五元均匀圆阵干涉仪加权测向算法及解相位模糊的条件

研究五元均匀圆阵一维、二维干涉仪测向算法。提出了一种多基线加权干涉仪测向算法，提高了干涉仪测向精度。提出了多基线对的比较法解相位模糊，讨论了该方法在噪声限制和阵列孔径限制下的解相位模糊条件。     

基于相关比幅测向的圆阵干涉仪解模糊算法

针对比幅测向精度较低而干涉仪测向相位易模糊这一问题,提出了一种基于多波束比幅测向的圆阵相关干涉仪解模糊改进算法,实现对小型无人机方位的快速估计。首先,根据目标无人机的图传信号特征值建立离线数据库,利用改进的多波束相关比幅法对无人机来波方向进行粗略测量,通过二次插值法对“栅栏效应”造成的估计偏差进行一定修正;然后,将修正后的角度测量值对干涉仪实测相位差进行解模糊;最后,利用无模糊的相位差通过相关运算实现来波方向的精确估计。该算法将相关运算运用在比幅测向中,有效提高了干涉仪解模糊概率。与传统的比幅测向法和干涉仪测向法相比,该算法只需3组天线就能完成测向功能,其测向精度提高至2°以内,并且该算法对天线一致性要求低,实时性高,可实际应用于圆形阵列测向体制,实现对无人机的快速测向。     

单基线干涉仪无模糊测向理论研究

首先分析了传统单基线干涉仪产生测向模糊的原因,然后在干涉仪时差分析理论的基础上,提出了单基线干涉仪无模糊测向方法,建立了相关的理论模型,并通过仿真验证了其有效性与实用性,从而为该理论的后续工程应用奠定了前期基础。     

干涉仪基线组合对测向精度的影响

针对干涉仪测向算法,以三种不同基线组合为例,通过理论和仿真分析,说明信号频率、来波方位、相位模糊对测向精度的具体情况。得出长基线数量越多测向模糊越严重,但测向精度越高的结论。为干涉仪测向系统的工程应用提供理论依据。     

基于五通道干涉仪的扩频信号测向算法研究

文中采用五通道干涉仪测向体制,利用扩频信号的互相关特性,研究了一种扩频信号测向算法。介绍了扩频通信基本原理,给出了干涉仪测向原理,并针对五通道干涉仪提出了等基线时差法测向算法。该算法具有很好的噪声抑制和解模糊效果,并且给出了仿真结果与分析。     

一种基于平行辅助基线的干涉仪测向算法

针对平面阵测向中存在的相位模糊问题,提出一种基于平行基线的干涉仪测向算法。该算法利用平行基线中短基线相位差可能的模糊数获得长基线的一系列可能相位差,通过相关运算实现解模糊,并利用最小二乘解确定最终的入射信号方向。算法中引入的平行基线有效降低了解模糊运算量,而最小二乘解则提高了算法测向精度。计算机仿真结果验证了算法解相位模糊的正确性和测向的高效性。     

基于多基线干涉仪和多波束比幅联合测向天线系统的设计与实现

从干涉仪测向原理出发,结合干涉仪测向公式进行了测向误差分析。根据测向精度要求,提出了三基线设计及最长基线长度要求;根据最短基线解相位模糊要求,提出了八比幅测向精度要求;设计并实现了一种基于多基线干涉仪和多波束比幅联合测向的天线系统。     

一维搜索与长短基线相结合的干涉仪设计方法

设计宽带干涉仪测向系统时需要解决系统测向精度和最大无模糊角度之间的矛盾问题,本文通过深入研究,提出了基于一维搜索与长短基线相结合的多基线相位干涉仪设计方法,并进行了仿真分析,结果表明该方法简单有效,易于实现,对宽带干涉仪测向系统工程设计具有一定的参考价值.     

干涉仪阵列解模糊算法研究

多基线宽带干涉仪可较好地解决测向精度和最大无模糊角度之间的矛盾,但其存在着相位差模糊问题,针对该问题,提出了基于一维搜索的干涉仪阵列多组解模糊算法,讨论了正确解模糊条件,通过仿真验证了解模糊条件的正确性.对不同信噪比条件下的正确解模糊概率和波达角估计精度进行了仿真分析,结果表明该算法有效,可以满足一般工程实现时对信噪比及波达角估计精度的要求,对干涉仪工程设计具有一定的应用价值.     

一种改进的相关干涉仪测向算法

针对多阵元相位干涉仪测向过程中的解模糊概率问题,在相位差误差条件下建立了解模糊概率与基线长度比之间的关系,给出一种相关干涉仪基线设计方法,并研究了相关干涉仪的解模糊条件;提出一种改进的相关干涉仪算法,缩小了相关干涉仪的取值范围,优化了相关函数,该方法最大程度地利用了干涉仪孔径尺寸,保证了测向精度,提升了运算速度,同时具有更强的解模糊稳定性.仿真试验表明,改进的相关干涉仪算法有效可行.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.