新媒体趋势下运营商实践

【】从用户需求、智能终端和运营商等角度详尽分析了新媒体行业的趋势;然后深入探讨了视讯产业链中主导方内容提供商的需求,和销售渠道两个方面,并总结出电信运营商在视讯产业链中的优势主要在销售和内容分发渠道优势;随后列举了中国移动、中国联通、中国电信的实践探索;最后从三类终端、一个平台、三类业务几方面阐述了中国电信对于实现智慧家庭业务的愿景。     

商用视讯业务发展策略

探讨了中国电信在面临IP电话和移动通信冲击的形势下，发展商用视讯业务的必要性，归纳出需求较大的几种视讯应用，视讯业务涉及的主要技术标准和基于不同网络的视讯业务解决方案。最后，对中国电信应如何发展商用视讯业务提出建议。     

主导内容创新产业链 天翼视讯开启无线娱乐新时代

12月5日,中国电信上海公司和天翼视讯传媒有限公司联合举办的"2011与你童乐天翼视讯才艺宝贝选拔赛"在上海闪耀启动,由此拉开了今后一系列大赛的帷幕,也标志着天翼视讯从整合资源平台提供商向内容提供商深化转型发展,并开始扮演整个视频内容创新产业链的主导者角色。     

主导内容创新产业链天翼视讯开启无线娱乐新时代

12月5日，中国电信上海公司和天翼视讯传媒有限公司联合举办的“2011与你童乐天翼视讯才艺宝贝选拔赛”在上海闪耀启动，由此拉开了今后一系列大赛的帷幕，也标志着天翼视讯从整合资源平台提供商向内容提供商深化转型发展，并开始扮演整个视频内容创新产业链的主导者角色。     

信息窗

中兴通讯携手产业链各方共享网络多媒体业务发展模式日前,中兴通讯携手中国电信、上海文广联合举办的“网络视讯业务发展全球高级研讨会”在南京、上海两地举     

打造以客户价值为导向的宽带视讯业务平台

1 构建宽带视讯业务平台的意义 中国电信正在向综合信息服务提供商转型,其中视讯业务能力的提供是转型中的重要一环,打造一个成功的宽带视讯业务平台是中国电信从电信业务提供商向综合信息服务提供商转型的重要环节.     

打造以客户为导向的宽带视讯业务平台

一、引言 中国电信正在向综合信息服务提供商转型，其中视讯业务能力的提供是转型中的重要一环，打造一个成功的宽带视讯业务平台是中国电信从电信业务提供商向综合信息服务提供商演进的重要环节。     

中国电信“新视通”视讯会议系统技术和业务研发

项目简介:项目所属科学技术领域、主要内容、特点及应用推广情况:本项目属于电子与通信科学领域,基于本项目的研究成果,中国电信整合建设了覆盖全国范围,支持国内外跨地域接入的可运营、可管理的“新视通”视讯会议系统,其业务能力满足大规模公众运营的需求。在深入研究H.323与SIP视听多媒体技术和视频编解码技术的基础上,结合中国电信的现状和当前设备的实现情况,确定了中国电信视讯会议系统的全国联网技术方案,制定了详尽的业务和技术规范,指导相关厂家进行设备的开发。在此基础上,实现了“两级运营支撑系统,多管理域,一级视讯交换,全网…     

视讯平台“硬”内容才是关键

运营商已经卷起袖子要在视讯领域大干一场了,但其努力的重点似乎存在偏差。 日前有消息称,中国电信即将正式商用＂天翼视讯＂业务。用户不仅可以通过WAP方式收看电视直播和点播节目,还可以通过PC客户端更清晰地观看各类视频内容。为了凸显该产品特色,中国电信大张旗鼓地宣称“天翼视讯”能够为公众提供基于电视屏、电脑屏、手机屏的三屏内容共享与互动的融合视频服务。     

中国电信新视通：咫尺天涯，沟通无限

一、中国电信推出远程视讯业务品牌——视讯通。现有视讯业务主要应用于：远程办公会议、教学或培训、信息发布、监控及其他方面。中国电信最新推出的“新视通”业务是远程视讯业务的品牌，利用宽带网络，把语音、图像、数据等信息综合在一起进行远距离传输的多媒体业务。“新视通”业务让人们进行异地交流时既能听对方的声音，又能看到对方的图像，增强了交流的真实感、亲切感和临场感。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.