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对红外探测器不断增长和提高的需求催生了第三代红外焦平面探测器技术。根据第三代红外探测器的概念,像素达到百万级,热灵敏度NETD达到1 m K量级是第三代制冷型高性能红外焦平面探测器的基本特征。计算结果表明读出电路需要达到1000 Me-以上的电荷处理能力和100 d B左右的动态范围(Dynamic Range)才能满足上述第三代红外焦平面探测器需求。提出在像素内进行数字积分技术,以期突破传统模拟读出电路的电荷存储量和动态范围瓶颈限制,使高空间分辨率、高温度分辨率及高帧频的第三代高性能制冷型红外焦平面探测器得到实现。 相似文献
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焦平面阵列读出电路研究和应用 总被引:1,自引:0,他引:1
焦平面(FPA)如果要获得较好的探测性能,就必须尽可能提高探测器的信噪比.读出电路因为可以很好地改善探测器的性能,获得快速的研究和发展,现已发展出多种结构形式,应用越来越广泛.本文主要介绍了各种读出电路的结构和应用. 相似文献
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S. Velicu T. S. Lee C. H. Grein P. Boieriu Y. P. Chen N. K. Dhar J. Dinan D. Lianos 《Journal of Electronic Materials》2005,34(6):820-831
The cost and performance of hybrid HgCdTe infrared (IR) focal plane arrays are constrained by the necessity of fabricating
the detector arrays on a CdZnTe substrate. These substrates are expensive, fragile, available only in small rectangular formats,
and are not a good thermal expansion match to the silicon readout integrated circuit. We discuss in this paper an IR sensor
technology based on monolithically integrated IR focal plane arrays that could replace the conventional hybrid focal plane
array technology. We have investigated the critical issues related to the growth of HgCdTe on Si read-out integrated circuits
and the fabrication of monolithic focal plane arrays: (1) the design of Si read-out integrated circuits and focal plane array
layouts; (2) the low-temperature cleaning of Si(001) wafers; (3) the growth of CdTe and HgCdTe layers on read-out integrated
circuits; (4) diode creation, delineation, electrical, and interconnection; and (4) demonstration of high yield photovoltaic
operation without limitation from earlier preprocessing such as substrate cleaning, molecular beam epitaxy (MBE) growth, and
device fabrication. Crystallographic, optical, and electrical properties of the grown layers will be presented. Electrical
properties for diodes fabricated on misoriented Si and readout integrated circuit (ROIC) substrates will be discussed. The
fabrication of arrays with demonstrated I–V properties show that monolithic integration of HgCdTe-based IR focal plane arrays
on Si read-out integrated circuits is feasible and could be implemented in the third generation of IR systems. 相似文献
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介绍了一种基于标准硅工艺的电容读出式微悬臂梁非制冷红外探测器的设计、制作以及集成读出电路的设计。该探测器用于探测室温下物体的红外辐射,其响应波长为8~12 μm 。由于氮化硅和铝的热膨胀系数相差很大,用这两种材料的薄膜做成的双材料微悬臂梁在红外辐射下会发生弯曲,微悬臂梁和衬底形成一个可变电容,通过检测电容的变化来反映微悬臂梁的弯曲,从而可以探测红外辐射的情况。采用和探测器集成的CMOS读出电路对探测器信号进行读取,微悬臂梁的电容灵敏度可达2.5 fF/K,温度分辨率为0.1 K。 相似文献
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Rishabh Bhardwaj Soumendu Sinha Nishad Sahu Sagnik Majumder Pratik Narang Ravindra Mukhiya 《International Journal of Circuit Theory and Applications》2019,47(6):954-970
The paper presents modeling and simulation of ion-sensitive field-effect transistor (ISFET)-based pH sensor with temperature-dependent behavioral macromodel and proposes to compensate the temperature drift in the sensor using intelligent machine learning (ML) models. The macromodel is built using SPICE by introducing electrochemical parameters in a metal-oxide-semiconductor field-effect transistor (MOSFET) model to simulate ISFET characteristics. We account for the temperature dependence of electrochemical and semiconductor parameters in our macromodel to increase its robustness. The macromodel is then exported as a subcircuit element, which is used to design the readout interface circuit. A simple constant-voltage, constant-current (CVCC) topology is utilized to generate the data for temperature drift in ISFET pH sensor, which is used to train and test state-of-the-art ML-based regression models in order to compensate the drift behavior. The experimental results demonstrate that the random forest (RF) technique achieves the best performance with very high correlation and low error rate. Corresponding curves for output signal using the trained models show highly temperature-independent characteristics when tested for pH 2, 4, 7, 10, and 12, and we obtained a root mean squared error (RMS) variation of ΔpH ≤ 0.024 over a temperature range of 15°C to 55°C in comparison with ΔpH ≤ 1.346 for uncompensated output signal. This work establishes the framework for integration of ML techniques for drift compensation of ISFET chemical sensor to improve its performance. 相似文献
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