基于空时分组码及空频分组码的OFDM系统性能分析

讨论了正交频分复用系统中空时分组码与空频分组码的基本原理,并对信道条件为快变或慢变的多径信道下的两种系统误码性能进行分析与比较,指出在慢变信道条件下采用空时分组码的系统可取得较空频分组码系统更佳的性能。     

基于空时分组码的MIMO-OFDM系统性能研究与分析

首先根据空时分组码的编码原理,给出MIMO-OFDM系统中空时分组码编译码方案及系统模型,然后重点对加入空时分组码的MIMO-OFDM系统性能进行研究与Matlab仿真.对收发端采用不同天线数时的误码性能进行仿真与分析,同时,对采用QPSK,8PSK与16QAM调制方式的误码性能进行仿真与分析,并给出仿真曲线图.     

Rician衰落信道下空时分组码的性能分析

基于Alamouti提出的BPSK调制下空时分组码在Rayleigh衰落信道中的码性能原理,推导出高阶(M ary)调制下Rician衰落信道中空时分组码的符号差错率的最小距离球界,并进行计算机仿真分析了两信道下引入空时分组码的多天线系统中发射和接收天线的分集增益,发射天线数量的“地板效应”以及Rician因子K对符号差错性能的影响。     

无线通信中的空时编码技术

空时编码技术是抗信道衰落和提高系统容量的一种最新编码方法，这里简介了三种典型空时码：分层空时码、空时格型码和空时分组码，比较了它们的优缺点，并分析了下一代通信中空时编码的发展方向。     

基于MIMO系统的准正交空时分组码的容量分析

应用于MIMO系统的准正交空时分组码可以获得较大的容量,同时能够提供较低的误码率。文中比较了MIMO系统的准正交空时分组码的容量与SIMO系统的容量。结果显示,在低SNR和接收天线数少的情况下,应用于MIMO系统的准正交空时分组码会产生较大的容量增益,但随着SNR和天线数目的增加,容量增益越来越不明显。另外,文中比较了MIMO系统中准正交空时分组码和正交空时分组码的容量,仿真结果表明前者的容量明显高于后者。     

MIMO系统中空时分组编码仿真实现

空时分组码是一种结合信道编码和分集技术的新型的编码和信号处理方法。它可以不需增加带宽,大幅度的提高无线通信系统的信息容量和传输速率,从而提供远高于传统单天线系统的频带利用率。采用广义平稳非相关散射下的多径时变瑞利信道模型,对多输入多输出（MIMO）系统中空时分组编码进行了仿真研究。仿真结果表明：MIMO系统中正交空时分组编码在误码率性能上优于Alamouti编码。     

信号检测、噪声分析、信号干扰、均衡与补偿

0600871 基于MIMO的信号检测技术在宽带数据链中的应用 [刊,中]／李祥／／海军工程大学学报．-2005,17(5)．- 104-108(G) 分析了多输入多输出系统中空分复用和空时分组码的解码算法,提出了一种空分复用和空时分组码相结合的方案,探讨了这种方案的解码算法并对该算法进行了仿真验证。结果表明,这种方案的BER性能在高信噪比时要好于其它方案,因而可以应用到需要高传输速率以及高链路可靠性的宽带数据链中。参13     

空时分组码与线性分组码相结合的

空时分组码能够实现MIMO系统的完全发射分集,但不能实现任何的编码增益.对此,提出了线性分组码与空时分组码级联的MIMO系统,该系统能够同时实现完全发射分集和编码增益.仿真结果表明,在比特误码率为10-5时,与未进行前向纠错的空时分组码系统相比,该系统能提供了大约2.7dB的编码增益.     

一种准正交空时分组码的单符号解码算法

文章提出了一种能减少解码端复杂度的新的解码方案。首先介绍了空时分组码的系统模型,然后介绍准正交空时分组码的系统模型和新的单符号解码算法,模拟仿真结果表明,该方案是一种简单有效的准正交空时分组码的解码方案。     

空时分组码与线性分组码相结合的MIMO系统

空时分组码能够实现MIMO系统的完全发射分集，但不能实现任何的编码增益。对此，提出了线性分组码与空时分组码级联的MIMO系统，该系统能够同时实现完全发射分集和编码增益。仿真结果表明，在比特误码率为10^-5时，与未进行前向纠错的空时分组码系统相比，该系统能提供了大约2．7dB的编码增益。     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.