共查询到19条相似文献,搜索用时 50 毫秒
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电子封装是集成电路产品制造过程中的重要环节,而电子封装所产生的应力则可能会对芯片的性能及可靠性产生影响,因而受到业界的广泛关注。利用半导体压阻效应制造硅压阻应力传感器阵列芯片,将其倒装键合至印刷电路板,填充不同类型的下填料进行固化。通过测量应力传感器芯片上的力敏电阻变化,计算倒装键合和下填料固化等封装工艺引入的应力,并讨论了下填料的性能参数对芯片应力大小的影响。此外,在标定力敏电阻及压阻系数温度效应的基础上,对下填料固化过程的应力变化进行了实时监测,分析了下填料固化工艺引起的应力。 相似文献
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P型硅纳米板压阻特性的理论研究 总被引:1,自引:1,他引:0
考虑量子尺寸效应与自旋轨道耦合作用,从含有应变的6×6 Luttinger-Kohn哈密顿量出发,采用有限差分方法建立了p型硅纳米板的能带结构模型.基于硅纳米板压阻特性与其能带结构的相关性,采用改进的压阻理论定量分析了厚度、杂质浓度与温度对其压阻系数的影响.研究结果表明:量子尺寸效应强烈改变了硅纳米板的能带结构,是其压阻系数增大的主要因素,而自旋轨道耦合作用仅对含较高应变的硅纳米板的能带结构有较大影响;硅纳米板的压阻系数具有尺寸效应,随厚度减小而增大,随杂质浓度增加或温度升高而减小.在高简并条件下,硅纳米板的压阻系数与温度无关,完全由杂质浓度的大小控制;在非简并条件下,情况刚好相反.最后,利用施加应力前后空穴等能面形状的变化定性分析了硅纳米板压阻特性的起源. 相似文献
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考虑量子尺寸效应与自旋轨道耦合作用,从含有应变的6×6 Luttinger-Kohn哈密顿量出发,采用有限差分方法建立了p型硅纳米板的能带结构模型.基于硅纳米板压阻特性与其能带结构的相关性,采用改进的压阻理论定量分析了厚度、杂质浓度与温度对其压阻系数的影响.研究结果表明:量子尺寸效应强烈改变了硅纳米板的能带结构,是其压阻系数增大的主要因素,而自旋轨道耦合作用仅对含较高应变的硅纳米板的能带结构有较大影响;硅纳米板的压阻系数具有尺寸效应,随厚度减小而增大,随杂质浓度增加或温度升高而减小.在高简并条件下,硅纳米板的压阻系数与温度无关,完全由杂质浓度的大小控制;在非简并条件下,情况刚好相反.最后,利用施加应力前后空穴等能面形状的变化定性分析了硅纳米板压阻特性的起源. 相似文献
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Tensile and short term (24 h) creep tests were performed on Xydar G930, a liquid crystalline polymer (LCP) with 30 wt.% glass
filler, at temperatures and stress levels ranging from room temperature to 175°C and 0.3 fraction ultimate tensile strength
(UTS) to 0.8 fraction UTS, respectively. Temperature was found to have an affect on the short term tensile properties. The
resulting strain vs time creep curves showed the expected dependence of creep strain on temperature and stress level. Creep
compliance curves were derived from the creep curves and showed distinctively nonlinear viscoelastic behavior at all stress
levels and temperatures. Creep compliance was found to follow a power law in time. The power law was used to model the stress
dependence of creep and the Arrhenius equation was employed to model the temperature dependence up to 120°C. A significant
reduction in creep resistance was observed at 175°C. Time-temperature-stress-superposition was used to show that the material
followed power law behavior up to 1000 h. 相似文献
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An analytical stress model is developed to evaluate the elastic curve of a glass fiber whose coating has a constant (measured or imposed) bend radius. It is shown that in order to predict the bending behavior of a coated glass fiber subjected to bending a parameter u should be computed which depends, in addition to Young's modulus and diameter of the glass fiber itself, also on the length of the curved area and Young's modulus and outer diameter of the (primary) coating. In the range 0<u <2.365, the maximum curvature of the glass fiber occurs at the midpoint of the curved area. If the calculated u value is greater than (7π/4)=5.50, the curvature of the glass fiber in the midportion of the glass-coating composite is practically not different from the coating curvature. Within the range 2.365<u <5.50, the maximum curvature of the glass fiber is greater than the observed curvature of the coating 相似文献
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David Witkin 《Journal of Electronic Materials》2012,41(2):190-203
The creep behavior of Sn-3.0Ag-0.5Cu (SAC305), Sn-3.4Ag-1.0Cu-3.3Bi (SAC-Bi), and Sn-3.4Ag-4.8Bi (SnAg-Bi, all wt.%) was studied
