锥面共形阵列天线盲极化DOA估计算法

 由于共形载体曲率的影响,共形阵列天线中各阵元单元方向图具有不同的指向,使得共形阵列天线具有了多极化特性(Polarization Diversity),为了描述共形阵列天线的多极化特性,通常在共形阵列天线的快拍数据模型中引入阵列入射信号的极化参数,因此共形阵列天线的DOA(Direction-Of-Arrival)估计需要与阵列入射信号极化参数联合估计.本文提出了一种盲极化DOA估计算法,通过在锥面共形阵列天线中设置三对特殊子阵,利用ESPRIT(Estimation of Signal Parameters via Rotational Invariance Techniques)算法,将入射信号极化参数与二维角参数去耦合,在入射信号极化参数未知条件下实现了高分辨DOA估计,并对估计性能进行了理论分析与推导,给出了参数估计的CRB(Cramer-Rao Bound),通过Monte Carlo仿真实验验证了DOA估计算法的有效性.     

基于四阶累积量的共形阵列波达方向估计算法

由于共形天线阵列流形的多极化特性(Polarization Diversity),共形阵列天线的信源方位估计需要与信源的极化状态联合进行。分析总结共形阵列天线波达方向(DOA)估计特点的基础上,针对窄带远场非高斯独立信源,提出了一种共形阵列天线盲极化DOA估计算法。该算法利用四阶累积量对阵列口径的扩展性,结合旋转不变子空间(ESPRIT)算法,在信源极化状态未知条件下实现了共形阵列天线的高分辨DOA估计。所提算法的方位估计不需要天线单元方向图以及信源极化状态的任何信息,适用于多种常用共形载体(锥面、柱面以及球面共形载体),具有较为广泛的应用环境。以柱面共形阵列天线DOA估计为例,详细推导了算法机理,给出了算法步骤,计算机Monte Carlo仿真实验验证了所提算法的有效性。     

共形阵列信号DOA和极化状态联合估计研究

共形阵列是一种与载体表面共形的天线阵列。与平面阵列相比,共形阵列具有对载体电磁性能和动力性能影响小等优点,因此受到人们广泛的关注。受载体曲率影响,共形阵列具有多极性。在信号处理时,必须要考虑信号极化的状态。为此,针对共形阵列信号二维DOA和极化状态联合估计问题,提出了一种基于空时处理的参数估计算法。该算法通过对极化接收数据时域和空域联合处理构造时空DOA矩阵,利用DOA矩阵方法只需一次特征值分解即可获得信号二维DOA和极化状态参数估计。算法对阵列形状要求低,无需谱峰搜索和参数配对,计算量小。最后,以圆台共形阵列为例,通过仿真实验验证了算法的有效性。     

矢量传感器阵列MIMO雷达高精度二维DOA与极化联合估计

该文采用矢量传感器配置下的十字型阵列MIMO雷达系统,提出一种新的2维高精度DOA与极化参数联合估计算法。首先根据MIMO雷达虚拟阵列导向矢量的特点,通过降维矩阵的设计及回波数据的降维变换,将高维回波数据转换至低维信号空间;然后基于传播算子获得对应信号子空间的估计,利用收、发阵列阵元间长基线对应的旋转不变性和极化矢量中电场矢量和磁场矢量的叉积进行2维高精度DOA估计和解模糊处理,同时利用与阵列结构无关的极化域旋转不变性进行极化辅角和极化相位差的联合估计。该矢量传感器MIMO雷达阵列可同时获取MIMO雷达的波形分集和矢量传感器的极化分集,无需额外增加阵元和硬件开销,能够有效扩展阵列孔径,提高参数估计性能;同时通过降维变换及传播算子,在获取信噪比增益的同时,能够实现2维高精度DOA和2维极化矢量的联合估计及参数的自动配对,有效降低数据处理维数和参数估计的运算复杂度;最后,仿真结果验证了理论分析的正确性和算法的有效性。     

