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1.
提出了一种面向深度分组检测的高速数据分组解析结构BiPPCS(bidirectional packet parsing architecture for content security)。结构采用内容萃取树描述协议的耦合关系从而提高了数据分组解析的灵活性;利用硬件双向并行流水线提升了数据分组解析的处理速率;通过使用节点映射算法来均衡各级流水线上的节点数目优化存储空间;分析和仿真显示BiPPCS在处理速率、空间利用率等方面能取得较好的均衡。  相似文献   

2.
王旸 《信息技术》2014,(5):171-174
网络监听作为一种逐步发展和完善的技术,在协助网络管理员监测网络传输数据、分析网络的流量、排除网络故障等方面具有不可替代的作用。系统实现了流水线式模式进行数据包捕获和解析处理。建立了通用的报文捕获与解析方案。系统主要以UDP协议报文数据段的解析为重点,支持点对点、组播报文和广播报文的捕获与解析。报文协议可由用户自行设计,用户可以根据需要设计应用层报文协议,用于监控与分析报文。  相似文献   

3.
随着网络功能的不断扩展,新型网络协议的不断涌现,这些协议中的数据包具有新的格式定义,需要网络设备能够支持相应的解析和查找。软件定义网络(Software Defined Networking, SDN)基于流表的转发设计使得网络的创新变得简单,但是仍然难以支持任意协议的可编程解析和处理。该文联合考虑数据包的解析和查找过程,提出一种支持协议弹性定制的数据包查找硬件结构,通过比特粒度的解析和基于元操作的查找过程,使得任意协议能够在硬件结构上得到处理;此外,该文针对所提硬件结构提出一种基于多叉树的映射算法,将用户定制协议映射到硬件处理流水线和查找表中。通过实际的FPGA部署验证了所提结构能够支持多种协议的灵活定制,在硬件中的处理速度可以达到390 Gbps,与已有方案相比,其硬件资源利用率有明显降低。该结构对未来的软件定义网络的数据平面设计有重要的意义。  相似文献   

4.
为了解决路由器报文转发中路由查找速度慢的瓶颈问题,在分析了路由器中广泛使用的各种典型IP路由算法的基础上.提出一种基于多分枝trie树的改进路由查找算法。在多分枝trie树中取消前缀查找,组成一个大的中间结点。在中间结点之间采用多分支步长查询,中间结点的内部使用二进制trie树来表示。仿真结果表明,改进的多分支trie树具有访存次数少,查询速度快,占用存储空间少,更新开销小等特点,并且对IPv4和IPv6地址都可以适用。  相似文献   

5.
为了解决路由器报文转发中路由查找速度慢的瓶颈问题,在分析了路由器中广泛使用的各种典型IP 路由算法的基础上,提出一种基于多分枝trie树的改进路由查找算法.在多分枝trie树中取消前缀查找,组成一个大的中间结点.在中间结点之间采用多分支步长查询,中间结点的内部使用二进制trie树来表示.仿真结果表明,改进的多分支trie树具有访存次数少,查询速度快,占用存储空间少,更新开销小等特点,并且对IPv4和IPv6地址都可以适用.  相似文献   

6.
李明 《电信科学》2006,22(10):55-59
本文在简要分析主动网络体系结构的基础上,对实现主动报文的两种封装协议进行了比较详尽的阐述,分析了主动报文的装载机制及其在互联网上的处理流程,介绍了主动报文封装协议在网络管理和监控中的综合应用方案--智能包(smart packet)方案,最后讨论了一种基于节点的主动网管模型中的主动报文的结构、封装方式及授权过程.  相似文献   

7.
杨珊  时宏伟 《电讯技术》2011,51(10):132-136
介绍了Asterix Category 021协议的数据项内容、用户应用程序框架(UAP)的结构、报文数据块的布局,以及ADS-B系统应用该协议的方式,分析了该协议的实例应用和协议报文的解析,提出了处理报文的思路.研究与分析结果可为如何使用Asterix Category 021协议生成与解析报文提供参考.  相似文献   

8.
交易类系统的业务处理,主要是围绕双方或者多方的报文进行,要实现报文处理的灵活性、易扩展性、以及较好的容错能力,报文的动态处理很重要。动态性主要体现在动态定义、动态解析和动态处理上,其中动态定义是基础。以XML方式将需求阶段的报丈内容转换成计算机语言描述。通过预定义的报文特征码,动态关联到报文解析器和报文处理器上,从而使得报文定义和报文解析、处理松耦合,保证了报文定义和报文解析、报文实现编程的灵活性。该报文灵活的动态处理方式已经在某地市民卡工程中得到应用。  相似文献   

9.
本文首先介绍了获取应用程序通信拓扑和物理拓扑的方法,结合进程间通信量和通信频次定义了进程间亲和度,并针对具有分层网络、NUMA效应的硬件系统,设计了相应的进程映射算法.该算法根据进程间的亲和度对进程集合进行划分,在划分过程中构造出和物理拓扑树同构的树状结构,随后在两棵同构树的对应节点上做映射来解决应用程序进程到物理节点、处理核心的映射问题.在一个多核集群系统上的实验表明,使用本文提出的进程映射方法可以有效提高并行应用程序的通信效率,显著减少程序的总体执行时间.  相似文献   

10.
周栩  刘磊  范任宏 《电子学报》2011,39(4):882-886
本体映射是语义集成的关键技术,本文基于本体的模式结构提出了一种自顶向下的本体映射方法,该方法在考虑四种基本映射关系并假定所有映射关系均为1:1的情况下,首先将本体描述为图,并将本体中的每个概念都定义为树,在此基础上给出了树中叶节点、非叶节点相似度的计算方法,通过概念分类将子树进一步合并,根据分类的结果重新组织图结构,最...  相似文献   

11.
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.  相似文献   

12.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

13.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

14.
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.  相似文献   

15.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.  相似文献   

16.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.  相似文献   

17.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.  相似文献   

18.
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's.  相似文献   

19.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

20.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

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