重力感应技术在智能手机及平板电脑中的应用分析

本文主要对重力感应技术在智能手机及平板电脑中的应用进行探讨。首先对重力感技术的概念进行了一个简单的概括。其次,对重力感应技术工作原理进行了分析,最后对重力感应技术在手机、平板电脑中的应用进行了探析。     

一种DC-DC芯片中的新型电流感应电路

概述电流感应技术在电源管理芯片中的应用,并总结目前的电路感应方法,对其优缺点进行了对比,重点叙述了一种新型的片上电流感应技术,这种技术工作在电流模式,仿真该技术可见其有较好的感应精度.且该技术具有结构简单,功耗极小,易于集成,感应可靠等优点,应用设计前景广泛.     

成熟可靠的触摸感应技术展示广阔应用前景

Quantum Research Group作为全球领先的无晶圆厂半导体公司,开发并销售用于转换和控制应用的电容式感应IC,这些产品使用了我们自有专利电荷转移(QT)电容式感应技术.所以我认为在2006年中,移动电话上的新一代触摸屏技术、电容式触摸屏和其他2D输入设备将是技术和产品的热点.     

硅通孔在LED封装中的应用专利技术综述

本文主要从专利视角对硅通孔在LED封装中的应用进行了统计分析,总结了与硅通孔在LED封装中应用相关的国内外专利的申请趋势、主要申请人分布,并对重点技术的发展路线进行了梳理.     

GPS相对定位在重力卫星KBR测距中的应用

卫星重力测量技术的应用对于地球重力场的反演具有划时代的意义,是当今大地测量领域的研究前沿和关注热点之一,我国目前在该领域研究尚属起步阶段.文章介绍了重力卫星测量系统的组成,研究了GPS相对定位与定时在重力卫星K波段测距系统(KBR)微米级测距中的作用,给出了利用双频GPS相对定位与定时结果修正KBR测距的方案,并通过仿真实际应用对该方案进行验证.验证结果表该方案可达到重力卫星测量的要求.     

交通指挥无线有源音箱的研究与制作

介绍了声效系统在交通指挥中的作用以及具体成果“一种交通指挥无线有源音箱”的研制.对该设计的技术特点进行了分析,并对试制应用情况进行了介绍,最后对其应用前景进行了展望.该项目已经获得国家知识产权局的实用新型专利.     

发光二极管领域发展分析

介绍发光二极管的性质、应用及发光原理,根据专利数据库中的专利数据及国际专利分类体系对发光二极管领域的专利申请进行专利分析,对发光二极管近10年的专利申请量、技术脉络以及改进专利进行梳理,为国内发光二极管领域的发展提供分析依据.     

自动立体显示技术的专利状况分析

自动立体显示技术使用户可以在显示屏幕前的不同位置通过裸眼观看到清晰的立体图像.基于自动立体显示技术领域的专利文献,给出了对该领域专利总体变化情况的统计分析结果,通过一些典型的专利文献介绍了专利中的技术发展情况,并分析了主要专利申请人所申请专利的技术特点,由此对今后的专利发展趋势进行预测.通过专利分析,希望对业内人士有所帮助.     

触摸屏技术的专利分析

基于触摸屏技术领域的专利文献,给出了对该领域专利总体变化情况的统计分析结果.通过一些典型的专利文献介绍了专利中的技术发展情况,并分析了主要专利申请人所申请专利的技术特点,由此对今后的专利发展趋势进行预测.     

多点触控手势识别技术发展综述

从专利的角度探究了多点触控手势识别技术在移动终端领域的发展趋势,通过一些典型的专利文献介绍了专利中的技术发展情况,并分析了多点触控手势技术在移动终端领域的技术特点,由此对今后的专利发展趋势进行了展望.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.