离子束辅助沉积入射角对FexCr1-x合金薄膜微结构及磁性的影响

运用离子束辅助沉积技术在不同的离子束入射角(0°,15°,30°,45°,60°,75°)下,制备了的FexCr1-x合金薄膜(x=50,67),并对其微结构和磁性进行了研究.在两组不同成分的薄膜中,均发现仅在入射角为45°时,垂直于膜面的方向上出现了(002)择优取向,且伴随着膜面的平面磁各向异性,而在其他角度的情况下,无择优取向及平面磁各向异性获得.根据择优取向的形成机制,斜入射的离子束在沉积过程中起到了混合及沟道效应的作用.     

厚度对DLC薄膜内应力的影响研究

采用ECR微波等离子体增强化学气相沉积的方法于C1H2/H2/Ar2等离子环境中在单晶Si(111)晶面上制备了不同厚度的DLC膜样品,研究了薄膜的厚度随沉积时间的变化及薄膜的硬度、内应力随厚度的变化关系.结果表明,在沉积时间变化范围内,厚度与沉积时间基本呈线性关系,沉积速率可达80nm/min;制备态样品存在的内应力...     

离子束辅助沉积改善铝薄膜的取向生长

高性能的铝薄膜因具有低的声阻抗而广泛应用于声表面波器件的制备.本文运用Ar离子束辅助沉积技术,在64°Y-X切向的铌酸锂基片上成功的制备出(111)高度取向的铝薄膜,并研究了Ar离子魄注入角度对薄膜的织构形成的影响.结果表明,薄膜织构度对辅助离子束入射角度非常敏感,在辅助离子束入射角为35°时,薄膜(111)织构最强,电阻率最小,附着力最好,适合于声表面波器件中的应用.     

氩离子辅助沉积生物玻璃陶瓷膜的结构和特性研究

用XRD、FTIR、XPS和EDAX等分析方法对 60keV、剂量为 7× 10 15ions/cm2 的Ar+ 离子束在钛合金表面辅助沉积的生物玻璃陶瓷 (BGC)膜进行表征。发现膜呈非晶 ;膜中Ca P比高达 3 .68,高于BGC原材料的Ca P比 1.3 0 ;沉积膜中出现C和O的污染 ,并引入了碳酸根基团 (CO3 -2 )。实验发现 ,BGC膜与Ti合金结合十分牢固 ;在 0 .9%的盐溶液中浸泡Ca+ + 离子的溶解性与辅助剂量密切相关 ;这种Ar+ 离子辅助沉积的膜在Hanks溶液中的抗溶解特性 ,未退火的膜远优于退火的膜 ,也优于Ti合金。文中对观察到的现象进行了讨论。     

热处理对立方织构Ni-5%(体积分数)W基带上Ag薄膜择优取向的影响

采用磁控溅射法在立方织构Ni-5%(原子分数,下同)W基底上沉积了Ag薄膜作为第二代高温超导带材--YBaCuO涂层导体的导电缓冲层,并通过后期在Ar气氛下热处理使Ag膜具有(200)择优取向.磁控溅射后Ag膜的择优取向为(111),随着热处理温度的升高,(200)择优取向强度增加.采用慢降温工艺即在900℃下恒温30min,然后以较慢的速率10℃/h降至800℃后样品随炉冷却,有利于Ag薄膜由(111)向(200)的择优生长转变.     

(Pb0.90La0.10)Ti0.975O3/LaNiO3薄膜的射频磁控溅射制备和性能研究

采用射频磁控溅射技术,以LaNiO3(LNO)作为过渡层,在SiO2/Si(100)、Pt(111)/Ti/SiO2/Si(100)衬底上分别获得了(100)、(110)取向的(Pb0.90La0.10)Ti0.975O3(PLT)铁电薄膜.研究了LNO/Pt(111)/Ti/SiO2/Si(100)和LNO/SiO2/Si(100)基底对PLT薄膜微结构和铁电性能的影响.实验结果表明,与在LNO/Pt(111)/Ti/SiO2/Si(100)基底上沉积的(110)取向的PLT薄膜相比较,在LNO/SiO2/Si(100)基底上沉积的高度(100)取向的PLT薄膜具有更好的微结构和更高的剩余极化强度,其2Pr为40.4μC/cm2.     

