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The accelerating burn in and screening method of processing 1 310 nm InGaAsP of laser diodes (LDs) is introduced. It is confirmed that the theory of burn in and screening is based on the second derivative minimum of burn-in curve, and the new testing method has been given, that is automatic current control (ACC) burn-in and automatic power control (APC) testing. This avoidably bring the errors of testing in only ACC or APC method, which need to monitor and control or test LDs power change by photo-detector (PD) at high temperature, and LDs or PDs must be into the same environment (PD will be burn-in at the same time). Through the experiment, the accelerating burn-in and screening condition of the devices has been confirmed: ACC, 200 mA, 100 ℃, 8 h. This raise work efficiency 12 times than Bellcore standard and save testing fee. 相似文献
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利用介质膜高反镜实现“猫眼”目标有效隐身 总被引:1,自引:0,他引:1
针对激光主动探测系统的主要工作波长为1 064nm,提出了一种利用介质膜高反镜实现"猫眼"目标隐身的方案。利用单波长介质膜高反镜的反射率特性,将介质膜高反镜与"猫眼"目标光轴以一定角度装配,推导了加载介质膜高反镜的理想"猫眼"目标回波功率模型,并给出了典型算例。通过实验方法分析了介质膜高反镜的反射率特性,修正了45°激光入射角的平均反射率值。典型"猫眼"目标的外场实验表明,在有限"牺牲"成像质量的前提下,介质膜高反镜可大大降低"猫眼"目标的"猫眼"效应,实现光电装备的有效隐身。 相似文献
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