AlAs/AlGaAs的湿氧氧化及其在VCSEL制备中的应用

根据制备垂直腔面发射激光器 (VCSEL)电流限制层的需要 ,通过实验方法研究了氧化温度、Al组分和晶向等条件对AlGaAs氧化速率的影响 ,得到适用于VCSEL的材料参数和氧化条件 ;对氧化后表面分层、欧姆接触特性变差等现象进行分析 ,得到解决或改善方案。比较AlAs和Al0 .98Ga0 .0 2 As氧化特性及氧化后的热稳定性 ,结果表明Al0 .98Ga0 .0 2 As较AlAs更适于作VCSEL电流限制层。将优化的氧化条件及材料参数应用于VCSEL制备 ,得到室温连续工作的VCSEL器件 ,其阈值电流为 0 .8mA ,激射波长为 980nm ,工作电流为 15mA时输出功率可达 3.2mW。     

垂直腔面发射激光器中选择性氧化工艺稳定性研究

选择性氧化工艺已经成为制备高性能垂直腔面发射激光器(VCSEL)的关键技术,氧化后形成的氧化层提供了良好的电限制和折射率导引,但选择性氧化速率是呈线性规律还是抛物线规律仍存在很大的争议.在多种温度条件下,做了环形沟槽和环形分布孔的氧化实验,这是在垂直腔面发射激光器中采用的两种结构.实验结果表明,氧化窗口形状对氧化速率的影响也依赖温度条件,并对这种实验现象给出了定性解释.     

湿法氧化工艺对VCSEL器件性能的影响

在精确控制气体流量、温度等条件下对样品进行了湿法氧化实验.在SEM下观察了高铝氧化层的微观结构.讨论了高铝氧化限制层中氧化产物体积收缩产生的多孔结构对氧化反应的作用,以及收缩应力对有源区的影响.分析了氧化后器件串联电阻变大的原因.综合考虑这些因素,结合器件结构优化氧化层的设计,制备出了阈值电流低的、性能优良的VCSEL器件.     

基于NRZ调制的40 Gbit/s无误码高速850 nm VCSEL设计与制备

850 nm的垂直腔面发射激光器（VCSEL）是短距离光互连的核心光源。随着对数据中心流量的需求增加，实现不归零（NRZ）调制高速无误码传输是目前的研究热点。本文设计制备了基于λ/2短腔和六层氧化限制层的高速850 nm VCSEL，室温下最高-3 dB带宽达到23.8 GHz。NRZ调制50 Gbit/s(1 m)和40 Gbit/s(100 m)速率下获得清晰的眼图。在未使用预加重、均衡和前向纠错的条件下，通过NRZ调制在1 m和100 m下无误码传输速率分别为40Gbit/s和30 Gbit/s。     

Lateral Oxidation in Vertical Cavity Surface Emitting Lasers

研究了垂直腔面发射激光器(VCSEL)的侧向氧化工艺及其特性.发现对于条形台面,氧化物生长遵循线性生长规律.但对于在VCSEL中采用的两种结构,氧化物的生长(温度高于435℃)表现为非线性生长行为.理论分析表明,台面结构的几何形状对高温下的氧化速率产生了影响.     

垂直腔面发射激光器中的侧向氧化

研究了垂直腔面发射激光器(VCSEL)的侧向氧化工艺及其特性.发现对于条形台面,氧化物生长遵循线性生长规律.但对于在VCSEL中采用的两种结构,氧化物的生长(温度高于435℃)表现为非线性生长行为.理论分析表明,台面结构的几何形状对高温下的氧化速率产生了影响.     

氧化限制结构940 nm垂直腔面发射激光器

为研究氧化限制结构孔径对940 nm垂直腔面发射激光器（VCSEL）特性的影响，制备了不同氧化孔径的940 nm VCSEL，并进行了测试分析。通过PICS3D软件对不同量子阱势垒材料的增益进行仿真计算，选取具有较高有源区材料增益的InGaAs/AlGaAs作为量子阱，并开展了增益-腔模失配设计。在设计优化的基础上，制备了6种氧化孔径的940 nm VCSEL，对其光电输出特性进行测试。结果表明：氧化孔径为4μm的VCSEL，室温下斜率效率为0.93 W/A，最大功率转换效率为40.1%；氧化孔径为7μm的VCSEL，室温下最大输出功率为12.24 mW；氧化孔径为2μm的VCSEL，室温下最大基横模功率为2.67 mW。该器件在2 mA连续驱动电流下，在10～80℃的范围内均可实现边模抑制比大于45 dB的基横模输出。     

