红外读出电路中低功耗列读出级电路的设计

提出了一种用于红外读出电路的新型低功耗列读出级结构。该结构在传统主从列读出级电路的基础上,引进电压检测电路,通过检测相邻列中主运放的输出电压,动态地调节从运放工作电流,避免了传统结构中从运放需要始终工作在大电流下(>Imax)的限制,从而显著地降低了功耗。具体电路采用CSMC DPTM 0.5μm工艺实现,Hspice仿真结果表明,新型主从列读出级中从运放功耗与传统主从列读出级中从运放功耗相比,从运放的平均功耗最大可以节省75%。     

一种适用于ISFET读出的高精度CMOS运放设计

介绍了一种适用于ISFET读出的高精度CMOS运放设计.该运放可为ISFET提供恒定电流、电压偏置,从而便于构建读出电路并于微传感器单片集成.通过运用连续时间自调零技术,大大降低了运放的失调电压、1/f,噪声和温漂等低频噪声.该设计基于0.35/μm CMOS工艺,电源电压3.3V,运放的开环增益超过100dB,输入等效失调电压低至11/μV,总功耗仅为1.48mW.应用该运放实现的pH微传感器已通过实验验证.     

一种适用于ISFET读出的高精度CMOS运放设计

介绍了一种适用于ISFET读出的高精度CMOS运放设计.该运放可为ISFET提供恒定电流、电压偏置,从而便于构建读出电路并于微传感器单片集成.通过运用连续时间自调零技术,大大降低了运放的失调电压、1/f,噪声和温漂等低频噪声.该设计基于0.35/μm CMOS工艺,电源电压3.3V,运放的开环增益超过100dB,输入等效失调电压低至11/μV,总功耗仅为1.48mW.应用该运放实现的pH微传感器已通过实验验证.     

一款适用于高速读出电路的输出级运算放大器设计

〖JP+1〗CMOS运算放大器是红外探测器系统读出电路的重要模块,其性能直接影响红外读出电路性能。本文设计了一款适用于高速读出电路的输出级运算放大器,在负载电阻100 kΩ,负载电容25 pF的条件下,使读出电路的工作频率大于20 MHz。输出级运算放大器由折叠共源共栅差分运放和甲乙类推挽反相运放级联构成。折叠共源共栅差分运放可以实现电路高增益、大输出电压范围和高输出阻抗,同时可以有效减小放大器输入端的米勒电容效应。甲乙类推挽反相运放具有高电压电流转换效率,可以灵活地从负载得到电流或者向负载提供电流,实现高电流增益,驱动大负载。两级运放之间通过米勒电容实现频率补偿,保证运放的稳定性。本文设计的高速输出级运算放大器基于SMIC 018μm工艺设计,最终实现指标:功耗不大于10mW,运放增益>84dB,相位裕度79°,单位增益带宽>100 MHz,噪声78 μV(1～500 MHz),输出电压范围1～5 V,建立时间<15ns。通过设计高速输出级运算放大器,红外读出电路的读出速率和帧频得到有效提高。     

微弱神经信号探测CMOS放大器

采用CSMC 0. 5 μm CMOS工艺设计了微弱神经信号探测放大器芯片.电路适用于卡肤电极.电路采用并联运算放大器差动输入的三运放结构,具有输入阻抗高、共模抑制比高的特点.为防止运算放大器产生振荡,采用了带调零电阻的密勒补偿技术对运放进行频率补偿.电路工作电压±2.5 V,单个运放的功耗为734 μW,增益86.2 dB.电路功耗1.9 mW,增益80 dB,3 dB带宽大于10 kHz,可满足神经信号探测的应用要求.     

低功耗64×64CMOS快照模式焦平面读出电路新结构

介绍了一个工作于快照模式的 CMOS焦平面读出电路的低功耗新结构— OESCA (Odd- Even SnapshotCharge Am plifier)结构 .该结构像素电路非常简单 ,仅用三个 NMOS管 ;采用两个低功耗设计的电荷放大器做列读出电路 ,分别用于奇偶行的读出 ,不但可有效消除列线寄生电容的影响 ,而且列读出电路的功耗可降低 15 % ,因此 OESCA新结构特别适于要求低功耗设计的大规模、小像素阵列焦平面读出电路 .采用 OESCA结构和 1.2μm双硅双铝标准 CMOS工艺设计了一个 6 4× 6 4规模焦平面读出电路实验芯片 ,其像素尺寸为 5 0μm× 5 0μm ,读出电路的电荷处理能力达 10 .3     

单电源运放的偏置原因分析与偏置方法

运放是模拟电路中的核心元件,近些年来单电源运放因其正常工作时只需提供单路电源的独特优点而应用日益广泛。但是单电源运放的设计却比双电源运放复杂。因此对单电源运放偏置的原因进行了深入的研究,并分析比较了各种不同偏置方法的特点,从而为正确分析和设计单电源运放偏置电路提供依据。     

