3G融合在线计费系统的实现方案

在3G网络下,融合和实时是计费系统的发展趋势.本文提出了基于3GPP参考架构下的一种融合在线计费的实现方案,实现了语音和数据、移动和固网业务的融合计费,并给出了这种融合在线计费系统的发展方向.     

基于内容的3G网络分层综合计费架构研究

移动数据业务发展迅猛,运营商和服务提供商都希望能够从服务内容中获得收益.由于3G的网络和业务价值链发生了很大的变化,目前的计费系统无法很好地满足针对内容的计费需求.本文先分析了内容计费的现状,然后根据3G的网络结构特点提出一种基于内容的分层综合计费模型,并分析了计费的过程和各层对应的计费策略、计费采集点及计费参数,最后论述了基于内容的3G综合计费平台的网络架构.     

基于云化架构的计费核心系统研究及应用

近年来,随着5G网络正式商用及互联网创新应用快速发展,通信运营商流量业务量呈现爆发式增长,现有计费核心系统的实时处理性能、稳定性压力与日剧增,文章针对可扩展性及高可用性云化设计目标,引入了AKF扩展立方体理论模型作为方法论,提出一套分布式、可配置、强运维、水平扩展的计费核心系统云化架构,并重点介绍计费核心系统的集群化云化架构,以及可扩展性和高可靠性的云化架构核心能力的设计思路,对于运营商核心系统云化转型具有参考价值。     

VoLTE计费方案分析

对VoLTE计费方案进行了分析,具体包括VoLTE网络架构、业务特征、计费架构、计费需求和模式分析等,并对VoLTE业务开通和计费策略提出了建议.     

3G网络计费系统体系结构

本文分析了3G网络计费系统的设计要求,研究了目前一般的计费系统架构,提出一种基于业务特征的3G计费系统的体系结构,该体系结构能够帮助计费系统处理面向客户和合作伙伴的个性化、多样化,能够处理对业务计费的实时性,能够具有业务演变的动态适应性.     

基于软交换的计费研究

本文首先简要比较了软交换网络与传统网络的业务提供，进而给出基于软交换的网络计费系统的基本架构并分析介绍计费相关协议，然后对基于QoS的计费和基于内容的计费等主要计费策略及其实现方案进行了较为深入的分析讨论。     

软交换网络计费研究

本文首先简要比较了软交换网络与传统网络的业务提供，进而给出基于软交换的网络计费系统的基本架构，并分析介绍了计费相关协议，然后笔者对基于QoS的计费和基于内容的计费等主要计费策略及其实现方案进行了较为深入的分析讨论。     

基于Gy接口的分组域实时计费系统

本文首先分析了分组域离线计费方式在运营中存在的局限性,随后介绍了3GPP基于Gy接口的分组域在线计费的基本原理。然后提出了适用于移动运营商的分组域实时计费系统架构,最后提出了分组域实时计费系统在实际部署中应重点关注的问题,并提出了解决方案。     

IMS中计费向网络侧迁移的探讨

文章首先介绍了IMS中计费的总体架构和在线计费、离线计费两种模式;接着分析了R8版本下策略与计费控制的架构所涉及的各个网元;并在此基础上探讨计费向网络侧迁移的必要性及可能性,提出了一种实现方案.     

IMS计费部署及关键问题研究

随着IMS网络及业务的快速发展,IMS计费也日益受到关注.本文基于IMS网元计费能力提出IMS计费部署架构,还介绍了IMS业务离线及在线计费的基本流程,最后对计费存在的一些关键问题进行分析.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.