氮气保护在无铅化电子组装中的应用

无铅钎料的高熔点、差润湿性给SMT传统的焊接工艺带来了很大冲击,并且对焊点质量也产生了很大的影响。为了防止氧化,改善钎料与焊盘、元件引脚之间的润湿性,提高产品合格率,目前在电子纽装中普遍采用氮气保护。针对几种常用无铅钎料进行了氮气气氛中润湿性和焊点组织的分析,并初步研究了氮气保护对焊点质量和氧化渣的影响。结果表明：氮气保护可以改善无铅钎料润湿性,细化焊点组织,减少氧化渣量,而且对焊点外观和成品率也有一定的影响。     

氮气保护对无铅再流焊QFP焊点拉伸强度的影响

无铅钎料差的润湿性给传统电子组装工艺带来了巨大的挑战,氮气保护有利于改善无铅钎料的润湿性,提高焊点质量.主要研究了不同氧含量对QFP引脚焊点拉伸强度的影响,得到一个最佳的氧含量范围.     

基于微电子互连应用的无铅高频感应加热重熔技术研究

本文讨论了一种新的高密度微电子面阵封装与组装互连的重熔方法,高频感应加热重熔技术。通过感应加热使得无铅钎料熔化并在焊盘上润湿形成成型良好的的钎料凸台和互连焊点。采用该方法钎料凸台可以在较大的工艺范围内成型,并且可以较容易地实现对钎料凸台和互连焊点的高度控制。通过红外温度测量证明了在合适的工艺区间内树脂基板的温度远低于焊点。实验证明该方法具有局部发热、较高的加热／冷却速率和易于控制焊点形态等特点。     

Sn-Ag基无铅钎料Nd:YAG激光重熔界面研究

通过Nd∶YAG激光重熔和热风二次重熔试验,得到了Sn3.5Ag和Sn3.0Ag0.5Cu无铅钎料球在Cu焊盘的钎料凸台.利用扫描电子显微镜分别分析了激光重熔和热风二次重熔后两种无铅钎料与铜焊盘界面反应及组织形貌,并对激光一次重熔无铅钎料凸台进行了剪切试验,观察了凸台的剪切断口.结果表明,在合适的激光功率和加热时间条件下能够获得成形良好的无铅钎料凸台,Sn3.5Ag和Sn3.0Ag0.5Cu两种无铅钎料与Cu焊盘所产生的界面化合物主要为Cu3Sn和Cu6Sn5,凸台界面反应组织形貌以及剪切承载力与激光功率和加热时间密切相关,而且激光重熔形成的界面化合物影响热风二次重熔界面的组织形貌.     

超声雾化工艺参数对无铅钎料粉体质量的影响

采用正交试验研究了超声雾化工艺参数对SnAgCu系无铅钎料粉体质量的影响规律。结果表明:当熔化炉炉腔内氮气压力为1.2 MPa、液态钎料出口温度为340℃、雾化室氮气进风量为2.1 m3/min、超声雾化头振幅为7.5μm时,SnAgCu系无铅钎料的出粉率可达65.6 kg/h,且获得粉体粒径不大于75μm的粉体质量分数为94%,粉体中氧的质量分数保持在64×10–6以下,炉内氮气的压力对粉体的出粉率和粒径分布的影响起决定作用。     

磁头内置DFH控制元件可靠性的有限元分析

 磁头内置DFH控制元件的可靠性设计评估十分重要,目前工艺上多采用经验数据指导的方法,误差十分大,理论上是根据传统流体力学的基本原理,利用Matlab软件实现模拟评估的,由于元件尺寸限制,模拟算法会随着舍入误差的叠加而失效.本文使用ANSYS软件,通过实验获得建立模型的基本参数,选择了合适的单元类型、材料属性,给出了磁头的有限元模型.利用模型对元件进行的寿命预测实验表明,有限元模型分析DFH控制元件的设计可靠性问题是有效的,并且得出以下结论:在50Ω的新型DFH计算结果中,其热效应强度比传统屏蔽层大10%以上,实际的寿命失败样品问题区域都在线路的转角处.     

