基于噪声方差估计的红外弱小目标检测与跟踪方法

针对红外弱小多目标图像背景杂波干扰严重、弱 小目标检测率低和目标跟踪困难的问题,提出一种 基于噪声方差估计的红外弱小目标快速检测与目标跟踪算法。首先采用改进的形态学 滤波抑制背景噪声, 对处理后的多帧图像进行方差估计初步突出目标像素;然后对其进行信噪比(SNR)估计得到整个图像序列像素得 分,图像中像素SNR高的被标记为目标像素;再对标记过的图像进行分块分析 ,准确提取出连续图 像序列中的目标像素;将检测出的目标像素作为Hough变换的目标跟踪算法的输入,设置双 阈值实现目标 的有效跟踪。实验结果表明,在复杂背景下的红外弱小目标提取中,基于噪声方差估计的目 标检测拥有较 高的检测概率和较低的虚警概率,将其获得的目标像素作为Hough变换的输入,不仅可以有 效跟踪目标, 而且简化了算法的复杂度,实现目标的快速提取和跟踪,具有很高的应用价值。     

一种基于Hough变换新的亚像素定位算法

为了提高数字摄影测量的精度,提出了一种基于Hough变换的亚像素定位算法,针对直线边缘检测和圆边缘检测,分刺采用二次Hough变换法和三等分Hough变换法,通过使用二次Hough变换的方法,克服了直线边缘计算精度低和速度慢的问题,通过使用三等分Hough变换法,克服了传统Hough变换法圆边缘检测性能受参数离散间隔制约及精度低的问题.仿真和实验表明新算法的亚像素定位精度能达到O.02像素,有效地提高了数字摄影测量的精度.     

印刷电路板自动光学检测系统精确校准

采用图像参考比较法进行缺陷识别的PCB自动光学检测系统对取像精度要求严格,利用机器视觉系统,以PCB圆形基准点为基准对系统进行校准。采用Hough变换检测基准点圆心,为了提高检测速度和精度,对输入图像进行了灰度化、直方图均衡化、高斯滤波和边缘检测4步预处理。Matlab仿真结果表明,该方法检测精度达到1个像素,耗时为毫秒级,实时性好。     

基于Hough变换的伪码调相信号检测算法

由于伪码调相信号目标多普勒频率的连续展宽特性,在进行弹道测量时,回波目标在时频图中以“直线”形式出现,传统的基于点检测的恒虚警检测算法会产生大量的虚警。鉴于此,根据伪码调相信号目标多普勒频谱特性,提出了一种基于Hough变换直线检测的目标检测方法。该方法在传统的Hough变换基础上进行了优化,根据回波目标的“直线”特性实现目标检测。将两种算法同时对实测数据进行处理,对比结果表明,基于Hough变换的目标检测算法能够准确地分辨目标并提取目标信息。     

一种改进的红外弱小目标快速检测方法

针对复杂背景下红外弱小目标检测率低、目标跟踪困难的问题,提出一种改进的红外弱小目标快速检测方法。该方法采用改进的形态学滤波抑制背景噪声,对处理后的多帧图像进行方差估计初步突出目标像素,然后对其进行信噪比估计得到整个图像序列像素得分,图像中像素信噪比高的被标记为目标像素,再对标记过的图像进行分块分析,最终准确提取出连续图像序列中的目标像素。检测出的目标像素作为Hough变换的目标跟踪算法的输入,设置双阈值实现目标的有效跟踪。实验结果表明,在复杂背景下的红外弱小目标提取中,基于噪声方差估计的目标检测拥有较高的检测概率和较低的虚警概率,将其获得的目标像素作为Hough变换的输入,不仅可以有效跟踪目标,而且简化了算法的复杂度,实现目标的快速提取和跟踪,具有很高的应用价值。     

基于随机共振的微弱信号检测

在强噪声背景下,基于WV和Hough变换的正弦和线性调频信号检测方法的性能严重下降,为克服这种不足,该文在深入分析FHN随机共振系统参数对滤波能力影响的基础上,提出一种基于随机共振系统检测微弱正弦和线性调频信号的方法。首先借助FHN随机共振模型进行滤波,在此基础上进行WV和Hough变换,将信号的检测问题转换为时频图中的直线检测问题。实验证实,该方法具有较好的效果。     

指纹图像质量综合评估方法

提出一种基于3个评估因子(前景比重、Gabor滤波特征值和指纹图像中心点位置)的指纹图像综合评估方法.为此,先将指纹图像分成若干ω×ω图块,计算每一图块内各像素的方向数并由此得出相关参数决定前景比重因子;再对每一图块进行8方向Gabor滤波,计算滤波结果的方差而得到Gabor滤波特征值因子;根据指纹图像相邻图块方向变化得到中心点位置因子;加权平均3个评估因子得到指纹图像质量评估结果.实验证明,该方法能准确有效地评估指纹图像的质量.     

基于改进Hough变换的海面微弱目标检测

海杂波背景下的微弱目标检测是一个具有挑战性的难题。该文提出一种应用改进Hough变换检测海面微弱目标的方法。对海面的距离-时间像进行时间向二次采样,并平滑得到的子图,对平滑图应用边缘检测然后进行Hough变换,在Hough域通过两级门限检测出微弱目标。该方法不依赖海杂波模型,具有通用性,可以在没有海面先验信息的情况下检测微弱目标。实测海杂波数据的处理结果验证了该方法的正确性和实用性。     

基于梯度信息的随机Hough变换圆轮廓测量技术

在图像处理及计算机视觉中,Hough变换是一种应用非常广泛的图像边缘检测技术.分析了Hough变换的基本原理,指出了传统Hough变换以及随机Hough变换存在的缺陷,提出了一种基于随机Hough变换、综合利用图像本身灰度信息和梯度信息,并根据图形本身性质搜索边缘点的适用于圆周及圆弧轮廓的边缘检测算法.该算法采用"多对一"映射,显著减少了存储所需的容量;采取并行算法提高了运算速度;采用亚像素细分技术对边缘进行进一步的细化处理,提高了测量精度;最后用弦长加权法对边缘点进行拟合,得到被测参数.依据上述原理研制了高精度、高效率图像采集与处理系统,并在该系统上进行了实验.实验结果表明,对于对比度较差的轮廓,其测量不确定度在0.15像素以内.     

基于改进Hough变换的印刷电路板定位配准

电路板自动光学检测中常通过检测电路板的边缘直线来确定其旋转角度和平移量从而完成定位配准,存在运算量大、精度不高的问题.对传统Hough变换检测直线方法进行改进,从图像金字塔、约束投票角度、约束搜索点的区域3个方面提高Hough变换的效率,并利用最小二乘拟合法提高检测精度.定位配准时,先运用改进的Hough变换求取电路板边缘直线的近似参数;然后在原图上对边缘直线进行拟合求取电路板的精确旋转角度和平移量,完成定位配准.实验表明本文方法能准确完成电路板的定位配准,对大小为1 920×1 080像素的电路板图像,定位时间约为60 ms,定位误差小于1个像素.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.