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1.
王学婷  朱琦 《信号处理》2017,33(2):168-177
分层异构网络中家庭基站与宏基站之间往往存在干扰,如何分配资源以获得高谱率和高容量、保证用户性能一直是研究的重点。为了解决这个问题,本文提出了一种异构蜂窝网络中基于斯坦克尔伯格博弈的家庭基站与宏基站联合资源分配算法,算法首先基于图论的分簇算法对家庭基站和宏用户进行分簇和信道分配,以减少家庭基站之间的同层干扰和家庭基站层与宏蜂窝网络的跨层干扰;然后建立了联合家庭基站发射功率以及宏用户接入选择的斯坦克尔伯格博弈,推导出达到纳什均衡时的家庭基站发射功率的表达式,并据此为宏用户选择合适的接入策略。仿真结果表明,该算法能够有效地提高宏用户的信干噪比(SINR),家庭用户的性能也得到改善。   相似文献   

2.
为了减小宏用户和家庭基站之间的干扰,有效分配频谱,本文提出了基于图论着色的分簇信道分配算法。该算法在保证满足宏用户信干噪比(signal-to-interference plus noise ratio,SINR)要求的前提下确定每个家庭基站可用的子信道集,再根据构造的家庭基站系统干扰图,动态地给每个用户分配所有可用的频谱资源。本文分别构建无向干扰图和有向权重干扰图,使用了一种基于簇的改进算法,在保证宏用户信干噪比的条件下,尽量提高家庭基站的吞吐量。仿真结果表明,本文算法可以降低宏用户和家庭基站的中断率,同时频谱效率得到提高。  相似文献   

3.
家庭基站的引入是为了改善室内覆盖,然而,随着家庭基站布置得越来越密集,家庭基站之间的干扰已经严重阻碍了系统性能的进一步提升。为此,利用图论的知识,将小区间互干扰信息建模为带权重的双向干扰图,并在此基础上提出一种低复杂度的资源分配方案,用于解决密集场景下用户随机分布时的家庭基站间的干扰控制问题。仿真结果表明,该算法能有效抑制小区间干扰,获得较高的频谱效率和较大的满意用户数。  相似文献   

4.
文章主要研究了在LTE家庭基站与宏基站部署于同一地理区域的场景下,减小家庭基站对宏移动台干扰的措施。提出并仿真了一种家庭基站自适应功率控制算法,根据仿真结果分析了该算法在抑制家庭基站干扰方面的作用。另外,还仿真并分析了家庭基站邻道泄漏比(ACLR)在减小家庭基站对宏移动台干扰方面的作用。  相似文献   

5.
李鑫滨  宋兴芳  韩松 《信号处理》2015,31(5):544-550
为进一步提高家庭基站(Femtocell)网络中频谱利用率并优化功率分配,在基于正交频分复用技术(OFDM)系统网络中,提出一种子载波联合优化的多用户资源分配算法,即以最大化频谱利用率作为目标函数,加入基站选择因子对家庭基站进行待机模式选择优化,再对用户的子载波资源进行公平分配,最后利用线性封顶注水算法对小区基站用户功率进行优化分配。仿真结果表明,多用户资源分配算法不仅使频谱和功率利用率都得到显著增长,而且提高了系统吞吐量和用户公平性。该家庭基站资源寻优模型有效地改善了频谱紧缺和功率浪费现状,降低了家庭基站之间的干扰。   相似文献   

6.
为了克服时分双工(TDD)无线异构网络中的区间干扰,对家庭基站受到来自宏基站小区和相邻家庭基站小区的干扰状况进行了仿真与分析,建立了家庭基站部署密度,家庭基站到宏基站的距离与上下行链路覆盖率之间的关系,从而为家庭基站的选址以及参数的设置和调整提供了重要依据,也为设计家庭基站的自配置和自优化算法提供了必要的参考数据.  相似文献   

7.
针对引入家庭基站技术的双层无线异构网络中存在严重的跨层和同层干扰的问题,提出了一种基于伪随机子信道选择的干扰抑制方案。该方案首先通过干扰随机化抑制跨层干扰,然后利用干扰图计算最大可选择伪随机序列个数抑制同层干扰。通过对比传统干扰抑制方案,验证了该方案能更有效地抑制系统干扰,提高系统吞吐量。  相似文献   

8.
据预测在LTE网络中将有超过80%的数据业务发生在室内,因此室内覆盖对LTE通信网来说很重要。家庭基站是近年来新兴的室内覆盖技术。针对引入家庭基站的TD-LTE系统,文中分析了其存在的干扰场景,之后针对各种干扰场景给出相应的干扰管理策略,并详细介绍了3GPP R10中开发的毫微微小区(femtocell)增强型小区间干扰协调(eICIC,enhanced Inter-Cell Interference Coordination)技术,最后给出今后的研究方向。  相似文献   

9.
数字集群系统基站干扰分析及预防措施   总被引:1,自引:0,他引:1  
介绍了数字集群系统基站干扰的分类,分析了基站干扰的危害及其原因,最后给出了解决数字集群系统基站干扰问题的预防措施。  相似文献   

10.
对3GPP LTE中针对家庭基站引入后的干扰场景进行了介绍,之后从频率资源和功率资源2个资源分配自由度对数据信道的干扰管理算法进行了分析,最后,对家庭基站在3GPP LTE版本10中的标准化方向进行分析。  相似文献   

11.
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.  相似文献   

12.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

13.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

14.
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.  相似文献   

15.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.  相似文献   

16.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.  相似文献   

17.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.  相似文献   

18.
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's.  相似文献   

19.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

20.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

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