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低频电噪声是表征电子器件质量和可靠性的敏感参数,通过测试低频噪声,可以快速、无损地实现光耦器件的可靠性评估。通过开展可靠性老化对光电耦合器低频噪声特性影响的试验研究,提出基于低频段宽频带噪声参数的光电耦合器可靠性筛选方法,并将可靠性筛选结果与点频噪声筛选方法结果进行对比分析。结果表明,与点频噪声参数等现有方法相比,宽频带噪声参数可以更灵敏和准确地表征器件可靠性,同时计算简便,基于宽频带噪声参数的光电耦合器可靠性筛选方法可以实现更为准确合理的可靠性分类筛选。 相似文献
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为进一步提高太阳能电池可靠性筛选的准确性,改进以往1/f噪声筛选方法存在的分析频率单一、偶然因素大和抗干扰能力差等弊端,提出了一种利用整个低频段(0.25~10kHz)噪声进行可靠性筛选的方法———基于Gower相似系数的可靠性筛选方法。利用建立的低频噪声测试系统,测量同一批次130片太阳能电池噪声功率谱并按照本方法将这130片太阳能电池分为Ⅰ(可靠性最高)、Ⅱ、Ⅲ(可靠性最低)3类。将本方法测量结果和原有1/f噪声筛选方法结果进行对比,通过4片典型太阳能电池样本说明了本方法更为准确合理。实验结果表明,对相同的130片太阳能电池,1/f噪声筛选方法分类结果为:Ⅰ类44片,Ⅱ类50片,Ⅲ类36片;本方法分类结果为:Ⅰ类的有34片,Ⅱ类42片,Ⅲ类54片。相对于1/f噪声筛选方法,表明本方法提高了太阳能电池可靠性筛选的准确性,适用于对可靠性要求高的应用领域。 相似文献
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基于虚拟仪器的低频噪声自动测试系统设计 总被引:1,自引:0,他引:1
电子器件的低频噪声是表征其工作可靠性的敏感参数,基于虚拟仪器组建了一套低频噪声测试系统,由双通道低噪声前置放大器、PXI-4472数据采集卡和PC机构成.介绍了系统功能框图和软件设计,不仅能够测量光电耦合器的噪声功率谱,而且还能显示时域波形,并完成时域分析.运用LabVIEW软件对噪声进行快速准确的检测和分析,通过小波分析剔除爆裂噪声,自动完成测试数据存储、打印等功能,并给出了低频噪声功率谱测量结果和时域波形,为电子器件的可靠性诊断和筛选提供必要的依据. 相似文献
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基于电子元器件低频噪声特性测试中,针对影响低频噪声测量系统准确性的因素,提出了一种改进型的低频噪声测量方法,优化设计电子元器件低频电噪声测试系统,放大噪声测试部分噪声,并可以分析电子元器件低频噪声测试过程中的低频噪声特性,从而可以有效证实通过测试低频噪声,就能够验证电子元器件质量是否缺陷,分析电子元器件的使用可靠性。在本文之中,将会基于电子元器件介绍其低频噪声特性和相关测试技术方案。 相似文献
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低频大功率三极管快速筛选技术的应用 总被引:1,自引:1,他引:0
郑石平 《电子产品可靠性与环境试验》2000,(4):21-24
利用快速筛选技术对低频大功率三极管快筛是一种经济、有效的筛选手段,它可以有效地剔除热敏参数不良的器件,保证整批器件的可靠性。 相似文献
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测量噪声功率谱作为筛选光电耦合器件的方法研究(Ⅱ) 总被引:2,自引:0,他引:2
在文献「1」中作者曾提出用测量光电耦合器件噪声功能率谱的方法,筛选光电耦合器件。此 根据低频噪声的幅值。但在实验中发现,由于1/f、g-r和爆裂噪声三者之间相关性较弱,在剔除掉1/f噪声值较大的器件后,g-r噪声和爆裂噪声较大的器件却可能未被易除。 相似文献
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针对变电所中通信电源的核心器件电力金属氧化物半导体场效应晶体管(power MOSFET,P-MOSFET)在大功率、强电流下易损坏、故障率高,直接影响电力通信业务的安全稳定运行的问题,提出了一种基于低频噪声检测的可靠性分析方法.利用互功率谱测量方法检测P-MOSFET内部的本征低频噪声,根据频段阈值法的拐点噪声谱,确定P-MOSFET筛选的上下限阈值大小,建立了P-MOSFET的1/f噪声功率谱密度及其阈值的对应关系式.实验结果表明,与传统的有损检测法相比,该方法能够有效评估P-MOSFET的三种可靠性等级,提高了可靠性筛选的准确率,为其他晶体管的可靠性评估提供了参考. 相似文献
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Yisong Dai 《Microelectronics Reliability》1996,36(5):621-625
It has been reported that after a lifetest not all rejected devices initially exhibit an excess low frequency noise, so that the regular noise criterion using initial noise level measured before a lifetest is insufficient in the industrial application to reliability screening. An improved method used for initial discarding of faulty bipolar junction transistors on the basis of the initial noise before the lifetest and the noise variation after the conventional reliability screening test has been suggested [Yisong Dai, Microelectron. Reliab. 33, 2207–2215 (1993)]. In this paper we report the theoretical analysis and experimental results, which demonstrate that this refined approach is more effective for reliability screening of devices exhibiting long-term parameter drift failure. 相似文献
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The 1/f noise from a forward biased dark solar cell is a non-destructive reliability estimation. The experimentally observed 1/f noise is compared with Kleinpenning's one-dimensional calculations for p-n diodes. At medium and low currents the 1/f noise of n+-p solar cells is about 50 times as large as predicted. Such deviations can be caused by non-uniformities in the large junction area. Local areas with lower built-in potentials at the junction lead to hot spots and reduced reliability. At large currents, reliability problems due to possible poor contacts can be studied from the proportionality between the noise and the square of the current. 相似文献
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Transport and noise characteristics of forward and reverse biased single-crystal silicon solar cells were measured in order to evaluate the solar cell technology. Stress comprising an temperature of 400 K and a DC electric field were applied to a total of 20 solar cells for a period of 5000 h. The samples were quality and reliability screened using noise reliability indicators. From the measurement results it follows that the noise spectral density related to defects is of 1/f type and its magnitude was found to be proportional to the square of the DC forward current at low injection levels. It has been established that samples showing low noise feature high-conversion efficiency. It has also been found out that there is a strong correlation between the sample initial-condition noise and the efficiency after 5000 h of combined stressing. 相似文献
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针对常规的相干解调和非相干解调在水声信道通信中可靠性差的问题,文中提出了一种基于Chebyshev混沌序列的正交宽带调制解调方法。该方法基于海洋水声信道环境与传播特点,采用统计特性接近环境噪声且具有尖锐自相关、宽带特性的Chebyshev混沌序列作为信息载体和同步信号,并利用欧氏距离分类器对接收信号进行非相干分类判决解调。该方法可有效抑制水声信道因多途传播而引起的频率选择性衰落和码间干扰,从而更好地实现低信噪比条件下可靠水声通信。仿真实验证明,在-10 dB以上信噪比环境下,文中所提通信方法在具有多途效应的水声信道上具有良好的通信性能。 相似文献
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