电子组装钎料研究的新进展

随着微电子技术的发展,印制电路板的组装密度不断提高,人们越恶霸虎重视焊点工作的可靠性。在分析焊点失效和原因的基础上,论述了改善焊点可靠性的途径,同时,随着人们对环保要求的提高,积极开发和推广使用无铅钎料及免清洗钎剂也是当务之急,结合我们的研究成果,详细介绍了无铅钎料开发的现状及前景。     

电子组装钎料研究的新进展（刊中刊）

随着微电子技术的发展,印制电路板的组装密度不断提高,人们越来越重视焊点工作的可靠性。在分析焊点失效原因的基础上,论述了改善焊点可靠性的途径,同时,随着人们对环保要求的提高,积极开发和推广使用无铅钎料及免清洗钎剂也是当务之急,结合我们的研究成果,详细介绍了无铅钎料开发的现状及前景。     

焊接与连接工艺、键合工艺

0620014 K型圆钢管搭接节点极限承载力的有限元分析[刊,中]／完海鹰／／合肥工业大学学报(自然科学版)．- 2006,29(4)-478-481(C) 0620015半导体激光软钎焊Sn-Ag-Cu焊点微观组织[刊,中]／韩宗杰／／中南大学学报(自然科学版)．-2006,37 (2)．-229-234(L)采用90W半导体激光焊接系统对Sn-Ag-Cu无铅钎料在纯铜基板上进行钎焊试验。针对在不同激光输出功率下形成的微焊点形貌,分析Sn-Ag-Cu钎料在纯     

氮气保护对无铅再流焊焊点外观质量的影响

由于无铅钎料润湿性较差,在实际生产中普遍采用氮气保护。通过新制定的氮气保护无铅再流焊工艺,对焊点外观质量进行了统计分析。其结果显示氮气保护可以减少元件偏移和桥连等缺陷,对竖碑、焊球和锡珠等缺陷也有一定影响。     

Effect of temperature cycling on joint strength of PbSn and AuSnsolders in laser packages

The effect of temperature cycle testing on the joint strength of PbSn and AuSn solders in laser diode packages has been studied experimentally and numerically. Experimental results showed that the joint strength increased as the temperature cycle number increased initially, and then became steady after 400 cycles. The joint strengths of PbSn and AuSn solders increased about 40% to 20% after undergoing 500 temperature cycles, respectively. A finite-element method (FEM) analysis was performed on the calculation of joint strength variation of PbSn and AuSn solders in temperature cycling tests. The coupled thermal-elasticity-plasticity model was employed in the solidification and residual stresses calculation. Simulation results were in good agreement with the experimental measurements that the solder joint strength increased as the temperature cycle increased. Numerical results indicate that the increasing solder joint strength comes from the redistribution of the residual stresses within the solder during temperature cycling tests. The local yielding and the creep effects on the low melting temperature solders will make uniform the residual stresses distribution introduced in the solidification process and increasing the solder joint strength as the temperature cycle number increased. The result suggests that the FEM is an effective method for analyzing and predicting the solder joint strength in laser diode packages     

Interfacial reaction and solder joint reliability of Pb-free solders in lead frame chip scale packages (LF-CSP)

Chip scale packages (CSP) have essential solder joint quality problems, and a board level reliability is a key issue in design and development of the CSP type packages. There has been an effort to eliminate Pb from solder due to its toxicology. To evaluate the various solder balls in CSP package applications, Pb-free Sn-Ag-X (X=In, Cu, Bi) and Sn-9Zn-1Bi-5In solder balls were characterized by melting behavior, phases, interfacial reaction, and solder joint reliability. For studying joint strength between solders and under bump metallurgy (UBM) systems, various UBMs were prepared by electroplating and electroless plating. After T/C (temperature cycle) test, Sn3.5Ag8.5In solder was partially corroded and its shape was distorted. This phenomenon was observed in a Sn3Ag10In 1Cu solder system, too. Their fractured surface, microstructure of solder joint interface, and of bulk solder ball were examined and analyzed by optical microscopy, SEM and EDX. To simulate the real surface mounting condition and evaluate the solder joint reliability on board level, Daisy chain test samples using LF-CSP packages were prepared with various Pb-free solders, then a temperature cycle test (−65∼ 150°C) was performed. All tested Pb-free solders showed better board level solder joint reliability than Sn-36Pb-2Ag. Sn-3.5Ag-0.7Cu and Sn-9Zn-1Bi-5In solders showed 35%, 100% superior solder joint reliability than Sn-36Pb-2Ag solder ball, respectively.     

