Zn：Fe：LiNbO3晶体的生长及位相共轭效应的研究

在ＬｉＮｂＯ３中掺进ＺｎＯ和Ｆｅ２Ｏ３生长出Ｚｎ：Ｆｅ：ＬｉＮｂＯ３晶体。测试了晶体抗光致散射能力、位相共轭反射率和响应时间。研究了Ｚｎ：Ｆｅ：ＬｉＮｂＯ３位相共轭效应增强的机理。     

Zn∶Fe∶LiNbO_3晶体的生长及位相共轭效应的研究

在ＬｉＮｂＯ３中掺进ＺｎＯ和Ｆｅ２Ｏ３生长出Ｚｎ∶Ｆｅ∶ＬｉＮｂＯ３晶体。测试了晶体抗光致散射能力、位相共轭反射率和响应时间。研究了Ｚｎ∶Ｆｅ∶ＬｉＮｂＯ３位相共轭效应增强的机理。     

光折变LiNbO_3晶体中的有效载流子密度

基于双光束耦合的原理及实验结果，计算了纯ＬｉＮｂＯ３和Ｆｅ：ＬｉＮｂＯ３晶体中的有效载流子密度，对结果进行了讨论，指出光折变ＬｉＮｂＯ３中氧空位色心也是载流子施主之一，且被激发的Ｆｅ２＋仅占晶体中Ｆｅ２＋浓度的一小部分。     

Zn：Fe：LiNbO3晶体外泵浦位相共轭激光器

在ＬｉＮｂＯ３中掺进ＺｎＯ和Ｆｅ２Ｏ３生长了Ｚｎ：Ｆｅ：ＬｉＮｂＯ３晶体,测试了晶体抗光致散射能力和响应时间,以Ｚｎ：Ｆｅ：ＬＮｂＯ３晶体为位相共轭镜,氦氖气体激活介质,构成了外泵浦位相共轭激光器。     

Fe：LiNbO3晶体的生长及其多波耦合效应

报道了Ｆｅ：ＬｉＮｂＯ３晶体的生长。测试了晶体的放大率，指数增益系数，衍射效率相位共轭反射率和响应时间；对Ｆｅ：ＬｉＮｂＯ３晶体的光折变机理进行探讨。     

Mg：Fe：LinbO_3晶体光折变增强效应的研究

在铌酸锂晶体中掺ＭｇＯ和Ｆｅ２Ｏ３，生长出Ｍｇ：Ｆｅ：ＬｉＮｂＯ３晶体．由于薄晶片的光爬行效应，晶体的二波耦合指数增益系数高达８０ｃｍ－１，且角度响应范围加宽，响应速度和抗光散射能力都比Ｆｅ：ＬｉＮｂＯ３有较大改善．以Ｍｇ：Ｆｅ：ＬｉＮｂＯ３晶体作光放大器，实现了一次迭代全息关联存储．     

Ce：Fe：LiNbO3晶体的生长及二波耦合效的研究

本文介绍了Ｃｅ：Ｆｅ：ＬｉＮｂＯ３晶体的生长，测试了晶体的二波耦合指数增益系数和衍射效率，它具有很高的指数增益系数和衍射效率，并且具有温度增强效应。     

激光晶体Nd：ZnO：LiNbO_3的生长及其光学性能

在ＬｉＮｂＯ３中同时掺入Ｎｄ２Ｏ３和ＺｎＯ，生长了Ｎｄ：ＺｎＯ：ＬｉＮｂＯ３晶体。它具有同Ｎｄ：ＭｇＯ：ＬｉＮｂＯ３晶体相当的抗光损伤能力。Ｚｎ２＋离子的掺入，不影响Ｎｄ３＋离子在晶体中的光谱性质。可成为新型激光晶体。     

Eu：Fe：LiNbO_3晶体光折变效应的研究

测试了Ｅｕ：Ｆｅ：ＬｉＮｂＯ３晶体的指数增益系数，位相共轭反射率和光折变温度效应，以Ｅｕ：Ｆｅ：ＬｉＮｂＯ３晶体作相位共轭镜，实现了实时关联存储。     

Ce：Fe：LiNbO_3晶体的生长及其二波耦合效应的研究

本文介绍了Ｃｅ：Ｆｅ：ＬｉＮｂＯ＿３晶体的生长，测试了晶体的二波耦合指数增益系数和衍射效率，它具有很高的指数增益系数和衍射效率并且具有温度增强效应。     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.