背照式CCD量子效率的工艺仿真研究

使用Silvaco软件建立了背照式CCD仿真模型,利用该模型进行了工艺和器件仿真,研究了背面减薄、背面掺杂、界面陷阱和增透膜对背照式CCD量子效率的影响.仿真结果表明:界面陷阱和硅表面反射是量子效率损失的重要原因.在完全去除过渡区后,利用峰值位于表面且具有高杂质浓度梯度的背面掺杂和适当的单层增透膜,可荻得峰值在90％以上的量子效率.     

正面入射In_(0.53)Ga_(0.47)As/InP光电PIN管量子效率研究

本文建立正面入射型In_(0.53)Ga_(0.47)As/InP光电PIN二极管量子效率理论分析模型;分析了提高量子效率的途径:减小结深,改善表面状况对提高器件量子效率有显著作用。应用于器件制作,使器件量子效率在无防反射涂层时可达60％左右,有防反射涂层时高达85％。     

OBIRCH用于集成电路短路的背面失效定位

基于光束感生电阻变化(OBIRCH)的热激光激发定位技术广泛应用于半导体器件的失效分析,特别是大规模集成电路的短路失效定位.详细介绍了OBIRCH技术在芯片背面失效定位时的原理和方法,通过精密研磨、抛光等先进制样手段对失效样品进行开封、芯片背面减薄.采用OBIRCH方法从芯片背面进行激光成像,成功对0.18 μm工艺6层金属化布线的集成电路ggNMOS结构保护网络二次击穿和PMOS电容栅氧化层损伤进行了失效定位,并对背面定位图像和正面定位图像、InGaAs CCD成像进行了对比分析.结果表明,InGaAs CCD成像模糊并无法定位,OBIRCH背面定位成像比正面成像清楚,可以精确定位并观察到缺陷点.因此,OBIRCH技术用于集成电路短路的背面失效定位是准确的,可解决多层结构的正面定位难题.     

PtSi肖脱基势垒红外焦平面光腔结构的研究

重点介绍PtSi肖脱基势垒红外焦平面光腔的介质生长技术及介质的折射率和介质层厚度对PtSi肖脱基势垒探测器性能的影响,发现适当的合金条件和减薄PtSi层厚度有利于提高探测器的量子效率,背面增加抗反射层能减少红外辐射在入射界面的能量损失.     

InP基In0.53Ga0.47As光电探测器的量子效率优化

建立了不同结构的InP基PIN型In0.53Ga0.47As探测器光响应的物理模型.通过引入收集效率函数,模拟计算了探测器量子效率和光响应.采用该模型分别研究了正面进光和背面进光情况下典型的In0.53Ga0.047As/InP PIN探测器的结构参数对器件量子效率的影响.在此基础上提出了两种改进的背照射InGaAs/InP探测器结构,并讨论了其结构参数的优化.     

InGaAs/GaAs量子点红外探测器

与量子阱红外探测器相比,量子点红外探测器具有不制作表面光栅就能在垂直入射红外光照射下工作以及工作温度更高等优势。然而,目前阻碍量子点红外探测器性能提高的技术瓶颈主要来自组装量子点较差的大小均匀性、较低的量子点密度以及垂直入射下子带跃迁吸收效率低等原因。利用分子束外延技术研究了如何从量子点材料生长和器件设计两方面来克服这些困难,并且制作了几种不同结构的InGaAs/GaAs量子点红外探测器。 在77 K时,这些器件在垂直入射条件下观察到了很强的光电流信号。     

衬底减薄提高SiC二极管电流密度的研究

利用自主生长的SiC外延材料,采用晶圆快速减薄与激光退火工艺结合研制600V/30ASiC肖特基二极管。先完成正面工艺,然后贴膜保护正面,SiC外延材料快速减薄到180μm左右,蒸发Ni之后采用激光退火工艺完成背面欧姆的制作,最后溅射TiNiAg完成SiC器件的研制。减薄完的晶圆比不减薄的晶圆正向压降Vf降低了0.15V,电流密度增大了近100%,器件的反向特性基本保持不变。     

背面照射的锑砷铟-砷铟窄带探测器

首次制成了背面照射的高性能光电二极管,它采用液相外延的锑砷铟-砷铟异质结,在77 K时,改变其组分,能使峰值波长从3.1微米调到7微米以上。己得到窄至1760埃的半宽光谱响应(4微米时)。在77K下,内量子效率为90％,零偏压电阻面积乘积2×10~7欧厘米~2。     

P型双面单晶硅太阳电池单元宽度的优化北大核心CSCD

在正面光照和背面光照两种条件下,利用半导体器件仿真软件分析了单元电池宽度对产业化P型双面单晶硅太阳电池电学性能的影响。为进一步提高双面太阳电池光电转换效率,对单元电池宽度进行了优化。仿真结果表明,在正、背面光照条件下,随着单元电池宽度的增大,双面电池短路电流密度均增大;当单元电池宽度较小时,正、背面短路电流密度增大较迅速。随着单元电池宽度的增大,正、背面开路电压均增大,而正、背面填充因子先增大后减小。当正、背面入射光强一定时,存在最优的单元电池宽度,使得双面太阳电池转换效率达到最大值。随着单元电池宽度的增大,正面和背面光电转换效率均先增大后减小,但正、背面光照条件下的最优单元宽度不同。当单元电池宽度一定时,存在最优的正、背面栅电极间距。     

高效率n型硅离子注入双面太阳电池

为进一步提升n型硅双面太阳电池的转化效率,采用了磷离子注入技术制备n型硅双面太阳电池的背场.基于离子注入技术准直性和均匀性好的特点,掺杂后硅片的表面复合电流密度降低到了1.4×10-13 A/cm2,隐性开路电压可达670 mV,且分布区间更紧凑.在电阻率为1～3 Ω·cm的n型硅片基底上,采用磷离子注入技术工业化生产的n型硅双面太阳电池的正面平均转化效率达到了20.64％,背面平均转化效率达到了19.52％.内量子效率的分析结果显示,离子注入太阳电池效率的增益主要来自长波段光谱响应的提升.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.