A Study on the Thermal Fatigue Behavior of Solder Joints Under Power Cycling Conditions

Failure mechanisms exposed by environmental accelerating testing methods such as thermal cycling or thermal shock test, may differ from those at service operating conditions. While the device is heated up or cooled down evenly on its external surface during environmental testing, real operating powered devices experience temperature gradients caused by internal local heating, components' different heat dissipation capability, and ambient temperature variation, etc. In this study, a power cycling technique is introduced to better approximate the field operating conditions so as to activate the field failure modes. Power cycling thermal fatigue test is performed with different ball grid array solder joints, that is, lead contained [Sn/37 Pb (SP)] and lead free [Sn/4.0Ag/0.5 Cu (SAC)], and the result is compared. In order to account for the thermal fatigue life behavior discrepancy for different solder joint composition, real time Moire interferometry is applied to measure the global/local thermo-mechanical behavior during power cycling excursion. Effective damage parameter, the total average shear strain, is extracted from the experiment and applied to account for the difference in fatigue life result of two different solders. In addition, amount of experimentally measured total average shear strain is mutually verified with finite element method analysis. It is clear that total average shear strain of a solder joint can be an effective damage parameter to predict thermo-mechanical fatigue life. A physical mechanism in terms of thermal material property of solder joints' is proposed to offer some thoughts to abnormal shear strain behavior that leads to discrepancies in fatigue life of two solders. An importance of power cycling testing method is emphasized for certain package designs.     

弯曲应力状况下微型BGA封装可靠性比较研究

微型球栅阵列（μBGA）是芯片规模封装（CSP）的一种形式,已发展成为最先进的表面贴装器件之一。在最新的IxBGA类型中使用低共晶锡．铅焊料球,而不是电镀镍金凸点。采用传统的表面贴装技术进行焊接,研讨μBGA的PCB装配及可靠性。弯曲循环试验（1000～1000με）,用不同的热因数（Qη）回流,研究μBGA、PBGA和CBGA封装的焊点疲劳失效问题。确定液相线上时间,测定温度,μBGA封装的疲劳寿命首先增大,接着随加热因数的增加而下降。当Q。接近500S·℃时,出现寿命最大值。最佳Qη范围在300-750s·℃之间,此范围如果装配是在氮气氛中回流,μBGA封装的寿命大于4500个循环。采用扫描电子显微镜（SEM）,来检查μBGA和PBGA封装在所有加热N数状况下焊点的失效。每个断裂接近并平行于PCB焊盘,在μBGA封装中裂纹总是出现在焊接点与PCB焊盘连接的尖角点,接着在Ni3Sn4金属间化合物（IMC）层和焊料之间延伸。CBGA封装可靠性试验中,失效为剥离现象,发生于陶瓷基体和金属化焊盘之间的界面处。     

Local melting induced by electromigration in flip-chip solder joints

A new electromigration failure mechanism in flip-chip solder joints is reported. The solder joints failed by local melting of a PbSn eutectic solder. Local melting occurred due to a sequence of events induced by the microstructure changes in the flip-chip solder joint. The formation of a depression in the current-crowding region of a solder joint induced the local electrical resistance to increase. The rising local resistance resulted in a larger Joule heating, which, in turn, raised the local temperature. When the local temperature rose above the eutectic temperature of the PbSn solder, the solder joint melted and consequently failed. The results of this study suggest that a dynamic, coupled simulation that takes into account the microstructure evolution, current density distribution, and temperature distribution may be needed to fully solve this problem.     

