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Journal of Materials Science - Chitosan is one of the natural cationic polymers with unique properties such as non-toxicity, biodegradability, biocompatibility, environmentally friendly that has...  相似文献   
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One of the unknown problems that cause to perturbation of tokamak function is charged particles pulsation. Applying the toroidal magnetic field to the charged motive particles implicate plasma in the system. This plasma has a frequency that depends on the toroidal magnetic field. Another frequency exists in this system that is caused to the plasma self magnetism. This lateral pulsation is principal origin of perturbation in the system. In this paper, nano-charged particles pulsation is investigated and its frequency is calculated by Buckingham method. Knowing this frequency is necessary to control perturbation. The result of calculations shows that temperature increasing of the system cause to more intense perturbation.  相似文献   
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Abstract— The manufacture of large‐area arrays of thin‐film transistors on polymer substrates using roll‐to‐roll (R2R) processes exclusively is being developed. Self‐aligned imprint lithography (SAIL) enables the patterning and alignment of submicron‐sized features on meter‐scaled flexible substrates in the R2R environment. SAIL solves the problem of precision interlayer registry on a moving web by encoding all the geometry information required for the entire patterning steps into a monolithic three‐dimensional imprint with discrete thickness modulation. The pre‐aligned multiple‐step mask structure maintains its alignment regardless of subsequent substrate distortion. Challenges are encountered in relation to the novel nature of using flexible substrates and building toolsets for the R2R processing. In this paper, methods of the SAIL process, the resulting active‐matrix backplanes, the trajectory of SAIL process development, and the remaining issues for production are presented.  相似文献   
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The importance and difficultly of asset tracking make it worthy of attention. We focus on data centers consisting of vertical racks where each rack may accommodate a variety of equipment. We describe an asset tracking system which automatically detects and identifies equipment within rack; has “pinpoint” accuracy, i.e., location resolution equals asset size; relays this information to possibly several management back-ends; includes a back-end application that maintains a location history for all equipment; and uses a visualization tool to display both the current state and the history of deployment. The solution features a flexible architecture that simplifies the connection with both existing and future asset management applications. The architecture supports simple configuration, load balancing, and redundancy. Care has been taken to use widely recognized standards wherever possible. Recommended by Monem Beitelmal  相似文献   
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