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1.
LED铝基板绝缘层的导热能力是影响大功率LED基板应用的主要因素.通过在环氧树脂中添加纳米级高导热填充物氧化铝、碳化硅、二氧化硅来提高绝缘层的导热能力,重点探讨填料种类、含量对基板绝缘层性能的影响,优化了填料配方.采用红外热像仪分析基板表面温度分布情况,通过散热实验测试铝基板的散热效果,结果证明导热效果良好.  相似文献   

2.
提出了一种新的LED灯具封装方式,使用高导热玻璃壳和惰性气体替代传统的环氧树脂进行封装,使用塑料散热器代替传统铝基板,以达到双通道散热的效果。采用ANSYS有限元热分析软件,优化惰性气体层厚度,并通过改变LED个数和单灯功率与传统的陶瓷基板COB封装方式进行热仿真对比分析。研究表明,惰性气体层厚度为1.5 mm时散热效果较好,双通道散热灯具的热阻远小于单通道散热灯具热阻。由于玻璃与传统的环氧树脂相比,透光性高、不易老化、抗紫外线效果好,在大功率、密集型封装和紫外LED灯具大发展的市场环境下,这种新的封装方式应用前景广阔。  相似文献   

3.
阳极氧化铝基板封装LED的结温与热阻的研究   总被引:2,自引:1,他引:1  
采用阳极氧化法制备了氧化铝薄膜铝基板,并将3种功率(1W、3W、5W)的3种颜色(红、蓝、绿)的9种LED分别封装在所制备的铝基板和深圳光恒光电公司的铝基板上,利用正向压降法测试了其结温和热阻,发现:在LED颜色和功率相同的情况下,自制阳极氧化铝基板封装的LED的结温比封装在光恒铝基板上的低2.8~19.4℃,热阻低1.8~9.0K/W,表明自制铝基板的散热性能更优。  相似文献   

4.
远程荧光LED球泡灯热仿真分析   总被引:1,自引:0,他引:1  
采用FloEFD流体分析软件分析了改变LED散热器翅片数和基板厚度对LED球泡灯热量的影响。首先对LED芯片进行仿真,然后用蓝宝石替换LED芯片其他部分简化后仿真,将两者进行了对比。接着对远程荧光LED集成封装光源进行了热模拟,发现将大功率芯片集成在铝基板上,工作时产生的热量非常大,模拟时芯片的结温在159.9℃,超过了LED正常工作结温,所以仅仅依靠铝基板难以达到散热要求。最后对LED球泡灯散热器不同翅片数和不同基板厚度分别进行了热仿真,得出当翅片数为16,基板厚度为2mm时,LED球泡灯的整体散热良好,模拟结果显示LED芯片的温度只有83.8℃,完全满足散热要求。  相似文献   

5.
大功率LED的封装及其散热基板研究   总被引:10,自引:1,他引:9  
从解决大功率发光二极管散热和材料热膨胀系数匹配的角度,介绍了几种典型的封装结构及金属芯线路板(MCPCB)的性能,并简要分析了其散热原理.最后介绍了等离子微弧氧化(MAO)工艺制作的铝芯金属线路板,低成本、低热阻、性能稳定、便于加工和进行多样结构的封装是其突出优点.对采用MAO工艺的MCPCB基板封装的瓦级单芯片LED进行了热场的有限元模拟,结果显示其热阻约为10 K/W;当微弧氧化膜热导率由2 W·m-1·K-1升高到5 W·m-1·K-1时,热阻将降至6 K/W.  相似文献   

6.
从大功率半导体激光器可靠性封装和应用考虑,利用商用有限元软件Abaqus与CFdesign对微通道热沉材料、结构进行优化设计,结合相应的制造工艺流程制备实用化复合型微通道热沉。微通道热沉尺寸为27 mm×10.8 mm×1.5 mm,并利用大功率半导体激光阵列器件对所制备热沉进行散热能力、封装产生的"微笑效应"进行了测试,复合微通道热沉热阻约0.3 K/W,"微笑"值远小于无氧铜微通道封装线阵列,可以控制在1μm以下。复合型微通道热沉能满足半导体激光阵列器件高功率集成输出的散热需求与硬焊料封装的可靠性要求。  相似文献   

7.
当前,散热问题已成为影响LED寿命、光效、光衰和色温等技术参数的重要因素。文章在综合分析散热技术和LED封装对散热性能影响的基础上,利用COB(板上芯片)封装技术,将LED芯片直接封装在铝基板上,研制成了一种基于COB封装技术的LED。与SMD封装LED进行比较,分析了其散热性能。分析结果表明:基于COB封装技术的LED减少了LED器件的结构热阻和接触热阻,使其具有良好的散热性能。  相似文献   

8.
秦典成 《电子器件》2020,43(2):402-407
利用SMT工艺将两种功率不同的LED分别与设计完全相同的热电分离式铜基板及铝基板组装成模组,然后借助结温测试系统及积分球系统对两种金属基板的散热性能进行了对比研究。结果表明,热电分离式铜基板较之热电分离式铝基板仅具备微弱的散热优势,这种优势随着LED的功率增加有所扩大。当LED功率为9 W时,铜基板及铝基板所对应的LED模组热阻分别是3.16℃/W、3.26℃/W;当LED功率为15 W时,铜基板及铝基板所对应的LED模组热阻分别是2.33℃/W、2.46℃/W。  相似文献   

9.
基于微通道致冷的大功率LED阵列封装热分析   总被引:2,自引:2,他引:2  
采用微通道致冷技术,设计了大功率LED阵列封装的微通道致冷结构,并应用热分析软件模拟了其热性能,探讨不同鳍片结构尺寸、流速、功率等参数对LED多芯片散热效果的影响.文中提出了采用交错通道以提高LED封装的散热能力,模拟结果显示,交错微通道致冷的封装结构能很好地满足大功率LED阵列的散热需要.  相似文献   

10.
通过有限元分析软件ANSYS,对一款晶圆级封装的产品进行有限元分析仿真,讨论了空气对流系数、环境温度、基板厚度、焊球间距等因素对芯片热阻的影响。结果表明:考虑成本、散热等综合因素,选择空气对流系数为25×10–6W/(mm·℃)基板厚度为0.10 mm、焊球间距为0.5 mm为最优参数,可满足实际生产需要。  相似文献   

11.
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.  相似文献   

12.
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.  相似文献   

13.
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.  相似文献   

14.
本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。  相似文献   

15.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

16.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

17.
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.  相似文献   

18.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

19.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

20.
It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV).  相似文献   

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