P对Au/Ni/Cu焊盘与SnAgCu焊点焊接界面可靠性的影响

采用回流焊工艺在ENIG镀层印制电路板上组装289I/Os无铅Sn-3.0Ag-0.5Cu球栅阵列封装器件,对封装后的电路板进行随机振动可靠性试验,采用X-Ray、SEM和EDX等测试确定焊点在随机振动试验过程中的失效机制,探讨焊点沿界面失效与镀层内P元素的分布和含量的关系.在振动试验中失效和未失效的BGA焊点与镀层界面表现出类似的微观形貌,Ni层因被氧化腐蚀而在焊点截面形貌上出现"缺齿"痕迹,而在表面形貌图上此呈现黑色的氧化腐蚀裂纹.P在镀层表面的聚集对Ni的氧化腐蚀有促进作用,同时P的聚集也明显降低焊点结合界面的机械强度.Ni层的氧化和Ni层表面P元素的聚集是引发焊点沿焊点,镀层结合界面开裂的主要原因.     

双面贴装电路板上BGA焊点的潜在失效机理

采用双面贴装回流焊工艺在FR4基板表面贴装Sn3.0Ag0.5Cu(SnAgCn)无铅焊点BGA器件,通过对热应力加速实验中失效的SnAgCu无铅BGA焊点的显微结构分析和力学性能检测,研究双面贴装BGA器件的电路板出现互连焊点单面失效问题的原因,单面互连焊点失效主要是由于回流焊热处理工艺引起的.多次热处理过程中,NiSnP层中形成的大量空洞是导致焊点沿(Cu,Ni)6Sn5金属间化合物层和Ni(P)镀层产生断裂失效的主要因素.改变回流焊工艺是抑制双面贴装BGA器件的印制电路板出现互连焊点单面失效问题的关键.     

等温时效对SnAgCu焊点界面组织及剪切强度的影响

研究了Sn-3.0Ag-0.5Cu/Cu焊点分别在1、5、10min焊接时间后在373、403、438K时效温度下焊点界面IMC的生长和剪切强度随时效时间的变化,同时对焊点断口形貌及断裂模式进行了分析。结果表明,焊接时间越长,界面IMC层越厚。随着时效时间的延长,界面IMC不断增厚,其生长动力学符合抛物线生长规律,生长激活能为75.03kJ/mol;焊点剪切强度随时效时间增加不断下降,其断裂方式从开始的韧性断裂逐渐转变为局部脆性断裂。     

微量混合稀土对SnAgCu钎料合金性能的影响

通过向Sn-3.8Ag-0.7Cu钎料合金中添加微量的Ce基混合稀土，研究了不同稀土含量对SnAgCu合金物理性能、润湿性能及力学性能的影响，同时对显微组织进行了分析。试验结果表明，微量的混合稀土可以显著提高SnAgCu钎料接头在室温下的蠕变断裂寿命，尤其是当稀土的质量分数为0．1％时，其蠕变断裂寿命可以达到Sn-3.8Ag-0.7Cu钎料的7倍以上。通过对SnAgCuRE钎料合金物理、工艺及力学性能的测试，显微组织分析表明，随着稀土含量的增加，钎料的组织逐渐细化，但同时，稀土化合物的数量增多，对钎料的力学性能产生不利影响。综合考虑，最佳的稀土质量分数为0．05％－0．5％，不宜超过1．0％。     

Interfacial reactions and compound formation of Sn-Ag-Cu solders by mechanical alloying on electroless Ni-P/Cu under bump metallization

Electroless Ni-P under bump metallization (UBM) has been widely used in electronic interconnections due to the good diffusion barrier between Cu and solder. In this study, the mechanical alloying (MA) process was applied to produce the SnAgCu lead-free solder pastes. Solder joints after annealing at 240°C for 15 min were employed to investigate the evolution of interfacial reaction between electroless Ni-P/Cu UBM and SnAgCu solder with various Cu concentrations ranging from 0.2 to 1.0 wt.%. After detailed quantitative analysis with an electron probe microanalyzer, the effect of Cu content on the formation of intermetallic compounds (IMCs) at SnAgCu solder/electroless Ni-P interface was evaluated. When the Cu concentration in the solder was 0.2 wt.%, only one (Ni, Cu)₃Sn₄ layer was observed at the solder/electroless Ni-P interface. As the Cu content increased to 0.5 wt.%, (Cu, Ni)₆Sn₅ formed along with (Ni, Cu)₃Sn₄. However, only one (Cu, Ni)₆Sn₅ layer was revealed, if the Cu content was up to 1 wt.%. With the aid of microstructure evolution, quantitative analysis, and elemental distribution by x-ray color mapping, the presence of the Ni-Sn-P phase and P-rich layer was evidenced.     

