基础软件技术的发展趋势

文章在对从基础软件技术的阐述基础之上,分别从基础软件所包含的内容、需求、技术、产品这些角度来对基础软件技术的发展概况进行阐述。不但对当前的软件技术进行了分析,也对基础软件技术今后的发展趋势进行了预测。以我国开发的软件技术在各领域中的应用为切入点,对我国基础软件技术开发和应用中出现的问题进行探讨,为我国今后软件技术的发展提供助力。     

件技术专业学生职业素质的培养

随着21世纪IT技术的高速发展,软件技术专业已经成为国家的重点建设专业;软件技术专业担负着为社会输送高素质高能力的软件技术人才的任务,那么社会究竟需求具有什么样能力的软件技术人才呢?这篇文章从能力的定义、社会对软件技术人才的需求,以及社会对软件技术专业的核心任务需求出发,深入地研究了软件技术专业学生职业素质的需求以及职...     

分布式软件技术及其应用研究

随着计算机软件技术的发展,分布式软件技术凸显出来了越来越多的优点,能够克服一些常见软件的普遍问题,如适应性差、集成度低、稳定性差及开放性差等缺点。因此分布式软件技术在各个领域的应用也越来越广泛。本文重点分析了分布式软件技术,并指出了它的一些应用。     

基于工作过程的软件技术专业课程体系的构建

本文以烟台职业学院这一高职高专类院校的“软件技术”课程体系建设为实例，系统地介绍了基于工作过程的软件技术课程体系，并介绍了基于工作过程的项目实训与教学效果，给出了基于工作过程软件技术课程体系一些详细介绍。     

新时期下高职软件技术专业青年教师教学能力提升路径研究

教师是学生成长过程中的引领者,在学校人才培育过程中肩负巨大的重则.教师能力的高低,关系到软件技术专业开展效度,直接影响到学生专业能力、职业素养培育效度.新时期下,软件技术专业应重视青年教师教学能力的提升,增强青年教师软件技术专业教学效度,以此实现软件技术专业教学的有效性.对此,着重分析高职软件技术专业青年教师能力提升的必要性,提出高职软件技术专业青年教师能力提升策略.     

基于大数据的计算机软件技术应用

本文通过计算机软件技术应用现状的分析,阐述了常用的计算机软件技术,并对大数据时代下计算机软件技术的应用进行了分析。     

计算机软件技术专业人才培养的研究与探索

针对当前计算机软件技术专业的招生与就业现状,分析了为什么难以培养出足够多高质量的计算机软件技术人才,并给出了一些高等学校进行软件技术专业人才培养的一些思路。     

2009中国软件技术大会：因势而变 蓄势待发

本刊讯 2009年11月13日,2009中国软件技术大会在国家会议中心召开,有近千人参加了本次大会,其中有近一半参会者是来自各个大型行业企业的技术经理和架构师.本届软件技术大会针对当前全球金融危机和经济不确定形势下,从软件技术的角度探讨各企业的应对策略以及创新机会.     

计算机软件技术的不可靠性分析

计算机软件发展突飞猛进,对于软件技术而言,其优势逐渐突显出来,在目前硬件技术与软件技术无法协调发展的条件之下,人们开始将注意力转移到计算机软件技术,软件的弊端开始被人们发现,尽管软件技术发展空间比较广阔,但是与此同时,它的不可靠性也是不容忽视的一个问题,文章就计算机软件的不可靠性,进行详细的讨论。     

2012中国软件技术大会

2012中国软件技术大会于11月30-12月1日在国家会议中心成功举办。今年的中国软件技术大会以“大数据时代的企业级应用”为主题，在为期两天的大会上，共有四十多位软件技术领域的资深专家和培训讲师，围绕云计算＆企业架构、大数据架构＆分析、移动应用＆移动互联、产品管理＆用户体验、企业级开发软件工程管理等技术专题详尽解析和分享了各领域的最新技术进展和最佳的技术体验，共有1000多位软件技术经理参加了本届大会。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.