发射率对飞机蒙皮温度及红外辐射特性的影响

建立了某型飞机的简化几何模型,并设置了飞机的飞行航迹。综合考虑了太阳辐射、地球辐射、大气辐射和气动加热的多种因素,结合飞机蒙皮材料物理特性,针对涂覆三种不同发射率的隐身涂层蒙皮建立了导热物理模型,采用一维导热方程计算了飞机在12:00~12:45时间段飞行时不同发射率的蒙皮表面的温度分布。最后综合考虑了环境辐射的影响,分别对具有不同发射率的飞机蒙皮3~5 m和8~14 m两个波段的红外辐射强度进行了数值计算。结果表明:随着蒙皮发射率的减小,在一定程度上能降低蒙皮在8~14 m波段的红外辐射强度,但是因环境因素的影响,仅仅通过降低蒙皮发射率,飞机红外隐身的效果并不理想。     

基于高温黑体的傅里叶光谱测量系统响应度分段线性标定

傅里叶红外光谱仪（FTIR）光谱响应度的标定工作是FTIR红外光谱精准测量的基础。基于中国计量科学研究院（NIM）的ThermoGage HT9500型高温基准黑体辐射源,对NIM搭建的FTIR高温黑体红外辐射特性测量系统的光谱响应度,通过分段线性标定法进行了标定实验。建立并描述了FTIR测量高温黑体红外辐射特性系统响应度函数标定模型,并通过测量的黑体辐射源在1 273~1 973 K温区、1~14 m宽频谱内的红外光谱,对FTIR测量系统的光谱响应度进行了标定实验研究。结果表明:分段线性标定FTIR红外光谱测量系统方法具有良好可靠性。1 373~1 873 K温区的测量光谱与基于黑体标定的计算光谱在1~14 m频谱内平均偏差优于1%,黑体光谱辐射亮度峰值波长上反演得到的黑体计算温度与实际温度偏差优于0.45%。     

长航时UAV蒙皮红外辐射强度的工程计算

无人机（Unmanned Aerial Vehicle,UAV）蒙皮的红外辐射特性是对UAV进行探测识别的重要依据,而UAV蒙皮的气动力加热、太阳辐射换热、地球辐射换热等是影响UAV蒙皮辐射特性的主要因素。在综合考虑了环境以及UAV自身辐射的情况下,建立了UAV蒙皮红外辐射的计算模型,采用向前差分法求出了UAV蒙皮的一维导热微分方程,并在此基础上,结合UAV蒙皮材料的发射率,计算了在某一平面上UAV红外辐射强度的分布情况。计算结果表明:蒙皮在8~14 m波段处红外辐射强度远大于3~5 m波段的红外辐射强度;相同波段处,蒙皮正上方的辐射强度大于正下方的辐射强度。     

红外目标光谱辐射亮度测试技术

红外目标光谱辐射亮度对于武器光电系统的搜索、跟踪及目标识别都具有重要的应用。以红外辐射理论为基础,在同温度、同波长下采用红外傅里叶分光法并与标准黑体相比较的方法对红外目标光谱辐射亮度进行了测试技术研究,建立了红外目标光谱辐射亮度计量测试装置。根据实验结果分析,该装置在波长范围2.5～14 m,1 000 ℃、3 000 ℃、5 000 ℃、7 000 ℃四个温度点条件下,测量误差为1%,在5 000 ℃、7 000 ℃时,测量误差小于0.1%。分析讨论了对测量结果产生影响的因素,得出当标准黑体温度与被测红外目标温度不一致时,会给测量带来较大误差;在3.0～5.4 m范围内,分别选用InSb和MCT两种探测器,产生的偏差为0.5%。     

涂层参数对卫星动态辐射特性影响分析

考虑卫星本体表面包覆绝热材料的实际物理状态,根据数值传热学和有限容积法建立了目标表面温度场的计算模型,对在轨飞行卫星的瞬态温度场进行数值模拟.考虑涂层表面自身辐射及空间轨道外热流等因素,建立了卫星多光谱辐射亮度的计算模型,计算了涂层表面在0.38～0.76μm、3～5 μm和8～14μm波段的瞬态辐射亮度.分析了涂层参数(太阳短波吸收率、红外发射率)对瞬态温度和波段辐射亮度的影响.结果表明:卫星涂层温度同α/ε成正比,卫星的辐射能量主要集中在可见光和远红外波段,以及不能同时减小卫星在可见光和远红外波段的辐射能量.     

