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《电子元件与材料》2017,(3):59-62
向Zn20Sn高温无铅钎料中添加微量铈镧混合稀土(RE),研究了RE的添加量对该钎料合金显微组织及性能的影响。结果表明,添加微量RE的合金显微组织中出现含RE的金属间化合物(IMC)。随着RE的添加,形状各异的IMC的数量显著增加。RE质量分数为0.5%~1.0%的合金的固相线温度不变,而液相线温度略有降低。当RE质量分数为0.5%时,钎料在Cu基板上的铺展面积最大,比Zn20Sn钎料提高了57.6%。但随着RE的继续添加,钎料的润湿性降低。当RE质量分数超过0.1%时,钎料的显微硬度和电阻率随着RE含量的增加而增大。综合考虑,合适的RE添加量为质量分数0.5%。 相似文献
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稀土元素对Sn-0.2Ag-0.7Cu钎料合金物理性能的影响 总被引:1,自引:0,他引:1
在筛选出综合性能较好的Sn-0.2Ag-0.7Cu钎料合金中,添加微量混合稀土元素(RE)以提高钎料的焊接性能。研究了稀土的添加量对其熔化温度、电导率和固–液相线温差等焊接性能的影响。结果表明:添加w(RE)为0.1%~0.5%时,固–液相线温差小于15℃,符合现行钎焊工艺要求,且对钎料合金的熔化温度和电导率影响不大。 相似文献
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微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响 总被引:2,自引:0,他引:2
以Sn-0.7Cu系无铅钎料合金为基础,添加微量的P、Ge、Ga、RE元素,进行了280℃大气环境下氧化试验,通过对含有不同微量元素的无铅钎料表面氧化状况的对比及分析,研究了不同微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响。发现当P和Ga同时添加时,得到Sn-0.7Cu-(0.001~0.1)P-(0.0001~0.1)Ga无铅钎料的抗氧化性能高于Sn-0.7Cu-(0.001~0.1)P和Sn-0.7Cu-(0.0001~0.1)Ga的抗氧化性能。 相似文献
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Sn-Zn系无铅钎料最新进展 总被引:1,自引:0,他引:1
Sn-Zn系钎料熔点与传统Sn-37Pb钎料十分接近,成本低廉,被研究者所推崇。由于Zn的存在导致Sn-Zn钎料润湿性差及抗氧化性不足,阻碍了该钎料的发展。添加合金元素和纳米颗粒是改善Sn-Zn钎料组织和性能行之有效的方法之一,为国内外研究者所推崇。结合国内外Sn-Zn系无铅钎料最新研究成果,探讨添加微量的合金元素In、Ni、Cr、Ga、Bi、Cu、Al、Ag、稀土元素及纳米颗粒对钎料润湿性、抗氧化性、力学性能、显微组织和界面组织的影响,同时简述有关钎剂对Sn-Zn的影响,并对Sn-Zn系钎料的发展趋势进行分析与展望。 相似文献
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运用莱卡显微镜、扫描电镜和能谱分析等手段,研究了稀土元素La的添加量对Sn3.5Ag0.5Cu钎料及其与Cu基体焊接后微观组织及性能的影响。结果表明:添加不同含量的稀土La均能使钎料及其与Cu基体焊接后组织与性能得到改善,其中以w(La)达到0.05%时为最优,显微硬度及剪切强度分别提高14%和10.7%。键参数函数计算结果表明La具有"亲Sn"倾向,可细化钎料组织,降低IMC(界面金属间化合物)的长大驱动力。 相似文献
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通过SEM和EDAX等,研究了La添加量对Sn3.5Ag0.5Cu钎料与Cu基体焊合界面IMC微观组织及性能的影响。结果表明:添加不同量的La均对Sn3.5Ag0.5Cu与Cu基体焊合后的组织有细化作用并增强其力学性能。其中以w(La)达到0.05%时最优,剪切强度可提高10.7%。材料热力学理论计算结果表明,La具有"亲Sn"倾向,添加少量La到Sn3.5Ag0.5Cu钎料中,可减小Cu6Sn5/Cu界面Sn的活度,降低IMC的长大驱动力。 相似文献
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为改善Sn-0.3Ag-0.7Cu钎料抗氧化性和润湿性差的问题,在钎料中添加了P元素,研究了微量P元素对Sn-0.3Ag-0.7Cu钎料抗氧化性、润湿性以及显微组织的影响。制备了含不同质量分数P元素的Sn-0.3Ag-0.7Cu-xP (x=0%, 0.005%, 0.010%, 0.015%, 0.020%)钎料。以实验的方式测试了钎料的抗氧化性以及润湿性,并使用扫描电镜(SEM)和能谱仪(EDS)观察了显微组织。结果表明:随着P含量的增加,钎料的抗氧化性和润湿性显著提高。当P含量达到0.020%时,与不添加P元素的钎料相比,在250℃保温30 min后的氧化渣质量由2.25 g减少到0.79 g。此时,钎料的铺展面积和润湿力也达到最大,分别为65.74 mm2和5.04 mN,润湿时间为0.96 s。添加微量P元素未改变钎料的相组成,其显微组织主要由β-Sn、Ag3Sn与Cu6Sn5三种相构成。随着P含量的增加,Ag3Sn的形态由粒状向片状转变。 相似文献
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In the current research, trace rare earth (RE) element Y was incorporated into a promising lead-free solder, Sn3.8Ag0.7Cu,
in an effort to improve the comprehensive properties of Sn3.8Ag0.7Cu solder. The range of Y content in Sn3.8Ag0.7Cu solder
alloys varied from 0 wt.% to 1.0 wt.%. As an illustration of the advantage of Y doping, the melting temperature, wettability,
mechanical properties, and microstructures of Sn3.8Ag0.7CuY solder were studied. Trace Y additions had little influence on
the melting behavior, but the solder showed better wettability and mechanical properties, as well as finer microstructures,
than found in Y-free Sn3.8Ag0.7Cu solder. The Sn3.8Ag0.7Cu0.15Y solder alloy exhibited the best comprehensive properties compared
to other solders with different Y content. Furthermore, interfacial and microstructural studies were conducted on Sn3.8Ag0.7Cu0.15Y
