球面像差的容限--一种工艺窗口的实验性研究

球面像差能破坏光刻的成像质量。它不仅影响工艺窗口, 即, 曝光容裕度和焦深( DOF ),而且也降低了掩模误差因子( MEF ), 这能导致附加的掩模费用。尽管最近已经报道了一些系统的测量方法, 但这种像差的程度到实际实验工艺窗口的降级之间的关系尚无清楚的文献证明。在此, 将首先提出一种简单的用规则的铬栅格图形测量球面像差的方法。我们也将根据两台深紫外扫描光刻机提出球面像差和工艺窗口的数据。业已发现有些扫描光刻机的峰值波前误差可达0.1个波型。均方根( rms)波前误差数据与测量到的工艺窗口降级和掩模误差因子对于关键接触孔和多层栅有很好的联系。     

面向高性能的红外折射式镜头装调技术

针对红外光学材料折射率不均匀导致系统波前产生异常像差,从而引起镜头像质严重下降的问题,提出了一种光学件位置迭代调整和面形修配相结合的系统波前补偿方法,实现面向高性能的红外折射式镜头装调。在光学件精密定心的基础上,设计了在线装调检测装置,依据镜头实测波前并结合计算机辅助装调技术,通过迭代调整光学件位置矫正系统波前初阶像差。对系统残留的中高阶像差,根据各视场测得的系统波前综合分析计算,采用修配光瞳处光学件面形,引入反残留波像差的方式补偿。实验上,通过对某红外折射式镜头装调,将镜头三个视场系统波前RMS (λ=3.39μm)分别由精密定心后的0.162λ、0.118λ、0.166λ降低至0.064λ、0.040λ、0.067λ,平均MTF (@25 lp/mm)由0.31提升至0.67。结果表明,这种装调技术对红外折射式镜头系统波前补偿效果明显,可大幅提升镜头成像性能,具有重要的工程应用价值。     

长焦透镜焦距及透射波前检测

提出了在球面光路中利用凹球面反射镜同时测量长焦透镜焦距和透射波前的干涉检测方法,分析了该检测方法的误差以及测量误差和调整误差对检测结果的影响,确定了在检测过程中所需控制的相对敏感自由度。结果表明,该检测方法可对F/#≥50的透镜进行检测,其焦距计算相对误差为0.2%,透射波前P-V值可达1/25λ。     

基于自准直原理的小视场镜头波像差测试系统

为实现对小视场光学镜头波像差的快速、高精度检测,将自准直原理与斐索型激光球面干涉仪检测波像差原理结合起来,提出一种基于自准直原理的光学镜头波像差检测系统。介绍了斐索型激光球面干涉仪检测波像差的工作原理,并详细论述了基于自准直原理的波像差检测系统的装调及检测方法。结合自准直光路的特点,实现对干涉仪光轴、被测光学镜头光轴以及高精度平面反射镜光轴的精确定轴,从而实现了系统光路的快速装调。实验证明,此系统可有效解决小视场光学镜头在波像差检测过程中的光轴偏斜问题,实现小视场光学镜头波像差快速、准确的检测。     

MEMS微变形反射镜校正波前静态畸变实验

微变形反射镜(MEMS-DMs)是用于自适应光学中波前校正的重要元件.对微变形镜波前校正原理进行了分析,设计了基于自适应光学系统的测试系统,通过闭环控制技术成功地利用一种分离式MEMS-DMs校正了实验系统中位相板引入的波前畸变,实验结果显示离焦项Zernike系数相对最大,是造成整个波面畸变的最重要的原因.MEMS-DMs对低阶波前畸变校正较好,高阶波前畸变校正时残余误差比较大,增加控制电极数量可以更好地校正高阶模式的波前畸变.基于自适应光学系统的MEMS-DMs波前畸变校正实验系统,可以为今后全面优化设计微变形反射镜及其更适应自适应光学系统的需要提供实验数据与理论支持.     