in constant-stress creep tests from room temperature to 125°C. The alloys were tested in two microstructural conditions. As-cast
alloys had a composite eutectic-primary Sn structure, while in aged alloys the eutectic regions were replaced by a continuous
Sn matrix with coarsened intermetallic (Cu6Sn5 and Ag3Sn) particles. After aging, Bi in SAC-Bi and SnAg-Bi was found as precipitates at grain boundaries and grain interiors. The
creep resistance of of-cast SAC305 was higher than that of as-cast Bi-containing alloys, but after aging the SAC305 had the
lowest creep resistance. The creep strain rates in SAC-Bi and SnAg-Bi were much less affected by aging. The apparent activation
energy for creep was also changed more for SAC305 than for the other two alloys. The creep behavior of SAC-Bi and SnAg-Bi
can be understood by considering the solubility of Bi in Sn. The difference in creep behavior between as-cast and aged SAC-Bi
is greatly reduced when room-temperature test results are excluded from analysis. This suggests that the strongest influence
on creep in these alloys is due to Bi solute interaction with moving dislocations during deformation. 相似文献
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《Microelectronics Journal》2014,45(12):1726-1733
This paper elucidates the thermal behavior of an LED employing metal filled polymer matrix as thermal interface material (TIM) for an enhanced heat dissipation characteristic. Highly thermal conductive aluminum (Al) particles were incorporated in bisphenol A diglycidylether (DGEBA) epoxy matrix to study the effect of filler to polymer ratio on the thermal performance of high power LEDs. The curing behavior of DGEBA was studied by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA). The dispersion nature of the Al fillers in polymer matrix was verified with Field Emission Scanning Electron Microscope (FESEM). The thermal performance of synthesized Al filled polymer composite as TIM was tested with an LED employing thermal transient measurement technique. Comparing the filler to polymer ratio, the rise in junction temperature for 60 wt% Al filled composite was higher by 11.1 °C than 50 wt% Al filled composite at cured state. Observed also from the structure function analysis that the total thermal resistance was 10.96 K/W higher for 60 wt% Al filled composite compared to 50 wt% Al filled composite. On the other hand, a significant rise of 9.5 °C in the junction temperature between cured and uncured samples of 50 wt% Al filled polymer TIM was observed and hence the importance of curing process of metal filled polymer composite for effective heat dissipation is discussed extensively in this work. 相似文献
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F. Guo J. Lee J. P. Lucas K. N. Subramanian T. R. Bieler 《Journal of Electronic Materials》2001,30(9):1222-1227
The creep deformation behavior of eutectic Sn-3.5Ag based Ni particle rein forced composite solder joints was investigated.
The Ni particle reinforced composite solder was prepared by mechanically dispersing 15 vol.% of Ni particles into eutectic
Sn-3.5Ag solder paste. Static-loading creep tests were carried out on solder joint specimens at 25 C, 65 C, and 105 C, representing
homologous temperatures ranging from 0.6 to 0.78. A novel-design, miniature creep-testing frame was utilized in this study.
