高密度排列大功率垂直腔面发射激光器列阵

报道了980nm高密度排列大功率垂直腔面发射激光器列阵的研制.列阵单元为蜂窝状密堆积排列,单元台面直径为70μm,氧化孔径为30μm,相邻单元间隔为100μm.制作了含7,19,37个单元的列阵,讨论了它们的阈值电流和远场特性.在室温连续工作条件下,3种列阵的最大输出功率分别为0.26,0.5和0.6W.其中含37个单元的列阵在6A脉冲电流(脉宽30μs,重复频率100Hz)激发下,输出功率达到1.4W.     

出纤功率30W的激光二极管线列阵光纤耦合器件

用一根柱透镜对大功率半导体激光器线列阵输出光束的快轴方向进行准直,准直后的光束耦合到光纤列阵中.大功率半导体激光二极管线列阵的输出功率为40W,线列阵有19个发光单元,每个发光单元的发光区面积为100μm×1μm.大功率激光二极管线列阵耦合后出纤功率为30W,耦合效率为75%,光纤的数值孔径为0.11.     

980nm大功率垂直腔底发射激光器

报道980nm大功率底发射垂直腔面发射激光器的结构、研制及器件的阈值电流、输出功率和光谱特性．在室温(24℃)下，5A连续电流工作时，出光孔径400μm的器件激射波长为984．1nm，输出功率达到1．42W，是目前所能见到报道中最高的．研究了出光孔径600μm的器件在连续工作时，激射波长、光谱半高宽随注入电流的变化以及在重复频率100Hz，脉冲宽度50—1000μs条件下的输出功率、效率与注入电流的关系．     

出纤功率30W的激光二极管线列阵光纤耦合器件

用一根柱透镜对大功率半导体激光器线列阵输出光束的快轴方向进行准直 ,准直后的光束耦合到光纤列阵中 .大功率半导体激光二极管线列阵的输出功率为 4 0 W,线列阵有 19个发光单元 ,每个发光单元的发光区面积为10 0μm× 1μm .大功率激光二极管线列阵耦合后出纤功率为 30 W,耦合效率为 75 % ,光纤的数值孔径为 0 .11     

高光束质量新型垂直腔面发射激光器阵列

报道了一种具有新型排列方式的垂直腔面发射半导体激光器(VCSEL)阵列.通过调制阵列中各单元直径以及单元间距,得到1 kW/cm2的高功率密度和高斯远场分布,且在工作电流0～6 A内远场发散角均小于20°.阵列山直径分别为200 μm,150 μm和100 μm成中心对称分布的5个单元组成,单元圆心间距分别为250μm和200μm.在室温连续工作条件下.阵列在注入电流4 A时达最大输出功率880 mw,斜率效率为0.3 W/A,具有0.56 A的低阈值电流,微分电阻0.09 Ω.与具有相同出光面积的4×4二维阵列相比,这种新型阵列在出光功率、阈值电流、光谱特性及远场分布等方面均具有优越性.模拟了阵列各单元叠加后的近场远场光强分布,结果表明得到的新型阵列的远场分布与实验结果吻合较好.     

910 nm高峰值功率垂直腔面发射激光光源

报道了910 nm高峰值功率垂直腔面发射半导体激光器列阵(Vertical Cavity Surface Emitting Laser,VCSEL)的设计方法及测试结果.所制备的910 nm VCSEL列阵在准连续工作时激光功率达到2 W;在重复频率10 kHz,脉冲宽度30 ns,工作电流60 A的电脉冲驱动条件下,VCSEL列阵峰值输出功率达到25.5 W.随着工作电流的增加,VCSEL列阵输出的激光光谱呈现明显办展宽现象,证实VCSEL列阵即使在窄脉冲工作时大的电流驱动仍然会产生严重的内部热效应;VCSEL列阵输出激光的光脉冲波形在驱动电流增大至60 A时脉宽仅展宽了6 ns左右,证实VCSEL阵列具有非常优越的脉冲响应特性.对VCSEL列阵进行光束准直处理后,在1 m距离处得到了近圆形的均匀光斑.我们相信这种高功率的910 nm面阵光源在未来汽车光探测测距(LiDAR)等智能驾驶领域具有很大的应用潜力.     

