共查询到20条相似文献,搜索用时 46 毫秒
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本文介绍一种基于小波变换模极大值进行图像边缘检测的方法。对图像进行二维小波变换,其梯度模值反映了图像的边缘,用这种方法可以检测到图像所有边缘的细节,但同时也会检测到一些伪边缘和噪声点。本文采用图像分块方法确定阈值,并用该阈值来限定模值,与传统边缘检测方法相比,可以得到更好的边缘检测效果。 相似文献
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针对焊缝图像边缘提取过程中,由于工件材质表面特性和复杂光照环境影响产生噪声、伪边缘干扰的问题,提出一种基于改进Canny算子的焊缝边缘提取方法。在边缘检测阶段,首先采用应用改进的双边滤波器进行滤波降噪,降低噪声的同时保留焊缝边缘梯度信息;其次应用改进的Sobel算子,增加了45°、135°方向进行梯度幅值计算,以提高边缘的定位精度。在边缘连接阶段,通过融合Otus与梯度直方图分析法自适应获取双阈值对图像焊缝进行边缘连接。实验表明,该方法在检测精度等方面优于传统Canny算法,提取的中心曲线与相对于实际焊缝中心曲线标准误差降低了46%,平均绝对偏差降低了35%,能够准确地提取焊缝边缘,同时通过自适应获取双阈值,增强了算法自适应性。 相似文献
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针对车牌识别中车牌的边缘信息在Sobel算子的检测下易受到图像采集环境的影响,阈值难以确定,不具有自适应性且对噪声的敏感度高这一特点,提出了一种采用基于二次搜索寻优的阈值选取策略算法,并得出了一套完整的Sobel对车牌边缘检测的算法.实测结果表明:该方法能够更好的解决Sobel算法中存在的由于阈值不自适应性导致边缘检测出现伪边缘点和粗糙点,增强了检测的实时性和鲁棒性. 相似文献
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在对现有的指纹图像增强算法研究和分析的基础上,结合指纹图像的方向特性和灰度特性,提出了一套较完整的指纹图像预处理和特征提取算法.先利用Kirsch算子得到指纹图像的方向场,并对指纹图像进行方向中值滤波,然后通过图像的边缘强度设计局部自适应阈值对指纹图像进行二值化,最后在指纹的细化图像上提取出指纹的细节特征点,并对其进行去伪处理.实验结果表明,该方法处理效果好,运算速度快. 相似文献
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《信息通信》2017,(9)
目前,研究人员己经针对静止的图像提出了一些边缘检测的算法,如Sobel算子、LOG算子和Canny算子等方法。对于单独的一幅图像,可以通过设定一个合适的阈值来取得较好的检测结果,但在视频图像的处理过程中,每帧图像的前景目标不尽相同,随着时间的推移光照也会发生变化,这些都将导致各帧图像的结构发生改变,传统的静态图像边缘检测算法无法自动设定合适的阈值,因此无法对每帧图像都取得较好的检测结果,得到的结果中必然存在许多背景的边缘和人体内部的伪轮廓。针对以上问题,文章将提出改进阈值的Canny边缘检测算法,它可以自动地获取适合被测图像的阈值用于视频图像的处理,并且能够更好适用于复杂背景中人体边缘点的提取问题。 相似文献
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阈值化算法是图像区域分割的一个基本算法.提出一种利用角点和边缘点的像素灰度值均值和全图像像素点灰度值均值加权相加的阈值选取方法.实验表明,该方法能对具有大面积目标的图像进行很好的分割. 相似文献
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Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
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White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
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Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
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In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
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High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
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Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
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This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
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YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
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It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献