基于新型专用运放的现代传感器调理电路设计

越来越多地选用新型专用运放设计现代传感器调理电路,将成为必然趋势。结合现代传感器调理电路设计中的若干重要技术问题,重点讨论了全差分运放、带EMI/RFI滤波器的仪表放大器、带远程负载检测的仪表放大器、单电源微功耗仪表放大器、静电计级运放等新型专用运放,在现代传感器调理电路设计中的具体应用。表明选用合适新型专用运放设计现代传感器调理电路,可以解决选用常用运放难以解决的问题或得到更高的性能。相关的设计思想与设计技术,也适用于其他类似应用实践。     

一个用于12位40-MS/s低功耗流水线ADC的MDAC电路设计

文中设计了一个用于12位40MHz采样率低功耗流水线ADC的MDAC电路.通过对运放的分时复用,使得一个电路模块实现了两级MDAC功能,达到降低整个ADC功耗的目的.通过对MDAC结构的改进,使得该模块可以达到12bit精度的要求.通过优化辅助运放的带宽,使得高增益运放能够快速稳定.本设计在TSMC0.35μmmixsignal3.3V工艺下实现,在40MHz采样频率下,以奈奎斯特采样频率满幅(Vpp=2V)信号输入,其SINAD为73dB,ENOB为11.90bit,SFDR为89dB.整个电路消耗的动态功耗为9mW.     

低功耗64×64 CMOS快照模式焦平面读出电路新结构

介绍了一个工作于快照模式的CMOS焦平面读出电路的低功耗新结构-OESCA(Odd-Even SnapshotCharge Amplifier)结构该结构像素电路非常简单,仅用三个NMOS管;采用两个低功耗设计的电荷放大器做列读出电路,分别用于奇偶行的读出,不但可有效消除列线寄生电容的影响,而且列读出电路的功耗可降低1 5%,因此OESCA新结构特别适于要求低功耗设计的大规模、小像素阵列焦平面读出电路采用OESCA结构和1.2μm双硅双铝标准CMOS工艺设计了一个64×64规模焦平面读出电路实验芯片,其像素尺寸为50μm×50μm,读出电路的电荷处理能力达10.37pC.详细介绍了该读出电路的体系结构、像素电路、探测器模型和工作时序,并给出了精确的SPICE仿真结果和试验芯片的测试结果.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Noise character analysis and the restraint of self-pulsation laser diodes

We calculate the Langevin noise sources of self-pulsation laser diodes, analyze the effects of active region noise and saturable-absorption region noise on the power fluctuation as well as period fluctuation, and propose a novel method to restrain the noise effects. A visible SIMULINK model is established to simulate the system, The results indicate that the effects of noise in absorption region can be ignored; that with the increase of DC injecting current, the noise effects enhance power jitter, and nevertheless, the period jitter is decreased; and that with external sinusoidal current modulating the self-pulsation laser diode, the noise-induced power jitter and period jitter can be suppressed greatly. This work is valuable for clock recovery in all-optical network.     

High-quality single-crystal CdSe nanoribbons and their optical properties

Large-scale synthesis of single-crystal CdSe nanoribbons is achieved by a modified thermal evaporation method, in which two-step-thermal-evaporation is used to control CdSe sources＇ evaporation. The synthesized CdSe nanoribbons are usually several micrometers in width, 50 nm in thickness, and tens to several hundred micrometers in length. Studies have shown that high-quality CdSe nanoribbons with regular shapes can be obtained by this method. Room-temperature photolumines-cence indicates that the lasing emission at 710 nm has been observed under optical pumping （266 nm） at power densities of 25-153 kW/cm^2. The full width half maximum （FWHM） of the lasing mode is 0.67 nm     

Propagation of hermite-cosh-gaussian beams passing through ABCD optical system with an annular aperture

By using the expansion of the aperture function into a finte sum of complex Gaussian functions, the corresponding analytical expressions of Hermite-cosh-Gaussian beams passing through annular apertured paraxially and symmetrically optical systems written in terms of ABCD matrix were derived, and they could reduce to the cases with squared aperture. In a similar way, the corresponding analytical expressions of cosh-Gaussian beams through annular apertured ABCD matrix were also given. The method could save more calculation time than that by using the diffraction integral formula directly.     

Influence of polarization extinction ratio on distributed polarization coupling detection

Distributed polarization coupling in polarization-maintaining fibers can be detected by using a white light Michelson interferometer. This technique usually requires that only one polarization mode is excited. However, in practical measurement, the injection polarization direction could not be exactly aligned to one of the principal axes of the PMF, so the influence of the polarization extinction ratio should be considered. Based on the polarization coupling theory, the influence of the incident polarization extinction on the measurement result is evaluated and analyzed, and a method for distributed polarization coupling detection is developed when both two orthogonal eigenmodes are excited.     

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正Communications—VLSI Researches and industries of telecommunications have been growing rapidly in the last 20 years and will keep their high growing pace in the next decade.The involved researches and developments cover mobile communications,highway and last-mile broadband communication,domain specific communications,and emerging D2D M2M communications.Radio communication steps into its