Various creep parameters such as the global and localized creep strain, steady-state creep rate, onset of tertiary creep and
the activation energy for creep were quantified by mapping the distorted laser ablation pattern imprinted on the solder joint
prior to testing. The Ni-reinforced composite solder joint showed improved creep resistance compared to the results previously
reported for eutectic Sn-3.5Ag solder, Sn-4.0Ag-0.5Cu solder alloys, and for eutectic Sn-3.5Ag solder reinforced with Cu or
Ag particle reinforcements. The activation energy for creep was ∼0.52 eV for Sn-3.5Ag and Sn-4Ag-0.5Cu solder alloys. The
activation energies ranged from 0.55–0.64 eV for Cu, Ag, and Ni reinforced composite solder joints, respectively. Most often,
creep fracture occurred closer to one side of the solder joint within the solder matrix. 相似文献
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针对变体飞行器变形机翼气动外形监测需求,提出一种植入式柔性复合蒙皮形状光纤传感方法。通过将光纤光栅传感器植入硅胶薄层,并与聚氯乙烯薄片组成复合蒙皮。建立柔性蒙皮形状传感系统,采用光纤传感解调系统,实验测得不同翼型下柔性蒙皮中光纤光栅反射谱特征及其变化规律;计算出柔性蒙皮弯曲曲率,并重建出柔性蒙皮变形三维形状;采用数字摄影测量系统完成对比测试。研究结果表明:柔性复合蒙皮变形光纤传感测量与数字摄影测试误差小于4.62%,光纤传感灵敏度达到245.5 pm/m-1。验证了植入式光纤传感方法的有效性,为变体飞行器变形机翼气动外形监测提供了参考。 相似文献
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In-line fiber etalon (ILFE) fiber-optic strain sensors 总被引:3,自引:0,他引:3
Sirkis J. Berkoff T.A. Jones R.T. Singh H. Kersey A.D. Friebele E.J. Putnam M.A. 《Lightwave Technology, Journal of》1995,13(7):1256-1263
This paper describes an optical fiber interferometer that uses a short segment of silica hollow-core fiber spliced between two sections of single-mode fiber to form a mechanically robust in-line optical cavity. The hollow-core fiber is specifically manufactured to have an outer diameter that is equal to the outer diameter of the single mode lead fibers, thereby combining the best qualities of existing intrinsic and extrinsic Fabry-Perot sensors. Uniaxial tension and pure bending strength tests are used to show that the new configuration does not diminish the axial strength of bare fiber and reduces the bending strength by 17% at most. Similar tests confirm that the fiber sensor has 1.96% strain to failure. Axisymmetric finite element analysis is used to investigate the reliability of the in-line etalon when it is embedded in a typical thermoset composite, and parametric studies are performed to determine the mechanically optimal cavity length. The fiber optic sensor is tested using low coherence interferometry with pseudo-heterodyne demodulation under strain and temperature fields. The strain response compares well with resistance strain gages, and the temperature tests confirm the low thermal apparent strain of this sensor 相似文献
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Composite-based resistance switching random access memory (ReRAM) has great potential for application in flexible and wearable electronics. However, its large operating parameters and low reliability still have some limitations in realizing practical applications, which is derived from its high dependence on the orientation and dispersion of the filler in the composite layer. Here, we proposed a novel composite system that does not depend heavily on the orientation or dispersion of the fillers within the composite film of the ReRAM device. The AgNW/TiO2 core-shell nanowires inducing superb resistance switching behavior were fabricated. The composite resistance switching (RS) film was prepared by mixing the one-dimensional core-shell particles and poly (vinyl alcohol) (PVA) dielectric matrix. The composite RS film exhibited remarkable resistance switching behavior with extremely low/uniform operating voltage (Vset ~ 0.13 ± 0.013 V, and Vreset ~ −0.10 ± 0.012 V), and the reliable switching behavior was maintained for up to ~200,000 mechanical deformation cycles under 3 mm of bending radius. To evaluate the resistance switching mechanism of the composite-type ReRAM, the structural analysis and device modeling were performed. 相似文献
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Myung-Jin Yim Kyung-Wook Paik 《Components and Packaging Technologies, IEEE Transactions on》2001,24(1):24-32
We investigated the effect of nonconducting fillers on the thermomechanical properties of modified anisotropic conductive adhesive (ACA) composite materials and the reliability of flip chip assembly on organic substrates using modified ACA composite materials. For the characterization of modified ACAs composites with different content of nonconducting fillers, dynamic scanning calorimetry (DSC), thermogravimetric analysis (TGA), dynamic mechanical analysis (DMA), and thermomechanical analysis (TMA) were utilized. As the nonconducting filler content increased, CTE values decreased and storage modulus at room temperature increased. In addition, the increase in the content of filler brought about the increase of Tg(DSC) and Tg(TMA). However, the TGA behaviors stayed almost the same. Contact resistance changes were measured during reliability tests such as thermal cycling, high humidity and temperature, and high temperature at dry condition. The reliability results were significantly influenced by CTEs of ACA materials, especially at the thermal cycling tests. Results showed that flip chip assembly using modified ACA composites with lower coefficients of thermal expansion (CTEs) and higher modulus by loading nonconducting fillers exhibited better contact resistance behavior than conventional ACAs without nonconducting fillers 相似文献