离子束入射角度对Co50Nb50薄膜微结构的影响

利用离子束辅助沉积技术,通过改变离子束入射方向与薄膜表面法线的夹角,制备了一系列厚度为50 nm的Co50Nb50薄膜,并研究了离子束入射方向对薄膜表面结构的影响.实验中,离子束入射角分别为0°,30°,45°,75°和85°(掠射).研究结果表明,所得到的薄膜均为非晶结构.离子束垂直入射(0°入射)时,薄膜表面产生渗流花样;入射角为30°时,渗流现象更加明显,薄膜表面粗糙度增大;随入射角增至45°,表面渗流现象减弱,薄膜变得平整;当入射角进一步增加到为75°,薄膜表面出现平行于入射方向的纳米条纹;离子束掠入射(85°入射)时,薄膜表面条纹的平均宽度减小,均匀性提高.研究表明上述表面结构的变化是原子沉积、离子束溅射和沉积原子热扩散共同作用的结果.     

斜离子束辅助沉积对Co30Nb70薄膜结构及其热稳定性的影响

本文研究了离子束辅助沉积(IBAD)Co30Nb70薄膜过程中离子束入射角对薄膜微结构及热稳定性的影响.实验结果表明,在0°到75°范围内改变离子束入射角均可得到Co30Nb70非晶薄膜,但样品微结构出现变化,观察到多孔和沟槽结构.所有样品经300℃退火30 min,入射角为45°制备的样品出现强织构bcc亚稳相,其它入射角沉积的样品均保持非晶相.继续将样品在450℃退火30 min,入射角45°沉积的样品中bcc亚稳相消失,溶人非晶相;15°和75°入射沉积的样品开始晶化.分析认为离子束入射角变化引起的原子混合效应的改变,以及薄膜中的多孔结构对上述变化有重要影响.     

飞秒脉冲激光沉积Si基a轴择优取向的钛酸铋铁电薄膜及Ⅰ-Ⅴ特性研究

采用飞秒脉冲激光沉积系统,在Si(111)衬底上制备了a轴和c轴择优取向的Bi4Ti3O12薄膜.X射线衍射(XRD)表明室温(20℃)下沉积的Bi4Ti3O12/Si(111)薄膜呈c轴择优取向,晶粒的平均直径为20nm.在500℃沉积的Bi4Ti3O12/Si(111)薄膜呈a轴择优取向.测量了薄膜的电滞回线和Ⅰ-Ⅴ特性曲线,并用分布参数电路研究了Bi4Ti3O12薄膜的Ⅰ-Ⅴ特性曲线和铁电性的关联性.a轴择优取向Bi4Ti3O12薄膜的剩余极化强度Pr=15μC/cm2,矫顽力Ec=48kV/cm.     

取向对PLD法制备BiFeO3薄膜性能的影响

以快速等离子烧结法(SPS)制备的BiFeO3块体为靶材,用激光脉冲沉积(PLD)法在不同衬底上制备了BiFeO3(100)/LaNiO3(100)/Si(100)、BiFeO3(111)/LaNiO3(111)/SrTiO3(111)、BiFeO3(110)/Pt/TiO2/SiO2/Si、BiFeO3(110)LaNiO3(110)/Pt/TiO2/SiO2/Si不同择优取向的薄膜,并对薄膜进行了XRD和SEM分析。X射线衍射结果表明,BiFeO3薄膜外延沉积在导电层衬底上,并且它们具有相同的高度取向。SEM分析表明,薄膜上的晶粒是柱状形态,表面光滑致密且颗粒分布非常均匀,晶粒的边界和尺寸也能被清晰地观察到。通过铁电铁磁性能研究,BiFeO3(111)择优取向性能最佳。SrTiO3衬底上(111)取向的BiFeO3薄膜铁电剩余极化值达到了30.3μC/cm2,漏电流为1.0×10-3 A/cm2,饱和磁化强度为20.0kA/m。     

Morphology and texture evolution of nanostructured CaF2 films on amorphous substrates under oblique incidence flux

