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1.
在网络向着高速化、宽带化、泛在化发展的过程中,出现了多种多样的无线通信系统,给网络带来了丰富的异构性。然而异构网络缺少互通机制,缺乏有效的协调,具有系统间的干扰、单一网络业务提供能力有限、频谱资源稀缺等问题,网络资源利用率低下。为使网络资源能够高效使用,联合资源管理必不可少。而传统的集中式资源管理架构不能满足异构网络环境的需求,分布式基于多代理的网络资源管理架构将是未来异构无线网络联合资源管理的主要形式。  相似文献   

2.
《信息通信技术》2015,(5):47-54
网络虚拟化技术是实现物联网智慧化服务的一项关键技术,其能够支持网络多样化和泛在化,并能提高网络资源利用率。论文基于物联网智慧服务特征,探讨物联网服务的语义化描述方法,进而研究网络虚拟化环境下的资源表示模型和资源管理模型,基于上述模型研究面向物联网服务的虚拟网络体系架构,实现网络虚拟化环境下面向物联网服务的网络资源的管理最优化。  相似文献   

3.
泛在网络关键技术及发展展望   总被引:6,自引:1,他引:5  
泛在网络是硬件、软件、系统、终端和应用的融合,它把网络空间、信息空间和人们生活的物理空间集成为一个整体,从而使网络如同空气和水一样无所不在和自由地融入人们的生活和工作之中.本文主要介绍了泛在网络的概念及结构,对其关键技术进行了阐述和分析,并对泛在网络面临的问题提出了自己的解决方案,这可为泛在网络的进一步研究提供指导.  相似文献   

4.
算力网络作为对泛在的计算和网络资源进行灵活调度的新型信息基础设施,对数字经济的发展具有重要意义。算力网络资源管理系统维护算力资源信息并响应用户请求,是支撑算力网络的关键组件,但尚未形成体系化的安全架构,面临着重大安全威胁。文章首先分析当前算力网络资源管理面临的安全风险,并提出算力网络资源管理安全架构,然后梳理其中的关键技术,包括算力资源安全通告协议、高效算力资源校验和算力请求安全解析机制,为算力网络安全体系的建设提供支撑。  相似文献   

5.
云计算技术在泛在网络中的应用前景分析   总被引:1,自引:0,他引:1  
泛在应用的广泛性与数据海量化等特征需要一种高效的信息处理手段来提供技术保证。本文首先分析了泛在网络及其应用平台对各类计算与网络资源的初步要求,对当前云计算技术的分布式处理能力进行了评估,并对云计算在未来泛在应用的研究方向提供了参考建议。同时,提出了一种基于云计算技术的泛在应用体系架构,为云计算技术的研究提供了全新的应用领域。  相似文献   

6.
王群  钱焕延 《电信科学》2012,28(7):86-93
区别于传统强调人与人连接的互联网,物联网是互联网的技术扩展和应用延伸。本文阐述了物联网融合传感器网络、EPC系统和泛在网络的泛在多元信息获取方式,利用电信网、互联网以及广电网等通信网络和各类接入网络实现泛在数据传送,为社会不同行业的应用需求提供泛在服务能力。指出物联网的技术路线是在现有互联网的基础上,通过借鉴和吸收相关学科的研究和应用成果,形成的一个物理空间与虚拟空间、人与物交叉融合的信息服务基础平台;物联网的根本属性是泛在化,即泛在网络,具体体现在泛在互联、泛在技术支持和泛在应用整合等方面。  相似文献   

7.
贺正娟 《通信技术》2009,42(10):81-83
泛在网络作为未来网络,存在自治性、异构性、复杂性、混沌性等挑战。泛在网络计算环境下资源的组织与管理、竞争与共享、分配、负载均衡等问题成为泛在网络发展的障碍。结合移动Agent技术,提出了一种基于移动Agent的泛在网络资源管理层次模型,为使用者提供一个分布的、易于扩展的、高效实用的泛在网络计算环境。  相似文献   

8.
智慧协同网络体系基础研究   总被引:12,自引:0,他引:12       下载免费PDF全文
张宏科  罗洪斌 《电子学报》2013,41(7):1249-1254
现有互联网具有"三重绑定"特征,即:服务的"资源和位置绑定"、网络的"控制和数据绑定"及"身份与位置绑定".这种网络体系与机制是相对"静态"和"僵化"的,在此基础上的演进与发展无法从根本上满足信息网络"高速"、"高效"、"海量"、"泛在"等通信需求,难以解决网络可扩展性、移动性、安全性等问题,更难以实现网络资源的高效利用、节能等.本文创造性提出了以"三层"、"两域"为典型特征的智慧协同网络体系结构模型."三层"即:智慧服务层、资源适配层和网络组件层;"两域"即实体域和行为域.在"三层"、"两域"体系模型的基础上,分别建立了智慧服务层、资源适配层和网络组件层的基本理论,以在有效解决网络可扩展性、移动性、安全性等问题的基础上,大幅度提高网络资源利用率,降低网络能耗等,显著提升用户体验.  相似文献   

9.
铁伟 《电信建设》2004,(3):7-10
网络资源管理是一个相对较新的概念,在网络资源管理系统建设过程中,常遇到一些问题,特别是与网络管理系统的建设会有一些矛盾和重复,为此本文比较和分析了网络资源管理和网络管理的关系.在此基础上,结合北京通信的实际情况,在网络资源管理系统的建设思路方面进行了探讨,并提出了一些建议.  相似文献   

10.
网络优化的主要目的,一是为移动用户提供一个无缝的、高通话质量的网络,二是使现有的网络资源能够得到充分的利用。在接续和通话过程中,由于每一个环节出现问题都会对网络的服务质量造成影响,因此在进行网络优化时,接续和通话过程中的每一个环节都不容错过。另外。网络资源利用率的高低,也是网络优化中所需要关注的问题。  相似文献   

11.
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.  相似文献   

12.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

13.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

14.
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.  相似文献   

15.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.  相似文献   

16.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.  相似文献   

17.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.  相似文献   

18.
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's.  相似文献   

19.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

20.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

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