共查询到17条相似文献,搜索用时 437 毫秒
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研制开发熔点在260 ℃以上的高温无铅钎料来代替传统的高铅钎料运用于电子封装一直是钎焊领域的一大难题。熔点约为272 ℃的Bi-2.6 Ag-5 Sb钎料合金因润湿性和焊接可靠性不良在运用上受到限制。文中通过在Bi-2.6 Ag-5 Sb钎料合金中添加微量元素Cu来改善B-i2.6 Ag-5 Sb合金的润湿性及焊接可靠性。研究结果表明,Cu含量对BiAgSbCu系钎料合金熔点影响较小,当Cu含量为2 %时,润湿性及焊接可靠性最佳。 相似文献
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Sn-Sb-Cu(Bi)系无铅钎料的研究 总被引:1,自引:0,他引:1
本文研究了Sn-Sb-Cu(Bi)系无铅钎料的润湿性、显微组织以及熔化特性,对Sb、Cu、Bi等元素在Sn基钎料中的作用进行了阐述,发现了几种有应用潜力的合金,有望取代现有广泛使用的SnAg(Cu)系钎料. 相似文献
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Sn-Cu、Sn-Ag-Cu系无铅钎料的钎焊特性研究 总被引:17,自引:5,他引:12
制备了Sn-0.7Cu、Sn-3.5Ag-0.6Cu钎料,用润湿平衡法测量了钎料对铜的润湿曲线,研究了温度、钎剂活性、钎焊时间对润湿行为的影响,并与Sn-37Pb钎料进行了比较。结果表明:升高温度能显著改善无铅钎料对铜的钎焊性。当温度<270℃时,Sn-0.7Cu的钎焊性明显低于Sn-3.5Ag-0.6Cu钎料;而当温度≥270℃时,两种钎料对铜都会显示较好的润湿性,而Sn-0.7Cu略优于Sn-3.5Ag-0.6Cu钎料。提高钎剂活性能显著增强钎料对铜的润湿性,其卤素离子的最佳质量分数均为0.4%左右。随着浸渍时间的延长,熔融钎料与铜的界面间产生失润现象。无铅钎料的熔点和表面张力较高,是钎焊性较差的根本原因。 相似文献
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为改善Sn-0.3Ag-0.7Cu钎料抗氧化性和润湿性差的问题,在钎料中添加了P元素,研究了微量P元素对Sn-0.3Ag-0.7Cu钎料抗氧化性、润湿性以及显微组织的影响。制备了含不同质量分数P元素的Sn-0.3Ag-0.7Cu-xP (x=0%, 0.005%, 0.010%, 0.015%, 0.020%)钎料。以实验的方式测试了钎料的抗氧化性以及润湿性,并使用扫描电镜(SEM)和能谱仪(EDS)观察了显微组织。结果表明:随着P含量的增加,钎料的抗氧化性和润湿性显著提高。当P含量达到0.020%时,与不添加P元素的钎料相比,在250℃保温30 min后的氧化渣质量由2.25 g减少到0.79 g。此时,钎料的铺展面积和润湿力也达到最大,分别为65.74 mm2和5.04 mN,润湿时间为0.96 s。添加微量P元素未改变钎料的相组成,其显微组织主要由β-Sn、Ag3Sn与Cu6Sn5三种相构成。随着P含量的增加,Ag3Sn的形态由粒状向片状转变。 相似文献
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研制开发熔点在250~450℃之间的高温无铅软钎料一直是钎焊领域一大难题。熔点为300℃左右的Bi5Sb2Cu钎料因润湿性能和导电性能不良而受到限制。本文通过在Bi5Sb2Cu中添加不同含量Sn形成新型BiSbCuSn四元合金,来改善Bi5Sb2Cu合金的润湿性能和物理性能。结果表明:在Bi5Sb2Cu钎料合金中添加2-↑10wt.%Sn,BiSbCu钎料合金熔点呈下降趋势且幅度较大,但仍在250~450℃之间,润湿性能和导电性能明显改善。当Sn含量为10wt.%时,(Bi5Sb2Cu)10Sn钎料合金润湿性能和导电性能最好。 相似文献
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微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响 总被引:2,自引:0,他引:2
以Sn-0.7Cu系无铅钎料合金为基础,添加微量的P、Ge、Ga、RE元素,进行了280℃大气环境下氧化试验,通过对含有不同微量元素的无铅钎料表面氧化状况的对比及分析,研究了不同微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响。发现当P和Ga同时添加时,得到Sn-0.7Cu-(0.001~0.1)P-(0.0001~0.1)Ga无铅钎料的抗氧化性能高于Sn-0.7Cu-(0.001~0.1)P和Sn-0.7Cu-(0.0001~0.1)Ga的抗氧化性能。 相似文献
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通过在Sn-3Ag-0.5Cu钎料中添加不同含量的Ga,并采用差示扫描量热法(DSC)、万能试验机测试方法配制合金材料的熔化特性曲线、力学性能、金相结构、焊接润湿扩展率等性质,研究Ga含量对Sn-3Ag-0.5Cu钎料的熔化过程、焊接润湿扩展性以及组织和力学性能方面的影响。结果表明,Sn-3Ag-0.5Cu钎料中加入Ga元素以后,随着Ga增加,钎料的熔点显著降低,熔程也逐渐增大;适量的Ga元素可以改善Sn-3Ag-0.5Cu钎料的润湿性能;当Ga元素的添加量质量分数达到0.5%时,Sn-3Ag-0.5Cu钎料的组织均匀,晶粒明显细化,钎料的力学性能最佳,但Ga元素含量进一步增加时,在晶界处析出黑色富Ga相,对钎料力学性能产生了不利影响。 相似文献
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《电子元件与材料》2017,(3):59-62
向Zn20Sn高温无铅钎料中添加微量铈镧混合稀土(RE),研究了RE的添加量对该钎料合金显微组织及性能的影响。结果表明,添加微量RE的合金显微组织中出现含RE的金属间化合物(IMC)。随着RE的添加,形状各异的IMC的数量显著增加。RE质量分数为0.5%~1.0%的合金的固相线温度不变,而液相线温度略有降低。当RE质量分数为0.5%时,钎料在Cu基板上的铺展面积最大,比Zn20Sn钎料提高了57.6%。但随着RE的继续添加,钎料的润湿性降低。当RE质量分数超过0.1%时,钎料的显微硬度和电阻率随着RE含量的增加而增大。综合考虑,合适的RE添加量为质量分数0.5%。 相似文献
