别不大的对应像素对的个数。实验证明这样得到的曲面相对　　收稿日期:2003 08 31;　修订日期:2003 10 28作者简介:张桂林(1944 ),男,天津人,教授,博士生导师,主要研究方向为自动识别、人体生物统计特征识别、图像处理算法与系统性能评估等。　　　　　　　要尖锐得多。当上述的距离度量应用于跟踪过程中时,模板的合理更新对跟踪非常重要。基于上述的距离度量方法,提出了一种新的模板更新策略。利用两幅图像中近似像素在整修匹配模板像素中所占的比例大小决定加权系数。这种加权策略可以自适应地根据图像序列的变化选择更新相关模板,同时在一定程度上减小模板漂移的危险。     

Simultaneous Measurement of Viscosity and Density with an Oscillating-Disk Instrument: The Effect of Fixed Plates

The period and damping of the free motion of a body oscillating in a fluid depend on the fluid's viscosity and density. Commonly, a working equation which expresses the damping as a function of the viscosity and density is solved for the viscosity, the damping being measured and the density being treated as an independently supplied parameter. Another working equation exists for the period, and, in general, the period depends on a combination of the viscosity and the density which is linearly independent of the combination that appears in the damping equation. It is, therefore, in principle, possible to determine both the viscosity and the density by a simultaneous solution of the two coupled working equations, since the period also is measured. In this paper, the working equations that describe the oscillating-disk viscometer are reviewed and their simultaneous solution is considered. The effect of fixed plates symmetrically located above and below the oscillating disk is of specific interest. The paper's main result is that fixed plates can dramatically increase the independence of the damping and period working equations, so that it becomes indeed feasible to determine the viscosity and the density of a fluid simultaneously from the damping and period of oscillating motion. A price is paid, however, because the instrument's working equations when plates are present have multiple solutions. Under special conditions, these multiple solutions can coalesce, and then one can only deduce the viscosity from the damping equation if the density is known a priori.     

大坝监测自动化中的人工比测研究

阐述了人工比测的概念、方式和数据分析方法,对人工比测及数据分析中应注意的问题也进行了深入研究。     

Improving the Calibration of Vacuum Gas Flow – Control Leak Gauges

A new and original method of calibrating helium leaks that makes it possible to take into account the existence of a number of auxiliary phenomena is described. For this purpose, a hollow leak the purpose of which is to reproduce only desorbed gas flows, is introduced into the vacuum system of the calibration bench. Analysis of the results of corresponding cumulation measurements makes it possible to introduce corrections for these phenomena.     

Measurement and Identification of the Parameters of SPICE-Models of a Bipolar Transistor

A method of measuring and identifying the static parameters of a bipolar transistor is considered. The characteristic of the transistor, from which the parameters of the model are determined, is chosen depending on what group the calculated parameters belong to. The characteristics are measured in such a way that the equations of the model describing them can be reduced to the simplest form.     

基于形态学top-hat算子的多传感器图像融合

本文根据形态学top-hat算子能够提取图像中极大值与极小值区域的特点,将其应用于多传感器图像融合的两个重要领域——多聚焦图像融合和高分辨、多光谱图像融合.实验中将本文方法与Laplacian塔型变换、子波变换、主分量分析等方法进行了比较,结果表明本文所提的基于top-hat算子的融合方法具有优越的性能,拓广了top-hat算子的应用范围.     

利用非Bell基测量实现三粒子W态的隐形传送

研究非Bell基测量的未知三粒子W态的隐形传态方案.先利用原子和腔场的共振相互作用制备未知三原子W态.接着,利用两原子同时在强经典驱动场驱动下和单模腔场发生相互作用,产生态的演化,来制备EPR对量子信道.最后利用和制备量子信道同样的方法来实现未知三原子W态的隐形传送.在传送过程中,可忽略腔场热作用和腔延迟作用的影响.传送成功的总几率为1.     

连续波雷达测距中的解模糊技术

研究连续波雷达测距中的距离模糊问题，分析几种常用解模糊方法的性能，并讨论参差比的选取对测距范围的影响。     

传感器管理及其在相控阵雷达中的应用

传感器管理是数据融合的一部分。介绍了传感器管理的概念和框架 ,概述了国内外传感器管理算法的研究现状。主要工作是针对相控阵雷达这一传感器 ,通过对其不同工作模式以及不同参数的管理 ,来说明传感器管理的原理。提出了一种新的自适应采样周期算法 ,仿真结果表明该算法的优越性     

High resistivity measurement of SiC wafers using different techniques

To establish fast, nondestructive, and inexpensive methods for resistivity measurements of SiC wafers, different resistivity-measurement techniques were tested for characterization of semi-insulating SiC wafers, namely, the four-point probe method with removable graphite contacts, the van der Pauw method with annealed metal and diffused contacts, the current-voltage (I-V) technique, and the contactless resistivity-measurement method. Comparison of different techniques is presented. The resistivity values of the semi-insulating SiC wafer measured using different techniques agree fairly well. As a result, application of removable graphite contacts is proposed for fast and nondestructive resistivity measurement of SiC wafers using the four-point probe method. High-temperature van der Pauw and room-temperature Hall characterization for the tested semi-insulating SiC wafer was also obtained and reported in this work.