锁相环频率综合器中高性能电荷泵设计

本文基于0.18μm CMOS工艺设计并实现了一种新的高性能电荷泵电路。采用宽输入范围的轨到轨运算放大器和自偏置共源共栅电流镜技术提高了电荷泵在宽输出电压范围内的电流匹配精度;同时,提出通过增加预充电电流源技术来提高电荷泵的初始充电电流,以缩短CPPLLs的建立时间。测试结果表明电荷泵在0.4～1.7V输出电压范围内失配电流小于0.4%,充电电流为100μA,预充电电流为70μA。在1.8V电源电压下,电荷泵电路锁定时的平均功耗为0.9mW。     

A 3.16–7 GHz transformer-based dual-band CMOS VCO

A dual-band, wide tuning range voltage-controlled oscillator that uses transformer-based fourth-order(LC) resonator with a compact common-centric layout is presented. Compared with the traditional wide band(VCO), it can double frequency tuning range without degrading phase noise performance. The relationship between the coupling coefficient of the transformer, selection of frequency bands, and the quality factor at each band is investigated. The transformer used in the resonator is a circular asymmetric concentric topology. Compared with conventional octagon spirals, the proposed circular asymmetric concentric transformer results in a higher qualityfactor, and hence a lower oscillator phase noise. The VCO is designed and fabricated in a 0.18- m CMOS technology and has 75% wide tuning range of 3.16–7.01 GHz. Depending on the oscillation frequency, the VCO current consumption is adjusted from 4.9 to 6.3 m A. The measured phase noises at 1 MHz offset from carrier frequencies of 3.1, 4.5, 5.1, and 6.6 GHz are –122.5, –113.3, –110.1, and –116.8 d Bc/Hz, respectively. The chip area, including the pads, is 1.20.62 mm2 and the supply voltage is 1.8 V.     

一种D类功放中0.5 μm CMOS轨到轨比较器设计

文章设计了一种D类功放中的轨到轨比较器电路。相比于传统的比较器电路,该设计解决了共模信号输入范围大时性能不稳定的问题。仿真表明该比较器电路在-40～125℃和各种工艺角条件下,共模输入电压范围最大可以达到0～5.5V。在125℃高温和5.5V高压条件下,平均工作电流约为0.5mA,性能指标接近并部分超过一些商用芯片。该芯片已经通过0.5μm CMOS工艺流片验证,测试效果良好。     

CMOS毫米波低功耗超宽带共栅低噪声放大器

陈述了一个基于单端共栅与共源共栅级联结构的超宽带低噪声放大器(LNA).该LNA用标准90-nm RFCMOS工艺实现并具有如下特征:在28.5～39 GHz频段内测得的平坦增益大于10 dB;-3 dB带宽从27～42 GHz达到了15 GHz,这几乎覆盖了整个Ka带;最小噪声系数(NF)为4.2dB,平均NF在27 ～ 42 GHz频段内为5.1 dB;S11在整个测试频段内小于-11 dB.40 GHz处输入三阶交调点(IIP3)的测试值为+2 dBm.整个电路的直流功耗为5.3 mW.包括焊盘在内的芯片面积为0.58 mm×0.48 mm.     

一款采用跨导增强技术的新型宽带低噪声放大器

A new broadband low-noise amplifier （LNA） is proposed. The conventional common gate （CG） LNA exhibits a relatively high noise figure, so active gin-boosting technology is utilized to restrain the noise generated by the input transistors and reduce the noise figure. Theory, simulation and measurement are shown. An implemented prototype using 0.13 μm CMOS technology is evaluated using on-wafer probing. S11 and S22 are below -10 dB across 0.1-5 GHz. Measurements also show a gain of 18.3 dB with a 3 dB bandwidth from 100 MHz to 2.1 GHz and an ⅡP3 of-7 dBm at 2 GHz. The measured noise figure is better than 2.5 dB below 2.1 GHz, is better than 4.5 dB below 5 GHz, and at 500 MHz, it gets its minimum value 1.8 dB. The LNA consumes 9 mA from 1.5 V supply and occupies an area of 0.04 mm^2.     

一种应用于深亚微米CMOS工艺的ESD保护电路

本文研究了一种基于动态栅极悬浮技术的ESD保护电路,并根据全芯片ESD防护的要求设计了试验电路。采用TSMC 0.18μm CMOS工艺实现了试验电路,测试显示芯片的ESD失效电压达到了7kV。     

差分网络噪声系数的测试方法研究

本文利用噪声系数的Y因子法测试原理分析了四端口网络和差分网络的噪声特性及其噪声系数与双端口网络噪声系数之间的数学关系方程,测试时分别对差分网络的每个输入输出组合进行双端口噪声系数测试,然后利用该关系方程计算出差分网络的噪声系数。该方法不需要利用巴仑将差分网络转成双端口网络,从而简化了对测试设备的要求。通过对比测试表明,两种方法的测试结果相差在0．5dB以内,可以满足应用需要。     

一种新型分段式高阶补偿带隙基准

根据PN结导通电压及带隙电压温度特性的非线性,分析了经一阶线性补偿后带隙基准的残余温度特性及其变化规律;针对经典高阶补偿的基本原理和实现方案,分析了非线性感应检测高阶补偿结构实现的难点.在此基础上,提出了一种新型两段式高阶温度补偿带隙基准的电路结构,基于CSMC 0.5μm CMOS工艺的Cadence Spectre模拟结果表明,在-40～110℃范围内,温度系数降低到4 ppm/℃以内.     

应用于无线传感器网络低噪声放大器的设计

本文给出一种应用于无线传感器网络射频前端低噪声放大器的设计,采用SMIC0．18μmCMOS工艺模型。在CadenceSpectre仿真环境下的仿真结果表明：该低噪声放大器满足射频前端的系统要求,在2．45GHz的中心频率下增益可调,高增益时,噪声系数为2．9dB,输入P1dB压缩点为-19．8dBm,增益为20．5dB;中增益时,噪声系数为3．6dB,输入P1dB压缩点为-15．8dBm,增益为12．5dB;低增益时,噪声系数为6．0dB,输入P1dB压缩点为-16．4dB,增益为2．2dB。电路的输入输出匹配良好,在电源电压1．8V条件下,工作电流约为6mA。