老年人网络智能电视机顶盒设计方法研究

随着老龄化社会的到来,国内对养老保障的关注与探索逐步加强,老龄人口不断增长,电视成为人们生活中必不可少的产品,网络智能电视是未来发展的趋势,设计适合老年人使用的网络智能电视机顶盒,对改善老年生活,提高老年人生活质量有重要意义.通过老年人生理以及心理特点分析,归纳设计要素,提出一种新的适合老年人智能电视机顶盒设计与评估的分析方法——Analytical statement-C,该方法强调设计与评估并重,能够很好地提高开发老年网络智能电视机预盒的有用性.     

全球首款TV游戏智能盒完美盒子试用

电视盒子这种“客厅属性”明显的产品已经出现了很长时间。但从市场表现来看，表现却一直不愠不火。而到了智能时代，随着Android操作系统的普及，已经有越来越多的产品走向了智能化的道路。今天来到我们评测室的产品，就是金亚科技联手完美世界打造的全球首款TV游戏智能盒——完美盒子，下面就跟随我们的目光，—起来看看它的独到之处吧。     

智能电视之越:电视终端步入智能时代

早在2007年,就有电子制造厂商提出了“智能化”的概念,随着智能手机等产品的普及,越来越多的电子产品采用高集成化、人性化的设计.电视机作为传统家电产品,智能化的起步较晚,2010年10月,索尼与谷歌共同推出了具备安卓操作系统的“Google TV”,该产品将独立的操作系统与电视机进行集成,是智能电视时代的标志性产品,由此掀起了平板电视智能化的浪潮.     

协同任务规划仿真实验系统的设计与实现

本文基于AnyLogic软件设计并实现了多智能体协同任务规划仿真实验系统，构建了模块化、可组合的“智能体-环境-任务”三要素模型。文章完成了系统的总体架构设计及各模块的开发，并设计了可视化界面。用户可通过可视化界面，自定义环境、智能体和任务的相关参数，对各种规划方法进行仿真实验，能够更加直观和便捷地观察仿真流程、查看相关数据，有利于学生理解多智能体协同任务规划的过程。本文为学生开展探究性学习、自主实验和创新实践提供了先进手段和开放平台。同时，该实验系统也可用于对多种场景的任务规划算法进行仿真验证。     

智能电视,谁会赢得未来?

最近几年,用户想买一台“不智能”的电视已经是越来越难.据统计,2015年国内智能电视渗透率已达到84.5％,2016年渗透率估计会达到95％,基本完成全覆盖.销量上,预计2016年智能电视会达到6000万台,这是一个极其庞大的市场. 从产品看,从早期普通液晶电视加低性能盒子,到现在电视盒子及服务合一的智能电视,从1080P到4K,从平面到曲面,智能电视不断进步.而在智能电视的竞争中,主要有两个集团,一个是以传统海尔、海信、TCL创维为代表的家电集团,一个是小米、乐视、微鲸等为代表的互联网厂商.那么,智能电视未来会如何发展,什么样的产品才会赢得未来呢?     

智能CAD技术在机械制造中的应用研究

智能CAD技术的形成和发展从某种意义上促进了机械制造业的发展,从而能够设计出更加现代化与数字化的产品.为此,本文系统化地研究了通过Solid-Works软件系统建立机械零件模型数据库和参数的过程,从而分析了机械制造中应用智能CAD技术的现状.     

智能工厂评估模型研究

通过对国内外现有智能制造评估模型的研究,结合重庆制造业行业领跑者与落后者之间差距大的现状,以实现全要素全连接的数字化工厂为出发点,融合工业互联网标识,构建实践可行的智能工厂评估模型推动中小型企业参与智能制造转型,缓和两极分化问题.本评估模型包含工厂体系架构的3个层级,提供用于推动智能制造转型的参考,包括设计、生产、管理...     

满足轻量级需求 飞利浦S231智能显示器

随着智能概念的不断普及，众多周边设备长沙昂都纷纷将自己旗下的产品加入Android操作系统，于是从盒子、眼镜再到微型投影机、电视机、显示器都在这股“智能化”的浪潮中沦陷。显示设备厂商飞利浦日前推出了旗下的智能显示器产品S231C4，为显示器行业带来了全新的概念。     

LPC812MiniKit与Android外设

App＋MCU=Appcessory 随着智能手机的普及，Android的市场占有率远超其他平台。如果能够为该系统平台设计智能“外设”产品，就是进入一片蓝海。尽管我们沿用“外设”这一个陈旧术语，但是与传统标准PC外设和配件不同，移动设备＋“外设”＋应用，     

基于AI大模型的智慧运维平台设想

本文首先研究了AI大模型和智慧运维平台的最新发展趋势,剖析了智能决策时代的智慧运维平台的运维对象和功能模块;然后根据该智慧运维平台的设计要素,充分运用AI大模型智能技术与方法,构建了智慧运维平台的逻辑步骤、数据流程和设计方案。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.