Video For Windows中视频数据流的使用

一、Video For Windows开发包的体系结构 Video For Windows(以下简称为VFW)是Microsoft推出的PC机视频标准,它以两种方式(AVI文件方式和数据流方式)提供视频服务。对单机上的大多数应用来说,使用AVI文件方式足以满足对视频的要求。但是,如果想在网络环境下实现实时视频服务,则采用数据流方式才是最好的选择。数据流方式比AVI文件方式要灵活,但编程复杂,所以绝大多数专业书籍中对此均避而不谈。我们通过反复编程实践,终于实现了视频数据流在局域网上的传输和实时回放,现将我们的体会奉献给大家,仅供参考。     

AⅥ文件格式探秘

本文揭示了AVI文件结构的奥秘,从编程的角度强 调了读取AVI文件应注意的关键之处,并用一实例程序 演示了DOS下的用法。 随着多媒体技术的广泛应用,各种格式的多媒体 数据文件不断出现在流行软件中,AVI文件就是其中有 代表性的一种。比起Windows中其它的资源性数据文件 来,AVI文件的结构要复杂许多。在Windows下,借助     

基于MPEG-4的视频监控系统中视频流的存储算法

研究了在数字视频监控系统中,将采集到并压缩为MPEG-4格式的视频流,通过网络保存为正确可回放文件的方法.在介绍MPEG-4标准和AVI的文件格式有关理论的基础上,分析了多路采集以及网络上有掉包的情况,提出了相应的解决办法,并给出了将MPEG-4流存储为AVI格式文件存储算法的实现步骤.     

视频文件格式及转换

一.视频文件的格式 1.AVI格式 它是微软公司推出的视频格式,应用相当广泛。AVI格式的视频文件是由视频和音频两部分组成的,都没有经过压缩处理。因此,它的图像和声音的质量都很好,但文件较大。Windows95以上版本的媒体播放器和MicrisiftVideo for Windows软件可以播放AVI格式的视频文件。     

数字视频编辑Premiere入门

多媒体电脑,可以对声音、视频等进行数字化处理,使之可以像文本一样方便地进行编辑。Adobe Premiere是一个功能很强的数字视频编辑软件。它提供了多种动态的滤镜、视频源特技切换效果等重要手段,实现了视频的非线性编辑。视频信号采集成后缀为.AVI格式的文件,可以被Premiere编辑,然后生成新的.AVI文件。.AVI文件可以被Windows媒体播放器播放,以及被其他应用程序调用。     

芯片粘接实验中复杂图形的实现--G代码的实现及AutoCAD控制

介绍了利用VisualC++6.0为开发工具,实现Windows编程。对于由AutoCAD生成的DXF文件进行代码转换,最终自动生成芯片粘接中特定图形绘制程序的方法。     

Authorware问答(一)

问:AVI文件在最终脱离开发环境时应注意哪些问题? 答:在脱离开发环境时,对于AVI应该注意以下问题: 1.动画文件播放驱动程序 如果使用A3.5,则要将a3vfw.xmo文件与播放器文件runa3w16.exe放置在同一目录下;如果播放器使用32位的runa3w32.exe,则与之相应使用a3vfw32.xmo。 如果使用A3.0,则要将a3vfw.xmo文件与runa3w.exe放置在同一目录下。 如果使用Star2.0,则要将apdgv.vdr文件与asc.exe放置在同一目录下。 2.AVI路径问题 如果将全部的AVI文件与播     

视频文件格式研究（三）

由于AVI文件结构不仅解决了音频和视频的同步问题．而且具有通用和开放的特点。它可以在任何Windows环境下工作，而且还具有扩展环境的功能。用户可以开发自己的AVI视频文件，在Windows环境下可随时调用。现在，AVI已成为PC机上最常用的视频数据格式．并且还成为了一个基本标准。普及应用方面，数码录像机(DV)、视频捕捉卡等都已经支持直接生成AVI文件。     

Windows环境下动态链接库(DLL)程序设计

介绍了在Windows平台下动态链接库的工作机制，详细讨论了使用动态链接库的编程方法，并给出了一个DLL主函数的例子。     

探索分析Linux系统下的文件和时间编程

Linux与UNIX系统十分相似,是性能稳定的多用户网络操作系统。随着计算机技术的快速发展,Linux系统也在不断完善和发展。它的虚拟文件系统能够同时为多种文件提供服务,文件编程主要依靠系统调用和C库函数来完成,时间编程也是系统常用的编程方式。本文将介绍Linux系统的特点,重点分析文件编程和时间编程。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.