solder alloys, and notable changes in microstructure were found compared to the Y-free alloy. The thickness of an intermetallic
compound layer (IML) was decreased during soldering, and the growth of the IML was suppressed during aging. At the same time,
the growth of intermetallic compounds (IMCs) inside the solder was reduced. In particular, some bigger IMC plates were replaced
by fine, granular IMCs. 相似文献
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Weimin Xiao Yaowu Shi Yongping Lei Zhidong Xia Fu Guo 《Journal of Electronic Materials》2006,35(5):1095-1103
Lead-free solders with excellent material properties and low cost are essential for the electronics industry. It has been
proved that mechanical properties of SnAgCu alloys can be remarkably improved with a minute addition of rare earth (RE) elements.
For comparison and optimization, three valuable solder candidates, Sn3.8Ag0.7Cu0.05RE, Sn3Ag0.5Cu0.05RE, and Sn2.9Ag1.2Cu0.05RE,
were chosen due to the excellent properties of their own SnAgCu basic alloys. Wetting properties, melting temperature, bulk
tensile properties, and joint tensile and shear properties were investigated. In addition, the microstructures of solder joints
were observed and the effects of microstructure on mechanical properties were analyzed. Experimental results indicated that
the tensile and shear strengths of solder joints were decreased from Sn3.8Ag0.7Cu0.05RE, Sn2.9Ag1.2Cu0.05RE, to Sn3Ag0.5Cu0.05RE,
in order. Such difference in mechanical properties could be attributed to the influence of slightly coarse or strong Cu6Sn5 scallops in the reaction layer as well as superior eutectic network and large volume percentage of large primary intermetallic
compounds (IMCs) inside the solder joints. It is also suggested that the size and volume percentage of large primary IMCs
inside the solder be controlled. In addition, serration morphology was observed at the edge of large primary and eutectic
IMCs in the three solder joints, which could be related to the content of Ag, Cu, and RE. The serration morphology was proved
to be beneficial to mechanical properties theoretically. Furthermore, the three alloys investigated possessed similar wetting
properties, melting temperatures, and bulk tensile properties. 相似文献
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In the present work, lead-free solder balls were manufactured by a uniform droplet spray (UDS) method. The solder used to
produce solder balls was based on the Sn-3.8Ag-0.7Cu alloy. Different amounts of cerium-based mixed rare-earth (RE) elements
were added into the Sn-3.8Ag-0.7Cu solder alloy in order to examine the effects of small amounts of RE additions on the physical
properties, microstructure, and surface smoothness of the solder balls. Results show that a small amount of RE addition has
no obvious effect on the melting temperature, but it decreases the nucleation undercooling degree. Moreover, a small amount
of RE addition (<0.25 wt.%) can improve the surface smoothness of the solder balls. However, when the RE was added up to 0.5 wt.%,
the surface smoothness of the solder balls was deteriorated. From observations of the microstructure of the solder balls,
it is obvious that the RE addition affects solidification behavior, and as a result, the surface smoothness of the solder
balls. 相似文献