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Lili Gao Liang Zhang Feng Ji Sheng-lin Yu Guang Zeng 《Microelectronic Engineering》2010,87(11):2025-7059
Recent years, the SnAgCu family of alloys has been found a widely application as a replacement for the conventional SnPb solders in electronic industry. In order to further enhance the properties of SnAgCu solder alloys, alloying elements such as rare earth, Bi, Sb, Fe, Co, Mn, Ti, In, Ni, Ge and nano-particles were selected by lots of researchers as alloys addition into these alloys. Rare earth (RE) elements have been called the ‘‘vitamin” of metals, which means that a small amount of RE elements can greatly enhance the properties of metals, such as microstructure refinement, alloying and purification of materials and metamorphosis of inclusions. In addition, a small amount of Zn addition has the ability to reduce undercooling efficiently and suppress the formation of massive primary Ag3Sn plates, and Bi/Ga has the ability to enhance the wettability of SnAgCu alloys as well as Ni. Moreover, adding Co/Fe/Ge can effectively refine microstructure, modify interfacial Cu-Sn compounds and increase the shear strength of joints with Cu. This paper summarizes the effects of alloying elements on the wettability, mechanical properties, creep behavior and microstructures of SnAgCu lead-free solder alloys. 相似文献
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C. Y. Liu Jian Li G. J. Vandentop W. J. Choi K. N. Tu 《Journal of Electronic Materials》2001,30(5):521-525
The wetting behavior of SnAg based Pb-free solders on Cu and Cu substrates plated with Au, Pd, and Au/Pd thin films have been
studied. The wetting angle and kinetics of interfacial reaction were measured. The Au-plated substrates exhibit better wetting
than the Pd-plated substrates. In the case of SnAg on Pd-plated Cu, SEM observation revealed that the solder cap was surrounded
by an innerring of Cu−Sn compound and an outer ring of Pd−Sn compound. This implies that the molten SnAg solder had removed
the Pd and wetted the Cu directly in the equilibrium state. The effects of pre-doping Cu in the SnAg solder on wetting behavior
were also investigated. We found that wettability decreases with increasing Cu content in the solder. We also observed that
the SnAgCu solders have a lower Cu consumption rate than the SnAg solder. 相似文献
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T. M. Korhonen P. Su S. J. Hong M. A. Korhonen C. -Y. Li 《Journal of Electronic Materials》2000,29(10):1194-1199
We have done experimental research on the dissolution rate and intermetallic growth on Cu, Ni, and CuNi-alloy substrates as
