共查询到19条相似文献,搜索用时 171 毫秒
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研究了利用GaAs作为衬底的HgCdTe MBE薄膜的表面缺陷,发现其中一类缺陷与Hg源中杂质有关.采用SEM对这类缺陷进行正面和横截面的观察,并采用EDX对其正面和横截面进行成分分析.并设计了两个实验:其一,在CdTe/GaAs衬底上,低温下用Hg源照射20min,再在其上继续高温生长CdTe;其二,在CdTe/GaAs衬底上,一直用Hg源照射下高温生长CdTe.两个实验后CdTe表面都出现与HgCdTe表面相比在形状和分布上类似的表面缺陷,采用光学显微镜和SEM对CdTe表面缺陷进行了观察,通过CdTe表面缺陷和HgCdTe表面缺陷的比较,我们证实了这类表面缺陷的成核起源于Hg源中杂质. 相似文献
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Ruilong Yang Dezhao Wang Mingjer Jeng Kaiming Ho Deliang Wang 《Progress in Photovoltaics: Research and Applications》2016,24(1):59-65
MoOx thin films were employed as a buffer layer in the back contact of CdTe solar cells. A monograined CdS layer was employed as the window layer to reduce light absorption. The insertion of a MoOx buffer layer in the back contact greatly reduced the Schottky barrier leading to increased fill factor and open‐circuit voltage. A CdTe solar cell, with an efficiency as high as 14.2%, was fabricated. The use of a MoOx buffer layer made it possible to fabricate high‐efficient CdTe solar cell with much less Cu in the back contact, thus greatly enhancing the cell stability. Copyright © 2015 John Wiley & Sons, Ltd. 相似文献
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Jonathan D. Major Leon Bowen Ken Durose 《Progress in Photovoltaics: Research and Applications》2012,20(7):892-898
The use of focussed ion beam milling combined with high resolution scanning electron microscopy analysis as a characterisation tool for thin‐film photovoltaics is reported. CdTe solar cell cross sections are examined in high detail with as‐grown and CdCl2‐treated devices being compared. Observed changes in microstructure of the thin‐film layers are related to the device performance. The CdCl2 treatment is shown to cause a reduction in the CdTe defect density at regions close to the interface and induce recrystallization of the CdS layer. Furthermore, the focussed ion beam technique is shown to reveal voids formed within the device's thin‐film layers at various processing stages that have not been previously observed in working cell structures. The back‐contacting Te‐rich layer resulting from nitric–phosphoric acid etching is also observed, with the etched layer being seen to propagate down the CdTe grain boundaries. Copyright © 2011 John Wiley & Sons, Ltd. 相似文献
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氩氧气氛下沉积的CdTe薄膜及太阳电池的性质 总被引:9,自引:2,他引:7
研究了在氩氧气氛下近空间升华沉积CdTe的技术.发展了在表面十分平整的玻璃衬底上沉积优质CdTe薄膜的方法,对比了在玻璃衬底和CdS薄膜上CdTe薄膜的结构特征.通过研究氧分压对CdTe薄膜择优取向的影响,证实了在恰当的近空间升华沉积过程中,两种衬底上的CdTe薄膜具有相同的结构.研究了玻璃衬底上CdTe薄膜的电学与光学性质,观察了后处理对上述薄膜性质的影响,并研制出了效率达1338%的小面积CdTe 薄膜太阳电池. 相似文献
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By mans of a chemical synthesis technique stoichiometric CdTe-nanocrystals thin films were prepared on glass substrates at 70 °C. First, Cd(OH)2 films were deposited on glass substrates, then these films were immersed in a growing solution prepared by dissolution of Te in hydroxymethane sulfinic acid to obtain CdTe. The structural analysis indicates that CdTe thin films have a zinc-blende structure. The average nanocrystal size was 19.4 nm and the thickness of the films 170 nm. The Raman characterization shows the presence of the longitudinal optical mode and their second order mode, which indicates a good crystalline quality. The optical transmittance was less than 5% in the visible region (400–700 nm). The compositional characterization indicates that CdTe films grew with Te excess. 相似文献
