基于LDAP的统一身份认证系统的设计

介绍了目录服务的概念和功能,论述了目录服务与LDAP之间的关系以及LDAP的工作原理和实现方法,分析了LDAP的4种基本模型及功能模块之间的关系,给出了基于LDAP的统一身份认证系统的设计思想和实现方法,为各类信息平台的建设和资源整合提供了思路和方案。     

基于LDAP的Web身份认证机制的研究与实现

介绍了LDAP协议和目录服务,并详细阐述了基于LDAP的认证机制和认证方式。对基于LDAP的4种认证方式的认证原理和实现过程进行了分析,并对认证过程进行了详细的阐述,最后给出了LDAP在Web应用系统中认证方式的实现。     

LDAP目录服务在综合评价决策模型库中的应用

综合评价决策模型库目录管理系统CEM-DMS由若干分布式异构子系统构成,对模型库各子系统中存储的信息进行整合,形成了完整的模型库系统.给出了基于LDAP的数据存储解决方案,采用基于Web和LDAP目录服务实现了系统中模型数据和评价信息的组织与定位以及各子系统中算法信息的发布功能.目录服务采用＂全局-局部＂的方式管理资源信息,提高了系统的扩展性和可靠性.     

基于LDAP的公共信息模型存储设计

公共信息模型(CIM)是近年由分布管理任务组(DMTF)负责制定的来解决网络管理元素的互操作性,LDAP是事实上的目录协议标准。文章在介绍了CIM和轻量级目录访问协议(LDAP)的相关概念的基础上,提出了基于LDAP的CIM的存储详细设计方案。     

LDAP目录服务的研究及其在Intemet上的实现

轻量级目录访问协议（LDAP）是一个运行在TCP/IP上有目录取协议，存取目录采用的是客户机/服务器的模式，最初作为X.500目录服务协议的前端程序，用于独立的或其它类型的目录服务器之中。因此在介绍LDAP目录服务器的定义、背景和原理的基础上，通过实例介绍了如何在linux下建立、配置和操作OPENLDAP软件来提供目录服务的问题。     

基于移动Agent的网格资源管理研究

在对网格进行分簇的基础上,提出了一种将网格资源被动发现与主动查找相结合的基于移动Agent的网格资源管理模型．通过使用移动Agent技术进行网格资源信息的初步收集,将收集到的资源信息保存到当前簇内的LDAP目录服务器中,并将当前簇的资源信息的摘要保存到邻簇的LDAP目录服务器中,在对资源进行主动查找和调度时采用之前保存的摘要信息作为资源查找算法的启发因子,从而加快网格资源的发现速度,进而提高网格使用效率．仿真实验验证了该模型中关键算法的有效性,论证了模型的可用性．     

LDAP目录服务在统一身份认证系统中的应用

介绍了LDAP目录服务的概况，将其应用到统一身份认证系统的设计之中，对该系统中LDAP的模式设计、目录树设计、功能实现、安全模型等作了简要说明。     

LDAP协议及其在PKI中的实现

本文较为详细地介绍了LDAP协议，并根据作者自身的实际经验，简单介绍LDAP的应用范围，详细讲述LDAP目录服务在PKI系统中的应用实现，为需要了解或开发LDAP目录服务和PKI系统的读者提供一简要的参考。     

基于CAS的单点登录系统应用研究

随着信息系统的迅速发展,各类信息化应用系统逐步建立,但是各应用系统之间自成体系,从而导致了每使用一个系统就要重新登录一次,给用户的使用和管理员的管理带来了很多不便.本文研究基于CAS的单点登录系统应用,很好地解决了使用和管理困难问题,介绍了基于CAS的单点登录系统应用设计研究,系统采用用户管理LDAP轻量级目录服务、CAS中央认证服务,设计了一个统一管理界面,通过Web服务传递用户参数,实现了多应用系统的整合.     

基于目录服务的地址解析技术

地址解析是软交换网络组网的重要技术，在分析各种软交换网络地址特点的基础上，给出了基于目录服务的地址解析的一般方法，然后详细阐述了轻量级目录访问协议（LDAP）地址解析系统的结构和技术，最后简要讨论了已成为国际上研究热点的电话号码映射（ENUM）解析技术。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.