a function of time and Cu/Ni ratio of the substrate. Reactions that occur when CuNi metallizations are soldered with lead-free
solders were investigated. The experiments were performed using Sn-3.5Ag and Sn-3.8Ag-0.7Cu solders and different CuNi alloys.
To determine the rate of dissolution of the substrate material into the solder, CuNi foils of different concentrations were
immersed in Sn-3.5Ag and Sn-3.8Ag-0.7Cu solder baths for soldering times ranging from 15 sec to 5 min at 250°C. In addition,
reflows of solder balls were made on top of bulk substrates to study the reaction when there is a practically infinite amount
of CuNi available compared to the amount of solder. Thin film experiments were also done, where Ni containing under bump metallizations
(UBMs) were fabricated and reflowed with eutectic SnAg solder balls. The nickel slows down the dissolution of the UBM into
the solder and the formation of intermetallics during reflow compared to Cu metallizations. The solder/UBM interfaces were
analyzed with SEM to find out how Ni concentration affects the reaction, and how much Ni is needed to obtain a sufficiently
slow reaction rate. 相似文献
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M. L. Huang T. Loeher D. Manessis L. Boettcher A. Ostmann H. Reichl 《Journal of Electronic Materials》2006,35(1):181-188
A comparative study of solid/solid interfacial reactions of electroless Ni-P (15 at.% P) with lead-free solders, Sn-0.7Cu,
Sn-3.5Ag, Sn-3.8Ag-0.7Cu, and pure Sn, was carried out by performing thermal aging at 150°C up to 1000 h. For pure Sn and
Sn-3.5Ag solder, three distinctive layers, Ni3Sn4, SnNiP, and Ni3P, were observed in between the solder and electroless Ni-P; while for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders, two distinctive
layers, (CuNi)6Sn5 and Ni3P, were observed. The differences in morphology and growth kinetics of the intermetallic compounds (IMCs) at the interfaces
between electroless Ni-P and lead-free solders were investigated, as well as the growth kinetics of the P-enriched layers
underneath the interfacial IMC layers. With increasing aging time, the coarsening of interfacial Ni3Sn4 IMC grains for pure Sn and Sn-3.5Ag solder was significantly greater than that of the interfacial (CuNi)6Sn5 IMC grains for Sn-0.7Cu and Sn-3.8Ag-0.7Cu solders. Furthermore, the Ni content in interfacial (CuNi)6Sn5 phase slightly increased during aging. A small addition of Cu (0.7 wt.%) resulted in differences in the type, morphology,
and growth kinetics of interfacial IMCs. By comparing the metallurgical aspects and growth kinetics of the interfacial IMCs
and the underneath P-enriched layers, the role of initial Cu and Ag in lead-free solders is better understood. 相似文献
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