共查询到20条相似文献,搜索用时 921 毫秒
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SnAgCu无铅焊膏用活性物质研究 总被引:3,自引:3,他引:0
以SnAgCu无铅焊膏铺展性能为主要指标,通过回流焊接实验,对用于助焊剂的17种有机酸活性物质进行了筛选。选取两种性能较好的有机酸配成复合活性物质,并对该活性物质的组成进行优化。用湿热试验测试焊后残留物的腐蚀性。结果表明:以羧基官能团比例为3:7的丁二酸和一元酸A混合物作为活性物质,并添加质量约0.66%的乙醇胺调整酸度,得到了pH值约为3的助焊剂;此助焊剂性能优良,可使焊点铺展率达到84%。使用含有此助焊剂的焊膏,采用回流焊接工艺在PCB板上贴装片式元件,所得焊点光亮饱满,且焊后残留物无腐蚀性,可以实现免清洗。 相似文献
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无铅焊锡线中无卤素免清洗助焊剂的研制 总被引:4,自引:0,他引:4
研制了一种新的用于无铅焊锡线中的无卤素助焊剂,选取芳香族酸、二元羧酸以及有机胺为活性剂主要成分.并参考日本工业标准JIS-Z-3282-2000和相关国家标准GB/T 9491-2002对其进行了全面的性能测试.结果表明,该助焊剂在可焊性、绝缘性、腐蚀性等方面均符合标准.扩展率大于80%;表面绝缘阻抗大于1011Ω;无腐蚀性.且具有焊接效果良好、无卤素、无毒、环保,焊后免清洗等优点. 相似文献
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清洗是PCB组装中的一道重要工序,它对电子产品的质量和可靠性起着极为重要的作用.对于高性能电子产品,不论是通孔插装还是表面组装,在回流焊、波峰焊或浸焊后,基板及其组件都需要进行严格有效的清洗,以去除助焊剂残留物和各种污染物.特别是对于表面组装工艺,由于助焊剂可进入表面组装元器件和基板之间的微小空隙中,从而使清洗显得更为... 相似文献
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Experimental Wettability Study of Lead-Free Solder on Cu Substrates Using Varying Flux and Temperature 总被引:2,自引:0,他引:2
Dong-Xia Xu Yong-Ping Lei Zhi-Dong Xia Fu Guo Yao-Wu Shi 《Journal of Electronic Materials》2008,37(1):125-133
The selection of soldering flux plays a critical role in promoting wetting and product reliability of printed circuit board
assemblies. In this study, the effects of fluxes on the wetting characteristics of the Sn-3.0Ag-0.5Cu solder alloy on Cu substrates
was researched by using various flux systems at different soldering temperatures. Because of the distinct characteristic of
the lead-free solder—poor wettability—three kinds of fluxes [no-clean flux with high solid content (NCF), rosin mildly activated
flux (RMA) and water-soluble flux (WSF)] were chosen for the wetting experiments. The wetting time and force were the evaluating
indicators. The experimental observations indicated that the wettability clearly depended on the soldering temperature and
flux system when using the same solder. Furthermore, the corrosion potential of flux residues was measured by surface insulation
resistance (SIR) testing. Scanning electron microscope (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to determine
the contents of the flux residues and corrosion products. 相似文献
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《Electronics Packaging Manufacturing, IEEE Transactions on》2006,29(3):217-223
Printed circuit board (PCB) specimens containing three different IPC-B-25 test structures were exposed to temperature/humidity/bias conditions in order to evaluate the effects of conformal coating, conductor spacing, voltage bias, flux chemistry, and test environment on surface insulation resistance (SIR). Results indicate that conformal coatings improve reliability, provided that sources of contamination on the PCB and within the coating are minimized. The presence of fibrous contaminants within the coating represented a preferential medium for moisture adsorption and ion transport, leading to accelerated reduction of SIR. In the absence of contamination, PCBs with conformal coatings were found to be less susceptible to SIR degradation than uncoated PCBs, with silicone providing better protection than urethane, and acrylic providing the least protection of the three coating materials evaluated. Conductor spacing was observed to represent a factor in the electrochemical migration (ECM) process independent of electric field, indicating that updated test structures are required to predict reliability of today's high-density assemblies. The SIR failure rate with rosin-based no-clean flux was observed to be greater than that with aqueous-based no-clean flux. A higher failure rate was also observed for tests conducted at 40$^circ$ C/93% RH than for 85$^circ$ C/85% RH. Due to the more rapid evaporation of weak organic acids in the flux residues at higher temperatures, test results obtained at 85$^circ$ C/85% RH will not accurately predict reliability at lower temperatures for PCBs processed using no-clean flux. PCB specimens were exposed to temperature/humidity/bias conditions in order to evaluate the effects of conformal coating, conductor spacing, voltage bias, flux chemistry, and test environment on reduction of surface insulation resistance. Results indicate that, in the absence of contamination, conformal coatings improve reliability. 相似文献
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Jeongkyu Heo Jae Choon Kim Ki Hyuk Kim Jae-Sung Rieh Jin Taek Chung Sung Woo Hwang 《Microwave and Wireless Components Letters, IEEE》2008,18(5):323-325