三正交分离式极化敏感阵列的波达方向估计

该文研究了分离式极化敏感阵列(SS-PSA)的多目标波达方向(DOA)估计问题。首先建立三正交分离式极化敏感均匀稀疏阵列的信号模型;接着利用阵列的旋转不变性采用ESPRIT算法计算出多值模糊DOA估计;利用该模糊DOA估计值对分离式极化天线进行空间相移的补偿,然后利用共点式极化天线之间的多维角度结构求出对应的虚拟DOA估计;最后通过提取多值模糊估计值和对应虚拟估计值之差的最小范数得到多目标的DOA估计。该文所提阵列采用分离式极化天线代替传统共点式极化天线,降低了阵列的互耦影响;采用稀疏阵列结构有效地扩展了阵列的物理孔径,大大提高了DOA估计精度。计算机仿真结果证明了该算法对分离式极化天线DOA估计的有效性和高精度性。     

多跳频信号波达方向与极化状态联合估计算法

为了有效辅助跳频(FH)网台分选和信号识别、跟踪,该文用正交偶极子对构造极化敏感阵列,基于空间极化时频分析,在欠定条件下实现了多跳频信号波达方向(Direction Of Arrival, DOA)与极化状态的高效联合估计。首先建立跳频信号的极化敏感阵列观察模型,然后根据参考阵元时频分析结果建立各跳信号的空间极化时频分布矩阵,再利用该矩阵中蕴含的信号极化-空域特征信息分别运用线性、二次型空间极化时频以及多项式求根共3种方法实现DOA与极化参数联合估计,最后蒙特卡罗仿真结果验证了该算法的有效性。     

共形阵列非圆信号波达方向估计算法

受共形载体变曲率结构的影响,各天线单元指向不尽相同,使得共形天线阵列呈现极化多样性。因此,共形天线阵列的建模过程中需考虑不同阵元的极化响应特性。基于柱面共形天线阵列的快拍数据模型,利用非圆信号的特性对阵列输出进行扩展,基于秩亏理论和子空间原理实现信号波达方向（DOA）估计,所提方法估计精度高,不需要参数配对。存在相干信源时,提出对扩展后的虚拟阵列进行划分,对划分出的子阵进行虚拟的空间平滑,实现解相干的预处理操作。仿真结果表明该方法能有效应用于柱面共形阵列非圆信号DOA估计,并提高了空间分辨率。      

基于虚拟阵列变换的共形阵列信号DOA估计

共形阵列是指与载体表面共形的天线阵列,对载体空气动力性能影响小,在军用、民用等飞行器上具有广泛的应用。针对共形阵列信号处理中的角度估计问题,给出了一种基于虚拟阵列变换思想的共形阵列信号DOA估计算法。该算法首先对接收数据进行虚拟阵列变换,利用变换后的数据,采用ESPRIT算法和MUSIC算法相结合,实现了对共形阵列信号二维角度估计。算法对阵列形状限制小,真正实现了适用于任意共形阵列。以圆柱共形阵列为例,通过仿真实验验证了算法的有效性。     

稀疏极化敏感阵列的波达方向和极化参数联合估计

该文采用稀疏分布极化敏感阵列(SD-PSA),研究了多目标波达方向(DOA)和极化参数的估计问题。首先建立稀疏极化敏感阵列信号模型;然后利用阵列的空间旋转不变性运用ESPRIT算法得出信号的高精度周期性模糊多值DOA估计;同时利用子阵列导向矢量之间的关系得出信号的极化信息和DOA的无模糊粗估计;最后利用DOA粗估计值解模糊,得到信号的高精度无模糊DOA估计。该文所提阵列的阵元间距大于半个波长距离,扩展了阵列2维物理孔径,一定程度上降低了阵元间的互耦影响,相应的信号DOA估计精度大大提高。仿真实验结果验证了该算法对信号DOA和极化参数估计的有效性。     

柱面共形阵列天线盲极化波达方向估计算法

针对柱面共形阵列天线的单曲率特点,建立了柱面共形阵列天线的快拍数据模型,基于高分辨波迭方向(DOA)估计的子空间原理与秩损理论,结合合理的阵元排列结构设计,将信源极化状态、俯仰角以及方位角去耦合,通过参数的一维搜索与方程求解,实现了信源极化状态未知条件下的2D DOA估计.针对相干信源情况,推导了柱面共形阵列天线的解相...     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.