高功率半导体激光器列阵光纤耦合模块

根据大功率半导体激光二极管列阵与光纤列阵耦合方式, 分别从理论和实验两方面讨论、分析了大功率半导体激光二极管列阵与微球透镜光纤列阵耦合。将19 根芯径均为200 μm 的光纤的端面分别熔融拉锥成具有相同直径的微球透镜, 利用V 形槽精密排列, 排列周期等于激光二极管列阵各发光单元的周期。将微球透镜光纤列阵直接对准半导体激光二极管列阵的19 个发光单元, 精密调节两者之间的距离, 使耦合输出功率达到最大。半导体激光二极管列阵与微球透镜光纤列阵直接耦合后, 不仅从各个方向同时压缩了激光束的发散角, 有效地实现了对激光束的整形、压缩, 而且实现30 W 的高输出功率, 最大耦合效率大于80%, 光纤的数值孔径为0.16。     

980 nm高峰值功率微型化VCSEL脉冲激光光源

报道了输出波长980 nm的高峰值功率垂直腔面发射激光器(VCSEL)及其微型化脉冲激光光源.通过优化VCSEL单元器件的结构,有效抑制了宽面VCSEL结构中的非均匀电流分布,提高了单元器件的斜率效率,获得了直径400μm,峰值输出功率62 W的VCSEL单元器件;在此基础上,研制出由单元器件组合封装而成的VCSEL"准列阵"子模块以及集成驱动电路的微型化VCSEL脉冲激光光源,该光源在脉冲驱动条件为30 ns、2 k Hz、105 A条件下的峰值输出功率达到226 W,光脉冲宽度35 ns,中心波长979.4nm,斜率效率达到2.15 W/A.     

高功率半导体激光器列阵光纤耦合模块

根据大功率半导体激光二极管列阵与光纤列阵耦舍方式。分别从理论和实验两方面讨论、分析了大功率半导体激光二极管列阵与微球透镜光纤列阵耦舍。将19根芯径均为200μm的光纤的端面分别熔融拉锥成具有相同直径的微球透镜，利用V形槽精密排列，排列周期等于激光二极管列阵各发光单元的周期。将微球透镜光纤列阵直接对准半导体激光二极管列阵的19个发光单元，精密调节两者之间的距离．使耦合输出功率达到最大。半导体激光二极管列阵与微球透镜光纤列阵直接耦合后，不仅从各个方向同时压缩了激光束的发散角，有效地实现了对激光束的整形、压缩，而且实现30w的高输出功率，最大耦舍效率大于80％，光纤的数值孔径为0．16。     

高光束质量大功率垂直腔面发射激光

大功率垂直腔面发射激光器(VCSEL)在激光泵浦、激光测距、激光雷达等领域有广泛的应用前景,但目前的常规激光器材料结构尚未针对大功率激光输出进行优化设计。特别是为获得大功率激光输出所采用的大出光窗口导致的激光光束质量劣化成为限制其应用发展的核心问题之一。针对上述问题对激光器材料结构与器件结构进行了两方面的新结构设计和研制:(1)以实现大功率激光输出为目标,材料结构设计上对出光窗口一侧的N-DBR反射率进行了调整,以具有99.3%反射率的n-DBR替代常规结构中所采用的99.7%以上反射率。与常规材料结构相比,采用优化后的材料结构制备的直径500μm出光孔径的单管器件在注入电流110 A时激光输出功率达到102 W,而单元出光窗口直径100μm的5×5阵列在100 A电流下的激光输出功率为103 W,单元直径为140μm的8×8阵列在130 A注入电流下的激光输出功率达到115 W;(2)针对大出光窗口导致的光束质量劣化,通过湿法化学刻蚀研制了直接集成在出光窗口表面的微透镜结构,单元出光窗口直径为90μm的6×6阵列器件在4 A注入电流下的激光光束发散角压缩到6.6°,与未集成微透镜时的14.8°相比有了大幅改善。实验结果表明:降低n-DBR反射率及集成微透镜结构有效地改善提高了大功率垂直腔面发射激光的输出功率和激光光束质量。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.