基于层次分析法的典型切削润滑冷却技术探究

为提高机床加过过程中的能效,降低切削液对环境的影响,本文从机床加工能耗、润滑、冷却、废物排放、成本等方面对三种典型切削润滑冷却技术(浇注式切屑、MQL切削、干切屑)进行分析探究。再利用模糊层次分析法进行综合性的分析,确定各指标的权重,判断三种切削润滑冷却技术对能耗、废物排放、切削效果以及加工成本方面的影响,构建指标体系,科学的选出最优方案。     

基于层次分析的电力通信网风险评估机制

随着智能电网的快速发展,电力系统呈现众多子系统间协同通信日益频繁的特点.由于潜在风险直接威胁着电力通信的运行,因此,为了评估电力通信网的潜在风险,提出了基于层次分析的电力通信网风险评估机制.首先,根据风险评估的对象和目标,明确了各要素间的逻辑关系,并分析出风险评估的两个关键环节:建立指标体系和评估模型.其次,给出了指标的构建原则和指标筛选方法,在分析了网络运行环境、运维方式和统计报表等因素的基础上,建立了评估指标体系.最后,基于层次分析法提出指标重要度量化方法,对指标的评估矩阵进行了一致性校验,以确保其计算结果的科学性.     

基于改进熵权模糊层次分析法的输电线缆质量评价模型

针对输电线缆制造质量评价问题基于改进熵权模糊层次分析法提出其质量评价模型。首先以材料质量,生产工艺以及监控验收作为准则层指标构建质量评价指标体系,通过相关性分析在选取的指标层因素中剔除重复指标;接着对指标层数据进行预处理转化为满意度指标,采用专家打分法确定模糊评价矩阵并通过求解最大特征向量得到初始指标权重,同时对特征值进行一致性检验;然后分别在准则层计及权重信息熵以及在指标层计及数据信息熵对指标权重进行改进;最后通过对某地区输电线缆制造生产线数据采用所建立的模型进行评价,得到评价结果并进行检验,验证了本文模型的正确性和有效性。     

基于改进型模糊层次法的维修性综合评估研究

分析了影响维修性的各种因素,建立了评估指标体系,利用改进型的层次分析法而计算得到指标权重;最后运用模糊综合评估的方法来建立某装备的评估模型,并给出实例,结果验证了该模型的合理性和有效性。     

基于ANP的物联网产业发展指标评价探究

从技术创新扩散能力、环境支撑能力两个方面,构建物联网产业发展指标体系;考虑到指标间的相互依赖性及反馈性,提出了基于网络层次分析法的物联网产业发展指标体系,为今后我国物联网产业发展水平评价提供科学的指标体系,研究结果表明本模型评估结果较传统层次分析法更具可信度。     

基于层次分析法的精明增长成功率指标体系构建研究

探索城市增长的驱动机制并预测其未来变化,对于解决城市化问题,实现城市智能增长具有十分重要的意义.根据精明增长的十个原则和3E制定出衡量精明增长成功率的指标体系.在构建指标体系的过程中,我们以层次分析法为主要模型.本文中,将精明增长成功率作为目标层,在以城市发展的5个主要决定因素为母准则层,以选择的某一城市为方案层.我们根据给定的判断矩阵计算出相对应准则的权重.经一致性检验,得出较高的一致性.     

基于用户需求的日盲紫外探测器评价指标体系

通过对日盲型紫外探测器光电性能及其技术平台的分析,提出了一种包括三个层次的日盲型紫外探测器的评价指标体系.采用层次分析法对各项评价指标进行了研究,确定了三个层次的主要评价指标及权重系数,结果表明采用该评价指标体系可以系统、准确地评价日盲紫外类探测器的光电性能、产品技术平台的能力.     

专用CDMA分组数据平台应用效能评估

根据专用CDMA分组数据平台的特点,科学有效的构建了平台应用效能指标体系,采用层次分析法与熵值法相结合的方法确定指标权重,运用灰色聚类分析法,构建了确切有效的平台应用效能评估模型。     

专用CDMA分组数据平台应用效能评估

根据专用CDMA分组数据平台的特点,科学有效地构建了平台应用效能指标体系,采用层次分析法与熵值法相结合的方法确定指标权重,运用灰色聚类分析法,构建了确切有效的平台应用效能评估模型。     

全业务环境下中国移动省级传输项目后评估指标体系研究

文章结合实际调研结果，首先介绍全业务环境下中国移动省级传输项目分类，之后对业内已有传输项目后评估指标进行筛选、补充和完善，最后根据两大类传输项目的不同特点建立了各自的项目后评估指标体系，并在确定指标体系中的评估层、分析层各指标权重的过程中引入了层次分析法。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.