一种基于压缩感知的数字图像水印算法

根据压缩感知具有压缩短、解码复杂和鲁棒性强的特征,提出一种新的基于压缩感知的数字图像水印算法。该算法有效克服了信号重建时稀疏度未知的问题,增强了数字水印系统的抗提取防破坏能力。在嵌入水印时,将水印的高频系数用构造的伯努利矩阵进行观测后,嵌入于图像的低频系数中;在提取水印时,利用正则化自适应匹配追踪(RAMP)算法对高频系数进行恢复,最后与低频系数结合实现水印的重构。实验结果表明:该算法在重构精度和重构时间上要高于同类算法,具有很好的鲁棒性、透明性和安全性。     

基于压缩感知的数字图像水印算法

压缩感知理论作为新一代信息处理理论基础,在很多领域得到了应用,但在数字水印方面的应用还有待发展。利用压缩感知理论,在图像稀疏化后的观测域中实现水印嵌入过程。用小波变换将原图像稀疏化,选择一个固定高斯随机矩阵对其进行观测,在观测压缩域中嵌入与提取水印,用匹配追踪算法恢复稀疏信号。实验结果表明,该算法满足透明性、鲁棒性和安全性要求;同时抗提取实验表明,该算法能有效抵御非法提取水印信息,增加了安全性。     

一种基于特征的自适应水印算法

基于图像多尺度空间理论和扩频机制以及视觉感知模型的特性,给出一种基于特征的数字图像水印算法。算法采用尺度不变特征变换算子提取图像的局部不变特征区域,根据信噪比特点自适应选取水印嵌入强度因子,将一幅二值水印图像嵌入到原始图像中,实现了数字水印的不可感知性和鲁棒性。仿真结果表明,该算法对添加噪声、压缩、旋转等常见的图像处理攻击具有较强的鲁棒性。     

基于纹理特征的鲁棒图像水印算法研究

文章提出了一种新的基于图像纹理特征分块的鲁棒水印算法.算法提取载体图像抗攻击性较强的特征向量,对其进行分级聚类分析,从而自适应地确定水印嵌入的最佳区域.为了在保证水印不可见感知的前提下最大限度地提高水印的嵌入能量,本文给出了采用加法嵌入公式时水印最大嵌入强度估计.实验结果表明,该算法在保证图像质量的前提下,对几何同步、噪声干扰、剪切、JPEG压缩等攻击具有较强的鲁棒性.     

基于特征点的抗几何失真数字图像水印

为了增强水印的抗几何攻击能力,本文提出了一种基于图像内容的水印方案。图像的内容由具有几何不变性的特征点选出,在每块选出的内容上进行水印的嵌入和检测。由于图像的特征点在经过几何攻击后仍然可以保持,这样就很好地解决了水印的同步问题,保证了水印检测的可靠性。实验表明该算法能够很好地抵抗诸如旋转、缩放、剪切等几何攻击以及JPEG压缩攻击。     

基于系数奇偶量化的图像水印算法

文中提出了一种新的基于系数奇偶量化的图像小波域数字水印算法,该算法首先对水印图像进行置乱处理,载体图像的小波变换系数经奇偶量化后,将置乱后的水印图像嵌入其中。算法对小波系数的奇偶量化性能在鲁棒性和水印的不可见性上进行了很好的折衷,实验表明该算法对载体图像的影响较小且具有很好的鲁棒性,可以有效地抵抗JPEG压缩、噪声干扰等常见的攻击。     

基于压缩传感的分块DCT域灰度图像水印算法

文中研究了压缩传感方法和图像水印算法,提出了一种基于压缩传感的分块余弦变换域灰度图像水印算法。该算法首先将原始二值水印图像采用压缩传感方法对其观测,从而得到观测矩阵,并将观测矩阵进行arnold置乱(阿诺德置乱)后生成待嵌入的水印图像;在嵌入水印阶段,首先将载体灰度图像进行了分块,分块的大小取决于水印图像的大小,然后将每个小分块进行二维余弦变换,计算其每个小分块中心像素的邻居(上下左右)像素均值,比较均值与对应水印像素位大小,以确定其嵌入数据,从而实现水印嵌入。为验证此算法的鲁棒性,我们进行了实验,实验表明该算法能承受一定的裁剪攻击。     

一种用于帧内篡改检测的压缩感知视频水印实现算法

 针对视频水印在帧内篡改检测方面定位精度的不足,通过压缩感知对MPEG-4(Moving Picture Experts Group-4)视频内容的特征表示,提出一种新的视频水印生成方法及其帧内篡改检测算法.该算法由压缩感知DCT(Discrete Cosine Transform)测量矩阵对I-VOP(Intra-Video Object Plane)图像提取U、V特征参数,生成基于内容的压缩感知视频水印数据并嵌入到图像Y分量的DCT中高频系数中实现帧内篡改检测.实验结果表明,与Hash视频水印算法比较,压缩感知视频水印数据具有更好的恢复能力,且水印算法对视频帧内篡改定位精度更高.     

一种基于小波变换的数字水印算法

提出一种基于人类视觉系统和小波变换的数字水印算法.该算法同时对水印信息和载体信息进行小波变换,根据HVS模型把水印信息DWT变换后的系数嵌入到图像载体DWT系数中.理论分析和实验结果表明:该算法很好的解决了水印鲁棒性和不可见性之间的矛盾,对一般的图像处理和攻击,如JPEG压缩、滤波、加噪声、裁剪等有很好的鲁棒性.     

用于篡改定位的可逆数字水印算法

提出一种基于整数小波变换的可逆数字水印算法,将基于图像内容的水印嵌入载体图像,依赖于整数变换特性实现算法可逆,利用提取的水印与由图像本身局部特征生成水印的差值来定位篡改。实验表明,提取水印后可无失真地重构原始载体。即使含水印载体遭到人眼不可见的篡改,仍可在重构的载体图像中直接地显示发生篡改的区域。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.