智能云电视终端设备专利分析

随着三网融合技术的发展,智能云电视终端设备日益受到重视,成为研究的热点,近十几年来专利申请量有了飞速增长.通过对智能云电视终端设备的国内专利申请从宏观角度在年度申请量、申请人分布情况、技术领域进行了分析,并对主要申请人在该领域专利申请的特点进行了阐述,最后分析了目前智能云电视终端设备的研究方向.     

浅析智能电视专利中的人机交互技术

为抢占智能电视市场先机,国外领先企业已开始积极进行专利布局,对中国制造商而言,需要及时了解并分析相关专利的分布情况,以制订有效的应对策略。从2006年开始,每年智能电视领域的专利申请全球有约1,200项左右,从前十名主要申请人来看,有六家是日本的企业,也就是说日本企业在智能电视领域拥有着集团优势;而从申请地来看,最主要的市场是在美国。智能电视技术可以分解为芯片、操作系统、人机交互以及应用与服务四大领域,在这四个领域当中,目前大家比较关注的技术是人机交互。手势遥控技术专利下面我们以人机交互应用之一手势遥控器为例看如何对专利进行分析。     

智能电视人机交互技术的专利分析

介绍了智能电视人机交互技术的含义及发展现状,并使用中国国家知识产权局网站的专利检索与服务系统对智能电视的人机交互技术进行了检索,按照区域、技术领域并结合申请人对智能电视的人机交互技术进行了分析,并预测未来人机交互技术的发展趋势,希望能对国内相关行业发展有所帮助.     

一种新型智能电视遥控器的设计与实现

针对当前手势识别的摄像头安装在电视机上,存在受距离和视角的影响以及手势识别率较低的问题,设计并实现了一种将摄像头集成到遥控器,让遥控器完成手势识别,并通过红外通信方式传送到智能电视实现控制的手势识别系统。该遥控器还设计实现了绝对坐标空中鼠标的功能,给电视用户提供更加方便、快捷的智能交互体验。     

智能电视手势识别与绝对定位空中鼠标遥控器的设计与实现

针对当前手势识别的摄像头安装在电视机上,存在受距离和视角的影响以及手势识别率较低的问题。设计并实现了一种将摄像头集成到遥控器,让遥控器完成手势识别,并通过红外通信方式传送到智能电视实现控制的手势识别系统。该遥控器还设计实现了绝对坐标空中鼠标的功能,给电视用户提供更加方便、快捷的智能交互体验。     

智能电视人机交互技术分析

当前智能电视技术非常火热,既与三网融合的政策导向有密切的关系,也与新时代下科技潮流、娱乐方式的转变有关,迫使厂商自发地迎合市场。本文关注智能电视的技术发展,并从智能电视人机交互技术分析出发,重点分析了手势遥控和新型遥控等重要专利技术。     

智能电视发展策略研究与探索

在技术及用户需求的推动下,彩电企业纷纷加入智能电视的竞争谋求产业升级。首先介绍了智能电视特点、产业链现状及未来发展趋势,以及对国内智能电视发展中面临的问题进行了深入分析,并提出了中国电信切入智能电视产业合作模式。     

多种手势对应同一语义的柔性映射交互算法的研究

针对智能交互界面中手势识别错误导致交互界面变化错误和手势不识别两个基本问题,本文设计并实现了基于手势交互的智能教学界面,该系统可以通过获取教师的手势信息与教师进行交互.主要创新点在于提出了多种手势对应同一语义的柔性映射交互算法.本文选取了14种自然交互手势,分析了对应同一语义的多种手势之间的共同特征.实验结果显示,该算法能够有效降低用户负荷.该算法已经用于一个基于手势交互的智能教学系统界面中.     

智能电视人机交互技术专利分析

随着通信技术和网络传输技术的迅速发展,智能电视作为电视产业的新媒体,获得了业界的普遍重视,各大企业和研究机构等纷纷展开了智能电视相关技术的专利部署.针对智能电视人机交互技术的特点、专利申请情况、重要申请人、专利发展趋势进行了详细的分析和研究,希望对国内相关行业的产品研发有所帮助.     

智能电视中的人机交互技术

给出了智能电视的定义,将智能电视的人机交互技术分为四类:新型遥控、体感技术、语音识别和多屏互动。新型遥控的发展现状是简约化和多功能化;体感技术包括手势识别、肢体识别、面部识别和眼动追踪等四种技术。分析了各类人机交互技术实现的难点,指出了智能电视人机交互的发展方向。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.