The morphology and biaxial texture of vacuum evaporated CaF(2) films on amorphous substrates as a function of vapour incident angle, substrate temperature and film thickness were investigated by scanning electron microscopy, x-ray pole figure and reflection high energy electron diffraction surface pole figure analyses. Results show that an anomalous [220] out-of-plane texture was preferred in CaF(2) films deposited on Si substrates at < 200?°C with normal vapour incidence. With an increase of the vapour incident angle, the out-of-plane orientation changed from [220] to [111] at a substrate temperature of 100?°C. In films deposited with normal vapour incidence, the out-of-plane orientation changed from [220] at 100?°C to [111] at 400?°C. In films deposited with an oblique vapour incidence at 100?°C, the texture changed from random at small thickness (5 nm) to biaxial at larger thickness (20 nm or more). Using first principles density functional theory calculation, it was shown that [220] texture formation is a consequence of energetically favourable adsorption of CaF(2) molecules onto the CaF(2)(110) facet.     

二氧化钛过渡层对脉冲激光沉积钛酸锶钡薄膜微结构和介电性质的影响

选取极薄Ti02作为过渡层,采用脉冲激光沉积法分别在Si(100)和Pt(111)/Ti/SiO2/Si(100)基底上制备了Bao.6Sro.4TiO3(BST)薄膜,研究过渡层对BST薄膜微结构及电学性质的影响.发现厚度20纳米以内的锐钛矿相结晶TiO2过渡层可使BST薄膜由无规则取向转变为(111)择优取向,而非晶和较厚TiO2过渡层对BST薄膜的取向无影响.结晶的TiO2过渡层也使薄膜的表面颗粒变细.还研究了不同厚度TiO2对BST薄膜电学性质的影响,结果表明BST薄膜在Pt(111)底电极上加入极薄的结晶TiO2过渡层后电学性质有明显改善,薄膜的介电常数和可调谐度提高,而介电损耗降低.加入膜厚约5nm的TiO2过渡层后,测试频率为10 kHz时薄膜相应介电常数、介电损耗及可调谐度分别为513、0.053和36.7%.     

An orientation competition in yttria-stabilized zirconia thin films fabricated by ion beam assisted sputtering deposition

A previously found orientation competition in ion beam sputtered yttria-stabilized zirconia thin films was studied in detail. The effects of sputtering energy and deposition angle were analyzed in ion sputtered films without assisting ions bombardment. It is found that for normally deposited films, (001) and (011) orientations are favored at low and high sputtering energy respectively. For inclined substrate deposited films, as deposition angle increases, (001), (011) and (111) orientations are advantaged in turn. The results can be attributed to the in-plane energy exchange of deposition atom and adatoms. In ion beam assisting deposited YSZ films of low assisting ions energy and current, a (001) oriented biaxial texture is gradually induced as ion energy increased. In the case of ion beam assisted inclined deposition of 45°, (001) orientation is enhanced and two preferential in-plane orientations are found coexist.     

Microstructure and electrical properties of Pb(Zr0.52Ti0.48)O3 ferroelectric films on different bottom electrodes

The crystalline quality, dielectric and ferroelectricity of the Pb(Zr_0.52Ti_0.48)O₃ (PZT) films deposited on the LaNiO₃ (LNO), LNO/Pt and Pt bottom electrodes were comparatively analyzed to investigate the possibility for their application. LNO thin films were successfully prepared on Si (100) and Pt(111)/Ti/SiO₂/Si substrates by modified metallorganic decomposition (MOD). The PZT thin films were spin-coated onto the LNO, LNO/Pt and Pt bottom electrodes by sol–gel method. The crystallographic orientation and the microstructure of the resulting LNO films and PZT thin films on the different bottom electrodes were characterized by X-ray diffraction analysis. The dielectric and ferroelectric properties of PZT films on the different bottom electrodes are discussed. The PZT films deposited onto Pt/Ti/SiO₂/Si and LNO/Si substrates show strong (110) and (100) preferred orientation, respectively, while the films deposited onto LNO/Pt/Ti/SiO₂/Si substrates show the peaks of mixed orientations. PZT films on LNO and LNO/Pt bottom electrodes have larger dielectric constant and remnant polarizations compared with those grown on the Pt electrode.     