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David W. Niles Xiaonan Li David Albin Doug Rose Timothy Gessert Peter Sheldon 《Progress in Photovoltaics: Research and Applications》1996,4(3):225-229
A commonly used process for forming low-resistance contacts to thin-film p-type CdTe involves the formation of a Te layer by etching the CdTe film in a concentrated mixture of nitric and phosphoric acids. The authors compare evaporated Te back contacts with ‘control’ back contacts formed by the usual etching process, and demonstrate that evaporating Te onto a CdTe thin film is a viable process for forming a low-resistance contact. The best efficiency achieved for a CdTe solar cell made with an evaporated Te back contact is 12.1%, whereas the efficiency of the device made with the control back contact was 11.9%. The evaporation process offers numerous advantages over acid etching, most notably vacuum compatibility amenable to large-scale production of CdTe solar cell modules. 相似文献
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In this work, the chemical evolution of CdTe crystal and thin film under air exposure was investigated by X-ray Photoelectron Spectroscopy (XPS). In particular, the analysis of Te 3d core level allowed us to characterize the surface oxidation. Indeed, in both cases and after a short air exposure, the Te 3d peaks exhibited clearly two components corresponding to Te–Cd and Te–O, i.e. bulk CdTe and native oxide. The later one was used to estimate an equivalent oxide layer thickness. Only a weak oxide amount could be observed on both fresh surfaces, whereas after two days of air exposure, the native oxide thickness was estimated to 2.2 nm and 0.9 nm for CdTe crystal and thin film respectively. For a longer exposition time of one month, the oxide layer thickness increased in both cases up to 7.2 and 5.9 nm, for CdTe crystal and thin film respectively. Even, if the oxidation kinetic appeared slower in the case of CdTe thin film, such insulating oxide layer formation at CdTe surface under air exposure might have negative effect on the ohmic back contact formation and further electrical characteristics of solar cells. Next to this study, aged CdTe samples were submitted to a chemical etching after several days of air exposure and before solar cell fabrication. It appeared that solar cell based on ‘aged CdTe layer’ after etching exhibit electrical performances similar to those obtained with a freshly elaborated CdTe device. Therefore, CdTe chemical etching appears as an effective way to remove the surface oxide layer and retrieve good cell performances. As a result, it is possible to store CdTe films for long duration before solar cells fabrication. 相似文献
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Lei Zhi Feng Lianghuan Zeng Guanggen Li Wei Zhang Jingquan Wu Lili Wang Wenwu 《半导体学报》2013,34(1):014008-3
本文采用化学水浴法沉积CuxS薄膜,通过改变Cu元素比例研究其对碲化镉电池效率的影响。研究表明化学水浴法沉积的CuxS是非晶的,采用适当退火条件可以使其晶化,随着退火温度的提高,薄膜变得致密且结晶明显。CuxS薄膜厚度对电池性能有很大的影响,结果表明,随着CuxS薄膜厚度增加,电池性能先增加后减少。薄膜厚度为75nm时,CdS/CdTe电池性能最佳,达到了最高转化效率(η)为12.19%,填充因子(FF)为68.82%,开路电压(Voc)为820mV。 相似文献
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Darwis Darmawati Sesa Elisa Ulum Syahrul Holmes Natalie P. Feron Krishna Thameel Mahir Chowdhury Riku Farhamsah Dedy Tegg Levi Zhou Xiaojing Dastoor Paul C. Belcher Warwick J. 《Journal of Electronic Materials》2020,49(7):4168-4179
Journal of Electronic Materials - Nanoparticulate (NP) films and organic photovoltaic devices have been fabricated from poly(3-hexylthiophene):phenyl C61 butyric acid methyl ester (P3HT:PC61BM) NP... 相似文献