We fabricated and characterized heterojunction field effect transistor radio frequency (RF) power amplifier (PA) test fixtures, for wireless applications, with various printed circuit board (PCB) structures. The RF matching and bias circuits of the test fixtures were designed so that they had the same RF characteristics. The only source of the variation of the RF gain (S21) was different thermal characteristics of each PCB. The values of the junction temperature (TJ) and the junction-to-ambient thermal resistance (R J A) of each test fixture were shown to be changed as much as 80deg C and 30deg C / W, respectively, by the change of PCB structures. The change of Rja was shown to be originated from the change of the PCB thermal resistance, assuring that the structure of the PCB was the dominant factor in determining R J A Finally, we obtained a universal relation between S21 of the amplifier and Tj. This work suggests that thermal budget of PCB is as important as that of package in wireless RF equipments. 相似文献
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Conductive anodic filament (CAF) formation, a failure mode in printed wiring boards (PWBs) exposed to high humidity and high
voltage gradient, has caused catastrophic field failures. This study quantified the effect of flux chemistry, applied voltage
(V), spacing (L), and temperature on the failure rate. Test vehicles, which had hole-to-hole spacing of 0.5 mm or 0.75 mm,
were processed with one of three water-soluble fluxes (WSFs), and a heated control was also evaluated. The samples were placed
in a temperature humidity chamber at 85%RH, at one of three temperatures: 75°C, 85°C, or 95°C. A voltage of 150 V or 200 V
was applied to the test vehicle and periodically removed so that a measurement could be taken. A specially designed linear
circuit was used to determine when the insulation resistance dropped significantly, indicating a failure. Activation energies
were determined. The mean time to failure was a function of L4/V2. 相似文献
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The elimination of chlorofluorocarbons (CFCs) and other chlorinated cleaning solvents due to their long-term environmental
impact has lead electronic assemblers to examine soldering fluxes that reduce or eliminate the need for post-solder cleaning.
Today, low solids fluxes are replacing more traditional rosin-based and water-soluble fluxes because many of them can be used
in a no-clean process. Most low solids fluxes use weak organic acids as active ingredient. It has been reported that some
of these weak organic acids leave behind residues that are corrosive to copper. Surface Insulation Resistance (SIR) measurements
of flux-processed comb patterns have been the main test method used to determine the corrosivity of flux residues. This test
has been performed with test samples exposed to accelerated temperature and humidity conditions of 85°C and 85%RH and a 50
V bias. Recent data on some weak organic acids suggests that they slowly disappear at this temperature and a lower test temperature
of 65°C has been introduced into the new Bellco Standard. In Europe, this test is normally performed at 40°C and 93% RH. This
paper reports on the application of SIR tests to study the corrosive behavior of three carboxylic acids (succinic, glutaric,
and adipic acids) that are commonly used as the active ingredients in soldering fluxes. Coupons treated with equi-molar solutions
of the acids were either exposed to reflow-soldering conditions or wave soldered face-up to create partially heated residues.
Both tests were run under two different accelerating conditions, 85°C/85%RH for 7 days or 40°C/93%RH for 20 days. This latter
condition is being considered for inclusion in an IPC standard. At the end of the test period, both corrosion and SIR test
samples were examined under a microscope and any residues or dendritic growth were documented. SEM and EDX characterization
was also performed to determine the residue and dendrite composition. 相似文献
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A. Heimbrock Dr.-Ing. H. O. Seinsch Prof. Dr.-Ing. 《e & i Elektrotechnik und Informationstechnik》2005,122(7-8):274-282
All traditional calculation schemes to determine the harmonic losses of cage induction motors, which are supplied by PWM converters, result in far too low values. Therefore comprehensive experimental investigations have been undertaken to unveil the dependences of the losses and the physical origin. The investigations show that the harmonic losses do not depend on load, however, the harmonic currents are increased very much by load. This effect has been unknown up to now and is interlinked with the change of the flux distribution in dependence on slip. The lines of force of all harmonics comprise the same loop at synchronism as at sinusoidal supply, whereas at small values of slip a high percentage of the harmonic fluxes does not cross the air-gap, but loops as slot quadrature field. The test results form a solid basis for the development of an improved computation method to determine the harmonic losses. 相似文献
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