具有主观视觉补偿的人眼像差测量方法

为了准确测量人眼的各种低阶像差以及不规则的高阶像差,采用具有主观视觉补偿的人眼波前像差测量方法,进行了理论分析及实验验证,在客观测量的同时进行了主观视觉补偿,得出了测量的准确数据。结果表明,主观视觉补偿测量的波前像差小于客观测量的结果,被测者在观察视标时的适应性调整减小了波前像差,并且对于观察不同的视标时,波前像差的波动值较小。采用主观视觉补偿的测量方法,考虑实际观察目标时眼睛的状态,能够很好地对人眼像差进行补偿,得到符合实际状态的眼像差,这对制定人眼像差的治疗方案是非常有帮助的。     

球面绝对检测方法的误差影响分析及实验研究

球面绝对检测方法可以去除参考面面形误差的影响,从而提高了被检面的检测精度。在此高精度的检测中,被检面机构调整误差和环境扰动误差是影响检测结果的两个主要因素。将机构调整误差理解成一种特殊的面形误差,通过这一思路分析了该误差对最终检测结果的影响。为了提高检测精度,根据高阶离焦模型去除了调整误差中的离焦误差,并且设计了一种简易有效的旋转角度控制机构用来控制旋转错位误差。将环境扰动误差看作是随机误差,分析了该误差对三步检测每一步的影响,并采用多次测量取平均的办法减小其影响。基于Zygo干涉仪,使用六自由度高精度调整机构对精度优于λ/40的被检球面进行了绝对检测。绝对检测三步法测得的被检面面形误差的评价值小于单步法的测得结果对应的评价值,各评价值置信概率为0.99的置信区间长度很小,说明采用文中的装置和数据处理方法能实现绝对检测的高重复性和有效性。     

全息校正望远镜主镜像差的实验研究

在全息技术校正望远镜主镜像差原理的基础上,采用平行光记录和平行光再现的方法,建立了口径200mm．玻璃基底球面反射镩像差校正的实验装置,进行全息校正实验研究。通过测量像差校正前反射镜面形误差、记录接正厉再现参考光束：与厦叁壹粪枣干涉图、比较像差校正前后光学系统焦点尺寸大小以及分辨率板成像结果,实验验证了全息技术校正望远...     

小F数标准球波面透镜组的F''C重合误差分析

标准球波面透镜组是光干涉计量测试凸、凹球面面形质量的重要测量器具,它能产生p-V值优于λ/20(λ=0.6328μm)的标准球面波,透镜组中末球面为标准球面.其使用特点要求透镜组的焦点F'与末面球心C重合;如果存在重合误差,则用于球面面形检验时会引入测量系统误差.推导分析了F'C的允许重合误差与透镜组F数等参量的关系,运用ZEMAX光学设计软件模拟给出系列小F数标准球波面透镜组允许的F'C重合误差,并设计实验测试方案,得到反映标准球波面透镜组F'C重合误差的干涉图,它们的波像差均小于5λ.由理论分析与实验测试结果可知,F数很小(如F/1.5,F/0.75)的标准球面透镜组,F'C重合误差小于0.03 mm,甚至达到微米量级.     

基于液晶空间光调制器的相位差波前探测技术定量研究

为了定量研究相位差波前探测技术(phase diversity technique,PD)对波前探测和图像重建的精度,本文分别进行了数值模拟以及相关实验。数值模拟中采用了均方根(root-mean-square,RMS)分别为0.1λ~0.5λ的五组随机畸变波前,获得其退化的焦面图像和相应的离焦图像信息,利用PD技术对其进行波前探测和图像重建,波前探测的残余误差RMS值均达到了10~(-5)λ水平,重建图像在分辨率和对比度上有明显提升。搭建了基于液晶空间光调制器的实验系统,利用液晶空间光调制器来定量施加随机的波前像差,可以有效解决湍流屏数据难以量化的问题。同样将PD技术应用于本实验所采集到的退化焦面图像和相应离焦图像,对于RMS值为0.306λ的随机波前像差,探测波前的残余误差为0.091λ,图像重建结果与模拟结果高度一致,本文列举并分析了可能造成实验误差的多种因素,同时为该技术应用于液晶系统积累了技术基础。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.