椭圆氧化孔径垂直腔面发射激光器的偏振特性

为了改善用于铷原子钟的795 nm垂直腔面发射激光器（VCSEL）的偏振稳定性,研究了不同氧化孔径和椭圆度对VCSEL偏振性能的影响。利用COMSOL Multiphysics的波动光学频域模块模拟了不同氧化孔径对有源区谐振光强的影响。结果表明,当氧化孔径为3.5～4.0μm时,有源区的谐振强度最高。采用可实时观察的湿法氧化系统,研究了氧化温度对氧化速率和氧化孔椭圆度的影响。随着注入电流的增加,三种不同椭圆氧化孔的VCSEL表现出不同的模式特性、偏振特性和偏振角旋转特性。测试结果表明,带有长轴径为3.7μm、椭圆度为1.7的椭圆氧化孔的VCSEL性能最佳。在85℃下,当注入电流为1.5 mA时,输出功率为0.86 mW,激光波长为795.4 nm,边模抑制比（SMSR）为43 dB,线宽为65 MHz,正交偏振抑制比（OPSR）为23.8 dB。在0.6～2.7 mA的范围内,VCSEL的主偏振方向保持不变。     

垂直腔面发射激光器的湿法氧化速率规律

为实现垂直腔面发射激光器(VCSEL)氧化孔径的精确控制,对垂直腔面发射激光器湿法氧化工艺的氧化速率规律进行了实验研究.在不同的温度下对垂直腔面发射激光器样品进行湿法氧化,氧化后采用扫描电镜(SEM)对氧化层不同氧化深度处生成物组成进行了微区分析.结果表明在不同氧化深度处氧化生成物各元素的组分含量不同,尤其氧元素的组分含量差别较大.分析和讨论了氧化不同阶段的反应类型和反应生成物,并建立了氧化速率随时间变化的数学模型,推导出在湿法氧化过程中,氧化速率随时间按指数规律变化,指出在一定的温度下,氧化时间越长,氧化速率越趋于稳定;适当降低氧化温度,延长氧化时间可提高氧化工艺的可控性与准确性.     

超声雾化系统的雾化性能测试

研究建立了超声雾化装置,用激光粒度仪测试了雾化液滴的粒径,并研究了雾化溶液加入量、超声雾化功率、载气流量等雾化参数对超声雾化速率及管路输运损失的影响。结果表明,雾化液滴的粒径约Ф2．6μm．在一定加液量范围内,加液量的变化对雾化速率影响不大,雾化速率随载气流量和雾化功率的增大而增大;而管路输运损失随载气流量的增大先减小,在载气流量为800cm^3／min附近达到最小后,再随载气流量的增大而增大．     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Noise character analysis and the restraint of self-pulsation laser diodes

We calculate the Langevin noise sources of self-pulsation laser diodes, analyze the effects of active region noise and saturable-absorption region noise on the power fluctuation as well as period fluctuation, and propose a novel method to restrain the noise effects. A visible SIMULINK model is established to simulate the system, The results indicate that the effects of noise in absorption region can be ignored; that with the increase of DC injecting current, the noise effects enhance power jitter, and nevertheless, the period jitter is decreased; and that with external sinusoidal current modulating the self-pulsation laser diode, the noise-induced power jitter and period jitter can be suppressed greatly. This work is valuable for clock recovery in all-optical network.     

High-quality single-crystal CdSe nanoribbons and their optical properties

Large-scale synthesis of single-crystal CdSe nanoribbons is achieved by a modified thermal evaporation method, in which two-step-thermal-evaporation is used to control CdSe sources＇ evaporation. The synthesized CdSe nanoribbons are usually several micrometers in width, 50 nm in thickness, and tens to several hundred micrometers in length. Studies have shown that high-quality CdSe nanoribbons with regular shapes can be obtained by this method. Room-temperature photolumines-cence indicates that the lasing emission at 710 nm has been observed under optical pumping （266 nm） at power densities of 25-153 kW/cm^2. The full width half maximum （FWHM） of the lasing mode is 0.67 nm     

Propagation of hermite-cosh-gaussian beams passing through ABCD optical system with an annular aperture

By using the expansion of the aperture function into a finte sum of complex Gaussian functions, the corresponding analytical expressions of Hermite-cosh-Gaussian beams passing through annular apertured paraxially and symmetrically optical systems written in terms of ABCD matrix were derived, and they could reduce to the cases with squared aperture. In a similar way, the corresponding analytical expressions of cosh-Gaussian beams through annular apertured ABCD matrix were also given. The method could save more calculation time than that by using the diffraction integral formula directly.     

Influence of polarization extinction ratio on distributed polarization coupling detection

Distributed polarization coupling in polarization-maintaining fibers can be detected by using a white light Michelson interferometer. This technique usually requires that only one polarization mode is excited. However, in practical measurement, the injection polarization direction could not be exactly aligned to one of the principal axes of the PMF, so the influence of the polarization extinction ratio should be considered. Based on the polarization coupling theory, the influence of the incident polarization extinction on the measurement result is evaluated and analyzed, and a method for distributed polarization coupling detection is developed when both two orthogonal eigenmodes are excited.     

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