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Microstructure, solderability, and growth of intermetallic compounds of Sn-Ag-Cu-RE lead-free solder alloys 总被引:4,自引:0,他引:4
C. M. T. Law C. M. L. Wu D. Q. Yu L. Wang J. K. L. Lai 《Journal of Electronic Materials》2006,35(1):89-93
The near-eutectic Sn-3.5 wt.% Ag-0.7 wt.% Cu (Sn-3.5Ag-0.7Cu) alloy was doped with rare earth (RE) elements of primarily Ce
and La of 0.05–0.25 wt.% to form Sn-3.5Ag-0.7Cu-xRE solder alloys. The aim of this research was to investigate the effect
of the addition of RE elements on the microstructure and solderability of this alloy. Sn-3.5Ag-0.7Cu-xRE solders were soldered
on copper coupons. The thickness of the intermetallic layer (IML) formed between the solder and Cu substrate just after soldering,
as well as after thermal aging at 170°C up to 1000 h, was investigated. It was found that, due to the addition of the RE elements,
the size of the Sn grains was reduced. In particular, the addition of 0.1wt.%RE to the Sn-3.5Ag-0.7Cu solder improved the
wetting behavior. Besides, the IML growth during thermal aging was inhibited. 相似文献
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Mysore K. Subbarayan G. Gupta V. Ron Zhang 《Electronics Packaging Manufacturing, IEEE Transactions on》2009,32(4):221-232
We describe double-lap shear experiments on Sn3.0Ag0.5Cu solder alloy, from which fits to Anand's viscoplastic constitutive model, power-law creep model, and to time-hardening primary-secondary creep model are derived. Results of monotonic tests for strain rates ranging from 4.02E-6 to 2.40E-3 s-1, and creep response at stress levels ranging from 19.5 to 45.6 MPa are reported. Both types of tests were conducted at temperatures of 25degC, 75degC , and 125degC. Following an earlier study where Anand model and time hardening creep parameters for Sn3.8Ag0.7Cu and Sn1.0Ag0.5Cu solder alloys were reported, here we report power law model parameters so as to enable a comparison between all three alloys. Primary creep in Sn3.0Ag0.5Cu solder alloy is shown to be significant and are considered in addition to secondary creep and monotonic behavior. Aging influence on behavior is also shown to be significant. On the basis of experimental data, the following four aspects are discussed: 1) difference between testing on bulk versus joint specimen; 2) consistency between the creep and monotonic behaviors; 3) comparison against behaviors of Sn1.0Ag0.5Cu and Sn3.8Ag0.7Cu alloys as well as aganist Sn40Pb, 62Sn36Pb2Ag and 96.5Sn3.5Ag alloys; and 4) comparison of Sn3.0Ag0.5Cu and Sn3.8Ag0.7Cu relative to their aging response. 相似文献
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D. R. Frear 《e & i Elektrotechnik und Informationstechnik》2001,118(2):81-86
A variety of Pb-free solder alloys have been proposed for use as interconnects for electronic packaging including Sn?Ag, Sn?Cu, Sn?Ag?Cu, Sn?Ag?Bi, and Sn?Sb, among others. This paper presents a review of the behavior of promising Pb-free solder alloys as related to their microstructure. Recommendations of optimal alloy composition as a function of performance requirements are given. For surface mount applications, eutectic Sn?Ag?Cu is recommended as the optimal alloy. For flip chip interconnects, the eutectic Sn-Cu alloy has the best performance. The materials and process trends of Pb-free packaging are summarized with optimal conditions identified. 相似文献