高效率双频连续F类功率放大器的设计

为满足多标准和多频段无线通信的需求，针对特定频段如何提高效率问题，基于连续F类功放的谐波控制理论，提出了一种高达三次谐波控制的双频功放设计方法，实现了两个频段的高效率性能。首先，分析了电流源平面的各次谐波阻抗，基于连续F类阻抗设计空间的灵活性，设计的双频谐波控制网络将二次谐波控制在短路点附近，同时将三次谐波控制在开路点附近，可提高任意两个频段功放的效率。随后，针对传统耦合器基频匹配网络在多频匹配方面的不足，提出了改进的双频阻抗匹配网络，简化了匹配方法并实现了不同频点的最佳基波阻抗同时匹配到标准的50Ω。最后，使用Cree公司的CGH40010F GaN HEMT设计了一款工作在1.8和2.6 GHz的双频连续F类功率放大器，并进行测试，结果显示在1.8和2.6 GHz的饱和输出功率分别为40.6 dBm和39.5 dBm,最大功率附加效率分别为75.4%和74%,最大漏级效率均大于75%。测试结果表明，所提出的双频谐波控制网络设计方法在提高功放效率方面具有显著优势。     

0.3～3.5 GHz混合连续类功率放大器的设计

混合连续类相比较于传统连续类模型弱化了阻抗条件,简化了宽带匹配难度。该文通过采用混合连续类模型并基于阻抗缓冲概念为理论的新型谐波控制网络,设计了一款跨3个倍频层的混合连续类射频功率放大器。实测结果表明在0.3～3.5 GHz相对带宽为168.4%的频段范围内实现了漏极效率58.4%～72.6%,增益10 dB以上,输出功率为39.8～41.2 dBm。     

0.4~2.2 GHz连续F类功率放大器设计

连续F类功放(PA)通过引入修正因子,减轻功放对基波和二次谐波阻抗的要求,从而扩展F类功放的带宽。本文在连续F类功放基础上,提出一种新型修正型连续F类工作模式。通过引入电阻性二次和三次谐波阻抗进一步扩展连续F类功放的设计空间,使其可实现多个倍频程带宽。基于此理论,采用负载牵引方法对基波和谐波进行最佳阻抗提取,结合实频技术设计功放匹配网络,实现了一款超宽带高效率功率放大器。该功放在0.4~2.2 GHz频段内,饱和输出功率为39.8~41.4 dBm,漏极效率在59%~79%之间,增益大于10 dB。仿真与测试结果良好,验证了该方法的正确性。     

基于GaN器件的连续型高效宽带功率放大器设计*

提出一种高效宽带功率放大器的设计方法,并基于GaN HEMT 器件CGH40010F 设计了验证电路。利用功放管输出寄生参数的等效网络,将基于连续型功放理论得到的负载阻抗转换到封装参考面上,并利用多谐波双向牵引技术对转换后的负载阻抗进行适当调整,使二次谐波负载阻抗位于高效率区以及基频负载阻抗能够获得高功率附加效率和高输出功率。谐波阻抗位于高效率区使得匹配网络的设计简化为基频匹配网络的设计,降低了对谐波阻抗匹配的难度和宽带匹配网络设计的复杂度。实验结果表明:在1GHz -3GHz 工作频带(相对带宽100%)内,功率附加效率在53%-64.6%之间,输出功率为39.5±2dBm,增益为11.5±2dB,二次谐波小于-15dBc,三次谐波小于-25dBc。     

宽带F 类功率放大器的设计

提出了一款4G 频段全覆盖高输出功率高效率功率放大器。设计采用的是Cree 公司提供的GaN HEMT 晶体管CGH40025F。基于F 类功率放大器的设计理论,通过对晶体管的输入输出端均采用谐波控制网络,并将渐变式阻抗匹配这种宽带匹配方法应用到输入输出端的基波匹配当中。在实现二次谐波阻抗匹配至低阻抗区,三次谐波阻抗匹配至高阻抗区的同时基波阻抗被匹配至50Ω附近,从而有效提高了功率放大器的输出功率、效率和带宽。最终的测试结果表明在1. 7 ~ 2. 7 GHz 频率范围内,漏极效率维持在62. 55% ~ 76%,输出功率在20 ~ 41W,增益在10 dB 以上。仿真与实测结果基本一致。     