Solder joint reliability of indium-alloy interconnection

Recent high-density very large scale integrated (VLSI) interconnections in multichip modules require high-reliability solder interconnection to enable us to achieve small interconnect size andlarge number of input/output terminals, and to minimize soft errors in VLSIs induced by α-particle emission from solder. Lead-free solders such as indium (In)-alloy solders are a possible alternative to conventional lead-tin (Pb-Sn) solders. To realize reliable interconnections using In-alloy solders, fatigue behavior, finite element method (FEM) simulations, and dissolution and reaction between solder and metallization were studied with flip-chip interconnection models. We measured the fatigue life of solder joints and the mechanical properties of solders, and compared the results with a computer simulation based on the FEM. Indium-alloy solders have better mechanical properties for solder joints, and their flip-chip interconnection models showed a longer fatigue life than that of Pb-Sn solder in thermal shock tests between liquid nitrogen and room temperatures. The fatigue characteristics obtained by experiment agree with that given by FEM analysis. Dissolution tests show that Pt film is resistant to dissolution into In solder, indicating that Pt is an adequate barrier layer material for In solder. This test also shows that Au dissolution into the In-Sn solder raises its melting point; however, Ag addition to In-Sn solder prevents melting point rise. Experimental results show that In-alloy solders are suitable for fabricating reliable interconnections.     

Lead-Free Bumping Using an Alternating Electromagnetic Field

A novel lead-free bumping technique using an alternating electromagnetic field (AEF) was investigated. Lead-free solder bumps reflowed onto copper pads through AEF have been achieved. A comparison was conducted between the microstructures of the lead-free solder joints formed by the conventional thermal reflow and AEF reflow. Keeping the substrate temperature lower than that of the solder bumps, AEF reflow successfully created metallurgical bonding between the lead-free solders and metallizations through an interfacial intermetallic compound (IMC). The AEF reflow could be finished in several seconds, much faster than the conventional hot-air reflow. Considering the morphology of the interfacial Cu₆Sn₅ IMC, a shorter heating time above the melting point would be a better choice for solder joint reliability. The results show that AEF reflow is a promising localized heating soldering technique in electronic packaging.     

高温高铅焊料无铅化的研究进展

微电子封装工业中应用于高温领域的高铅焊料的无铅化是一个国际化难题。对目前高温无铅焊料的研究进展进行了综述,包括80Au-20Sn、Bi基合金、Sn-Sb基合金和Zn-Al基合金。从各种焊料的熔化行为、力学性能、导电导热性能、润湿性、界面反应和可靠性等方面,总结了这些高温无铅焊料的特性以及在应用中各自存在的问题。通过比较,认为Sn-Sb基合金在高温领域取代高铅焊料将有很大的应用前景。     

微波分离场加热焊锡膏的实验研究

微波加热作为一种快速、高效、清洁的加热方式,在材料处理领域得到了广泛应用。本文结合金属粉末的微波耗散机理,分析了焊锡膏在微波电场及磁场中的加热特性,通过实验研究了焊锡膏电路在微波电场、微波磁场中的加热效果。实验结果表明,微波电场和微波磁场均可快速加热焊锡膏,但高强度的微波电场容易激发等离子体,灼伤基板;而微波磁场则选择性地加热焊锡膏,实现快速加热融化焊点的同时保持基板在较低温度。通过对比微波磁场快速融化的焊点与传统方式加热融化焊点的微观结构,发现微波磁场快速加热融化的焊点具有极薄的金属间化合物厚度,有利于提高焊点强度。该研究为柔性等塑料基电路的焊接提供了一种良好的解决方案。     

新型Sn-Ag-Bi-Cu-In系无铅钎料合金研究

通过正交试验设计形成Sn-Ag-Bi-Cu-In系无铅钎料合金,并对钎料合金的熔化温度、可焊性、密度及剪切强度等进行研究.研究发现,Sn-Ag-Bi-Cu-In系钎料合金熔化温度接近传统的熔化温度,固-液温度差小;钎料密度约为传统Sn63Pb37的87%;试样铺展面积为72.02mm2,与Sn63Pb37焊锡的铺展面积76.85 mm2非常接近;钎料的剪切强度远大于传统Sn63Pb37钎料的剪切强度,其断裂形貌为沿晶脆断.