添加微量稀土元素的SnAgCu无铅钎料的研究

介绍目前国际上较为公认的SnAgCu系无铅钎料的特点,并汇总了国际上相关专利的情况.同时,结合本实验室的专利技术,介绍了添加微量稀土对SnAgCu系无铅钎料性能的影响,并着重研究了稀土对显微组织,特别是金属间化合物的影响规律.研究结果表明:从综合性能角度考虑,添加稀土的作用明显,特别是显著改善了钎料的抗蠕变性能,稀土添加量的最佳范围在w(0.05～0.25)%之间.适量的稀土添加,可有效抑制金属间化合物的生长,细化组织.     

电子封装用SnAgCuGa钎料的改性

针对SnAgCu钎料存在的熔点偏高、润湿性较差等不足,研究了不同Sb含量对SnAg3.5Cu0.7Ga1钎料性能的影响。结果表明,随着Sb含量的增加,SnAg3.5Cu0.7Ga1钎料的固液相线呈增长趋势,但均低于230℃;Sb含量添加0.5%时,SnAg3.5Cu0.7Ga1合金在240℃无卤素松香助焊剂下润湿性变化不大,当Sb含量达到1.0%以上时,SnAg3.5Cu0.7Ga1合金的润湿性随着Sb含量的增加而提高。添加少量的Sb可以提高SnAg3.5Cu0.7Ga1无铅钎料的抗氧化性,随着Sb含量的增加,产生裂纹时的循环次数依次增加,可以提高钎焊铜合金接头的热疲劳强度。     

Microstructure, creep properties, and failure mechanism of SnAgCu solder joints

The effect of microstructure on the creep properties and the failure mechanism of SnAgCu solder joints was studied. Single overlap shear specimens made of FR-4 printed circuit boards (PCBs) with organic solderability preservative (OSP), NiAu, and immersion Sn surface finish were reflow-soldered with hypoeutectic, eutectic, and hypereutectic SnAgCu solder paste. Creep tests of the solder joints were performed at 85°C and 105°C under constant load. The effect of microstructure on the creep behavior of the joints was studied by examining the fracture surfaces and cross-sectional samples of the tested joints. Results show that the intermetallic compound at the interface between the PCB and solder affects the fracture behavior of SnAgCu solder joints, thus creating a significant difference in the creep properties of solder joints on different surface finishes. Composition of SnAgCu solder was also found to affect the creep properties of the joints.     

Solderability testing of 95.5Sn-3.9Ag-0.6Cu solder on oxygen-free high-conductivity copper and Au-Ni-Plated kovar

The solderability of 95.5Sn-3.9Ag-0.6Cu solder on oxygen-free high-conductivity (OFHC) copper and Au-Ni-plated Kovar was examined as a function of flux and process temperature. The three solder fluxes included a rosin-based (R) material, a rosin mildly activated (RMA) flux, and a low-solids (LS) flux. The solderability metric was the contact angle, θ_C, measured by a meniscometer and wetting-balance techniques. The wetting rate and time to maximum force parameters were also documented. In most cases, the contact angles for the 95.5Sn-3.9Ag-0.6Cu solder alloy, regardless of the type of flux or temperature, were higher then those for the 63Sn-37Pb eutectic-solder alloy, indicating a less “solderable” surface.     

引线框架铜合金材料与SnAg3.0Cu0.5的界面组织

采用扫描电镜和能谱分析等手段研究了3种不同引线框架用铜合金材料与SnAgCu钎料的界面结构,3种铜合金引线框架材料与SnAg3.0Cu0.5焊膏焊后未经时效的界面组织相似.焊点在160℃恒温时效300 h后,Cu-0.1Fe-0.03P合金、Cu-0.36Cr-0.03Zr合金、Cu-0.38Cr-0.17Sn-0.16Zn合金与SnAg3.0Cu0.5焊膏的界面金属间化合物厚度分别为8.7、7.4、6.2μm,其成分主要为Cu6Sn5,靠近铜合金一侧均有少量Cu,Sn生成.结果表明,Cu-0.38Cr-0.17Sn-0.16Zn合金比Cu-0.1Fe-0.03P合金和Cu-0.36Cr-0.03Zr合金具有更好的焊接可靠性能,Cu-0.38Cr-0.17Sn-0.16Zn合金中的Zn元素在焊点界面的富集有效减缓了界面处原子的相互扩散,使金属同化合物的增长速度降低.