基于ADS1293的便携式低功耗心电信号采集系统

为实现对人体心电信号的实时采集,设计了一种基于ADS1293的心电信号采集系统,系统主要由ADS1293 信号采集前端和MSP430单片机控制电路组成。ADS1293对心电信号进行24位的高精度模/数转换,由SPI接口方式发送给MSP430进行分析处理,最终通过MSP430的USB接口发送到便携式显示设备实时显示波形。该系统为便携式、低功耗的心电信号采集系统提供了技术支持,具有广泛的应用前景。     

基于MSP430单片机的超低功耗温度采集系统设计

针对工业生产过程中常需对温度进行实时监控的需求,本文介绍了一种便携式超低功耗的温度采集与实时显示的温度采集系统。为了使温度采集系统功耗达到最低,本设计选用了TI公司的超低功耗MSP430FG4618单片机作为主控芯片,并对整个系统进行了有效的电源管理,最后采用FYD12864C-1液晶显示器将采集到的温度实时显示出来。...     

基于MSP430嵌入式温度采集器的实现方案

本文介绍了一种基于MSP430的嵌入式温度采集器实现方案。本采集器利用MSP430F133内置的ADC,实现DTMF信号的实时解码,利用DS18B20这个1-WIRE系统传感器采集温度,实现了温度采集和数据传输。     

温度自动控制系统设计

基于MSP430系统平台,利用PID控制算法搭建了一个温度自动控制系统。系统包括温度采集、PID算法功率控制、人机交互等模块。系统采用数字式温度传感器精确测量温度值,430单片机用来实现PID算法及温度设定与显示等;双向可控硅光电耦合器用于调节功率。能实时监测温度值,测量温度范围广、分辨率高,调节温度迅速,控制温度实时精准、波动小,温度值显示准确稳定。     

基于MSP430与uPD720200的高速温度采集系统的设计

文章研究与设计了一套基于MSP430和u PD720200的USB3.0高速温度采集系统。此系统采用ADS7886为A/D转换芯片,高速MSP430单片机为主控CPU,u PD720200为USB3.0主机接口芯片,能实现高速实时温度数据采集。     

基于MSP430单片机的多路无线温度检测系统

设计了基于MSP430的多点无线温度检测系统。系统采用低功耗的MSP430F149单片机作为核心控制部件,硬件由无线通信模块、温度采集电路、显示模块和串口通信模块组成,软件采用模块化的设计方法。测试表明,整个系统都是在超低功耗的要求下进行元件及运行方式的选择,各个基站只需要3V电池供电就能实现长时间运作,能很好地实现超低功耗,并且实现了测量温度的实时性。     

基于MSP430单片机的数据采集系统

介绍了一种用TI公司新一代16位单片机MSP430系列的MSP430F169设计的实时数据采集系统。MSP430系列是TI公司推出的超低功耗混合信号微控制器,这些微控制器可用电池供电并长期工作。利用单片机内部自带的12位AD和DMA进行数据的采集和传输,并通过液晶显示模块将采集的数据以波形方式直观地显示。该系统具有硬件电路简单、采集精度较高、界面友好等优点。     

TMP275在手持式实时测温仪中的应用

设计一种基于TMP275的手持实时测温仪,采用TI公司的低功耗单片机MSP430F149作为主控芯片,该系统采用I^2C总线协议数字温度传感器TMP275对现场温度进行采集,通过低功耗液晶模块进行实时温度显示,该系统具有采集数据准确、抗干扰能力强、功耗低的特点,非常适合于对现场环境温度进行测量与采集。     

基于GPRS通信技术的热网红外测温系统设计

针对城市热网实时监测困难,便捷高效、远程温度监测设备短缺等突出问题,将远程通信及红外测温技术应用于热网温度监测中,设计了一种基于GPRS通信技术的热网红外测温系统。以MLX90614红外测温传感器获取热网观测点的温度信息并传输至低功耗单片机MSP430F169做解码处理,采用GPRS通信模块SIM900A,将解码数据发送至固定管理平台或移动管理终端,实现对监测点的远程监测,多点布控可实现多点监测。同时,每个监测终端可实时显示测温结果,便于现场观测与维护。测试实验表明,该系统温度信息采集准确、数据传输稳定,可满足目前城市热网实时远程监测的需求。     

基于MSP430的温湿度监控系统分析

基于实时监测环境温湿度的需求,本文提出了基于MSP430单片机的温湿度监测系统的设计方案,系统以MSP430单片机为核心,采用温湿度传感器SHT11芯片,对温湿度监测系统的软硬件进行设计。该系统具有温湿度采集和实时显示及超过设置上、下限温湿度自动报警等功能。实验结果表明,该系统具有成本低、环境采集误差小,可提高作业效率等优点,具有广阔的应用前景。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.