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采油技术是原油开采的关键,随着开采的不断深入,油田要想稳定产量就必须革新采油技术。结合实际开采现状分析,眼下采油技术中仍存在诸多问题。本文对此类问题进行了总结,并对多种采油技术的优势与不足进行了论述,指出了采油技术发展进程中存在的技术问题,对其发展方向提出了自己的见解。 相似文献
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We report on irradiation induced single event upset (SEU) by high-energy protons and heavy ions. The experiments were performed at the Paul Scherer Institute, and heavy ions at the SEE irradiating Facility on the HI-13 Tandem Accelerator in China's Institute of Atomic Energy, Beijing and the Heavy Ion Research Facility in Lanzhou in the Institute of Modern Physics, Chinese Academy of Sciences. The results of proton and heavy ions induced (SEU) in 65 nm bulk silicon CMOS SRAMS are discussed and the prediction on several typical orbits are presented. 相似文献
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随着我国航天事业的迅猛发展,对加速器束流的需求将会急剧增加,但受HI-13串列加速器可提供束流时间的限制,束流供求矛盾将会愈来愈突出。为了满足国防抗辐射加固研究单位的迫切需要,为我国星用大规模、超大规模集成电路抗辐射加固机理研究、性能评估考核以及加固技术的验证等地面模拟试验提供方便、快捷、高品质的试验平台和必要的技术支撑,需要加强HI-13串列加速器上单粒子效应地面模拟实验技术研究,提高加速器束流使用效率。 相似文献
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The single event effects of the sensitivity of a circuit are investigated on a 32-bit microprocessor with a five-stage instruction pipeline by pulsed laser test. The investigation on sensitive mapping of the memory cell is illustrated and then the comparison between the sensitive mapping and the layout of the circuit is made. A comparison result indicates that the area of the sensitive node in sensitive mapping is just the location of the drain in the layout. Therefore, SEE sensitivity in sensitive mapping fits well with that in the physical layout of functional units, which can directly and objectively indicate the size and distribution of sensitive areas. The investigation of sensitive mapping is a meaningful way to verify the hardened effect and provide a reference for improving hardened design by combining with the physical layout. 相似文献
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航天器件在空间环境中存在着单粒子效应,根据研究可知高温会提升单粒子效应的敏感性,因此为了更好地评估器件的抗辐射性能,有必要建立一套高温单粒子效应测试系统.通过建立高温单粒子效应测试系统,选择ASIC和SRAM进行高温测试实验,完成了电路高温下的单粒子效应检测,证明了温度提升单粒子效应敏感性的事实. 相似文献
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Single-event transient susceptibility of phase-locked loops has been investigated. The charge pump is the most sensitive component of the PLL to SET, and it is hard to mitigate this effect at the transistor level. A test circuit was designed on a 65 nm process using a new system-level radiation-hardening-by-design technique. Heavy-ion testing was used to evaluate the radiation hardness. Analyses and discussion of the feasibility of this method are also presented. 相似文献
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Single-event effects of nano scale integrated circuits are investigated. Evaluation methods for single-event transients, single-event upsets, and single-event functional interrupts in nano circuits are summarized and classified in detail. The difficulties in SEE testing are discussed as well as the development direction of test technology, with emphasis placed on the experimental evaluation of a nano circuit under heavy ion, proton, and laser irradiation. The conclusions in this paper are based on many years of testing at accelerator facilities and our present understanding of the mechanisms for SEEs, which have been well verified experimentally. 相似文献