蒙皮反射的背景辐射对亚声速飞机红外特征的影响研究(二): 应用

采用典型背景下的飞行器红外辐射特征计算模型, 研究了蒙皮反射太阳、大气和地面等背景辐射对亚声速飞机总的红外特征的影响。计算分析了背景辐射对降低发射率的红外抑制效果的影响。结果表明: 太阳辐射对飞机前向探测区域3~5 m波段的红外辐射强度影响最大, 大气和地面辐射对飞机前向和侧向探测区域8~14 m波段的红外辐射影响更明显;探测方位、季节不同, 影响程度也不同;蒙皮反射的背景红外辐射使得降低发射率措施的红外抑制效果降低甚至失效。     

中波红外高光谱仿真中的辐射影响模型

为提高红外高光谱目标特性仿真的逼真度，提出了一种辐射影响计算模型，用于计算目标周围的建筑物对目标的最终辐射特性的影响。建立了一个虚拟实验场景，设定场景的大气环境为1976年的美国标准大气。在建立的虚拟场景上在中波红外3.0~5.0m范围内以0.01m为步长对目标所受的辐射影响进行了仿真计算，并将辐射影响与太阳辐射、目标自身辐射进行了比较。实验结果显示在中波红外的某些波段范围内，相邻建筑单位面积的辐射影响亮度要高于太阳辐射亮度和目标自身辐射亮度。这表明在图像立方体的某些图像中，辐射影响是成像的最主要的辐射源，证明了多光谱/高光谱仿真情况下该模型的必要性和重要性。通过对仿真结果的分析，确定了建筑表面温度、大气透过率和有效辐射面积是辐射影响因素中的三个关键因素。     

双向反射分布函数结合Bi-LSTM网络求解壁面发射率

壁面光谱发射率求解是飞行器红外隐身的关键技术之一。首先设计了壁面反射光路和光源,通过光谱辐射计获取壁面反射的辐射亮度序列,为尽可能地消除外界干扰对于光谱发射率求解精度的影响,基于双向长短期记忆网络,设计了Bi-LSTM亮度回归网络模型,并对测试样本进行训练学习。基于BRDF的壁面发射率求解模型及基于Bi-LSTM网络的亮度回归模型求解壁面的发射率。计算结果显示,提出的基于双向反射分布函数的壁面发射率求解方法的相对误差为12.21%,满足工程测试需求。     

基于长波红外的高空飞机蒙皮辐射测量方法研究

本文提出一种对飞行中的飞机蒙皮进行辐射测量和温度反演的方法。首先建立蒙皮辐射模型、大气传输模型和绝对辐射校正模型,然后推导出温度反演的公式,使用逐次逼近法计算蒙皮温度。在理论分析的基础上,使用8~12 μm的宽波段长波红外相机进行试验验证和温度反演,对反演温度的不确定度计算并进行修约,得到5 km飞行高度的民航飞机蒙皮温度的修约结果为268 K,修约不确定度为4 K,修约相对不确定度为1.49%。论文研究工作对获取飞机目标红外辐射特性有重要参考价值。     

经过大气传输的红外热像仿真

大气传输特性对成像红外和目标识别研究具有重要意义。在“漫射灰体”的假设条件下，忽略传输路径上的气温变化，给出了大气传输计算的数值方程，并分析了使用等效黑体辐射光谱分布代替目标有效辐射光谱分布进行大气传输计算的可行性及其带来的误差。结果表明，在8～12 μm波段，使用等效黑体辐射光谱分布进行大气传输计算已经具有足够的精度，并且可以大大节约计算时间；但是在3～5 μm波段，反射太阳辐射对目标表面辐射光谱分布的影响不可忽视，使用等效黑体辐射光谱分布进行大气传输计算将带来较大的偏差。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.