一种高效率逆F类Doherty射频功率放大器

为了进一步提高射频功放的输出能力,基于GaN HEMT功率器件,采用平衡式结构设计了一款工作频率为3.3 GHz 3.6 GHz的高效率逆F类Doherty结构射频功放。参照功放管的寄生参数等效电路网络,为获得逆F类功放理想的开关特性,设计了具有寄生参数补偿作用的谐波控制网络来抑制功放输出端的二次、三次谐波,同时结合Doherty功放结构特点,使其在6 dB功率回退的情况下仍具有较高的输出效率。仿真后,可得到其在3.3 GHz^3.6 GHz工作频带内的输出功率在40.4 dBm^41.8 dBm内,PAE为66%~77%,最大DE达到82.6%,功率回退6 dB处,功放的DE仍在69%左右,增益平坦度约为±1.5 dB。     

0.3～3.5GHz混合连续类功率放大器的设计

混合连续类相比较于传统连续类模型弱化了阻抗条件,简化了宽带匹配难度.该文通过采用混合连续类模型并基于阻抗缓冲概念为理论的新型谐波控制网络,设计了一款跨3个倍频层的混合连续类射频功率放大器.实测结果表明在0.3～3.5 GHz相对带宽为168.4％的频段范围内实现了漏极效率58.4％～72.6％,增益10 dB以上,输出功率为39.8～41.2 dBm.     

一种基于锥形微带线的宽带F 类功率放大器

提出了一种基于5G 频段的宽带高效率F 类功率放大器。分析表明锥形微带线可以有效解决矩形微带线对于带宽的限制问题, 同时将锥形微带线加入谐波控制网络, 可以实现在一定频率范围内将二次谐波阻抗匹配至短路点附近, 三次谐波阻抗匹配至开路点附近, 从而有效解决了F 类功率放大器带宽和效率的问题。使用锥形微带线制作的功放, 实测结果表明: 在2.7 ~3.8GHz 的频带范围内, 漏极效率达到63% ~78%, 平均输出功率达到10W以上, 大信号增益达到10dB 以上。在5G 无线通信中, 该功放可以有效地发挥其宽带高效率的特点。     

一种高效率E-1 / F 类GaN HEMT 射频功率放大器

使用GaN HEMT 功率器件,设计了一款5G 低频段的高效率E-1 / F 类射频功率放大器。为降低晶体管寄生参数及高次谐波对逆E 类(E-1 )功放开关特性和输出性能的不良影响,将具有寄生参数补偿的逆F 类(F-1 )谐波控制网络引入逆E 类功放输出匹配电路中,实现了对二次谐波和三次谐波分别进行开路和短路处理,从而获得逆E 类功放要求的良好开关特性。同时,得益于逆F 类功放优良的谐波控制效果,改善了功放漏极电压和电流波形,大大降低其漏极峰值电压和电流,进而提升了功放的输出性能。实测结果表明,该功放在3. 3 ~ 3. 6 GHz 的300MHz 有效工作带宽内的功率附加效率为59. 1% ~ 71. 4%,最大漏极效率高达75. 6%,输出功率在40. 2 ~ 41. 5dBm之间,增益平坦度在依1dB 以内。最后利用20 MHz 带宽的单载波LTE 信号作为测试信号,基于广义记忆多项式数字预失真器对该功放进行线性化后,功放输出的邻信道功率比改善了近15 dB。     

基于EFJ模式的宽带高效率Doherty功率放大器设计

将EFJ模式功率放大器应用于Doherty功率放大器的载波功率放大器,利用EFJ类功率放大器的阻抗特性改善了Doherty功率放大器的带宽。此外,还引入后谐波控制网络来提高Doherty功率放大器的效率。功放的输入匹配电路采用阶跃式阻抗匹配来进一步拓展工作带宽。使用CGH40010F GaN 晶体管设计并加工完成了一款宽带高效率Doherty功率放大器。测试结果显示,在3.2~3.7GHz 频段内,饱和输出功率达到43dBm,饱和漏极效率60%~72.5%,增益大于10dB。功率回退6dB时,漏极效率40%~48.5%。     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Noise character analysis and the restraint of self-pulsation laser diodes

We calculate the Langevin noise sources of self-pulsation laser diodes, analyze the effects of active region noise and saturable-absorption region noise on the power fluctuation as well as period fluctuation, and propose a novel method to restrain the noise effects. A visible SIMULINK model is established to simulate the system, The results indicate that the effects of noise in absorption region can be ignored; that with the increase of DC injecting current, the noise effects enhance power jitter, and nevertheless, the period jitter is decreased; and that with external sinusoidal current modulating the self-pulsation laser diode, the noise-induced power jitter and period jitter can be suppressed greatly. This work is valuable for clock recovery in all-optical network.