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1.
单片机课程,将C语言知识和编程技巧完全融合单片机的控制系统,模拟工业自动化实时控制和数据传输.中高职学生学习单片机技术,有利于提高中高职学生的职业技能和就业创业能力,有利于学生的继续学习和终身学习.在单片机课程开设时,学生在电子技术应用专业中只学习了《电工基础与实训》和《电子基础与实训》.在学生的C语言零基础上如何教好单片机这门重要课程.  相似文献   

2.
周兴华 《电子世界》2010,(11):20-23
<正> C语言是目前应用非常广泛的计算机高级程序设计语言,在学习PIC单片机的高级语言设计之前,我们需要先简单复习一下C语言的基本语法。如果读者没有学过C语言,建议先学《C程序设计》(清华大学出版社)及《手把手教你学单片机C程序设计》(北京航空航天大学出版社出版)这两本书。  相似文献   

3.
单片机在应用中编程IAP(In-Application Programming)是单片机应用的新技术,可以实现用户应用程序对FLASH存储器编程、擦除和读存储器等功能,但是,使用单片机高级语言C51编程开发应用程序时不容易直接调用IAP功能.介绍了P89C51RD2单片机闪存的操作特点及其IAP功能实现原理.结合C51调用汇编语言子程序时的参数传递规律,分析应用C51与汇编语言混合编程向特定寄存器中写入相应参数调用IAP功能子程序的方法.通过实例,给出了向IAP子程序传递参数的C51程序及相应的汇编程序,实现了IAP功能.在KeilμVision2下仿真和实验,该方法切实可行.  相似文献   

4.
本文给出了8XC196系列单片机C语言和汇编语言的混合编程技术,讨论了C程序和汇编程序为不同模块时的编程方法和嵌入式汇编时C语言和汇编语言的接口技术.  相似文献   

5.
本文在简要分析C语言实型数和单片机浮点数的数据格式的基础上,阐述了PC机与MCS-51单片机之间进行数据通讯时,在PC机上用C语言编程实现C语言实型数与单片机浮点数之间数据格式的互相转换,并给出了相应的转换程序方框图。  相似文献   

6.
杨光军 《电子世界》2013,(17):160-161
介绍了单片机在应用上的重要性,分析了现在单片机教学上的不足之处,提出了基于电子设计项目,应用C语言的单片机教学方式,应用与实际教学并取得了良好效果。  相似文献   

7.
单片机C语言课程教学的探索与实践   总被引:1,自引:0,他引:1  
本文介绍了应用型本科电子类专业大学第一学期引入单片机C语言程序设计课程的教学过程,教师采用讲解、演示的教学方法和焊板、调试、运行的实验方式进行教学.经过二届学生的教学实践证明,学生完全可以初步掌握单片机C语言编程技术,成功地用单片机设计简单的应用系统.这必将极大地激发学生学习专业知识的兴趣,并且以单片机应用为突破口,带动其它课程的自觉、自主学习,这对学生的成长具有非常积极的促进作用.  相似文献   

8.
本文简单介绍了机电控制系统的类别及单片机C语言应用过程中的瓶颈,应用实例充分展示了单片机c语言对机电控制系统的作用。  相似文献   

9.
本文给出了8XC196系列单片机C语言和汇编语言的混合编程技术,讨论了C程序和汇编程序为不同模块时的编程方法和嵌入式汇编时C语言和汇编语言的接口技术。  相似文献   

10.
C语言在单片机串口通信中的应用   总被引:4,自引:0,他引:4  
介绍了单片机串行通讯基本知识,及如何利用MAX32 32扩展单片机配置接口.在此基础上,突破汇编语言程序的可读性和可移植性差的缺陷,用C语言编写了一套接口程序,可根据需要稍加改动,就可以适应各种实际的应用.  相似文献   

11.
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.  相似文献   

12.
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.  相似文献   

13.
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.  相似文献   

14.
本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。  相似文献   

15.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

16.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

17.
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.  相似文献   

18.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

19.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

20.
It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV).  相似文献   

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