Effect of beam voltage on the properties of aluminium nitride prepared by ion beam assisted deposition

The effects of nitrogen-beam voltage on the structure, stress, energy band gap and hardness of AIN thin films deposited on Si (111), Si (100) and sapphire (0001) by ion beam assisted deposition (IBAD) are reported. As the nitrogen-beam voltage was increased from 50 to 200 V, the stress and disorder in the AIN films increased as determined by X-ray diffraction, FTIR and Raman spectroscopy. The preferred orientation of the film's c-axis changed from completely normal to the film at 100 V, to a mixture of normal and in the plane of the film at 200 V. For AIN films deposited under the same conditions, the films were more highly oriented on sapphire (0001) than in Si (111). The hardness of the films increased from 18.2 to 23.7 GPa with the nitrogen-beam voltage, and possible reasons for this change in hardness are considered.     

Effect of chelating agents on the preferred orientation of ZnO films by sol-gel process

The effect of chelating agents of ZnO precursor solutions on crystallization behavior was investigated. Two different additives, monoethanolamine (MEA) and diethanolamine (DEA), and crystalline Pt (111)/Si and amorphous SiN _x /Si substrates, were used for this study. ZnO film grown on SiN _x /Si from a DEA-chelated precursor solution shows a poorly oriented microstructure with weak crystallization peaks, while ZnO film grown on Pt(111)/Si shows a c-axis preferred orientation. In the case of ZnO films prepared with a MEA-chelated precursor solution, all films show a strong preferred orientation irrespective of substrate type. This result clearly demonstrates the role of the chelating agent on the crystallographic orientation and crystallization behavior of sol-gel processed ZnO films.     

Characterization and properties of CrN films deposited by ion-source-enhanced middle frequency magnetron sputtering

CrN films with deposition rates of 130-180 nm/min were deposited on Si (111) and carbamide alloy substrates by an ion-source-enhanced middle frequency magnetron sputtering system. Increasing of ion source voltages promoted the growth of CrN films with preferred orientation of (200). The deposited CrN films are composed of nanocrystalline particles with sizes of ∼20 nm embedded in polycrystalline matrix. The hardness of the CrN films increases from 1300 Kg/mm² without ion source bombardment to 2400 Kg/mm² with ion source voltages of 1000 V. Origins for the increasing of hardness can be attributed to dislocation strengthening and densification effects.     

Effects of nitrogen partial pressure on microstructure,morphology and N/Ti ratio of TiN films deposited by reactive magnetron sputtering

Abstract

TiN films were deposited on Si(111) substrates at different nitrogen partial pressures with reactive magnetron sputtering. The crystal structure and preferred growth orientation of the films were determined using X-ray diffraction (XRD) analysis. Their morphology and composition were analysed using field emission scanning electron microscopy (FESEM) and energy dispersive spectroscopy (EDS). It is found that with the increase in nitrogen partial pressure, the growth of TiN films varies from the {111} preferred orientation to the {100} preferred orientation and the deposition rate of TiN films decreases. When the {111} preferred orientation is presented, TiN films reveal a kind of surface morphology of triangular pyramid with right angles; while the {100} orientation is dominant, TiN films characterise another kind of domelike surface morphology. Furthermore, the N/Ti ratio of the TiN films first increases, then decreases and increases again as nitrogen partial pressure enlarges.     

溶胶-凝胶法中热处理对PMNT薄膜结构的影响

研究用溶胶－凝胶方法制备ＰＭＮＴ（铌镁酸铅）薄膜的工艺过程．通过ＸＲＤ和ＳＰＭ系统地分析了热处理条件（热解温度和退火条件）与ＰＭＮＴ薄膜的形态．结晶和取向的对应关系,已建立起制备高度取向 ＰＭＮＴ薄膜的工艺．并成功地在Ｐｔ／Ｔｉ／ＳＩＯ_２／Ｓｉ衬底上制备成（１１１）取向的ＰＭＮＴ薄膜．     

等离子体辅助反应式脉冲激光熔蚀制备AlN薄膜的低温生长

使用等离子体辅助反应式脉冲激光溅射沉积薄膜的方法在Ｓｉ（１１１）和Ｓｉ（１００）基片上已经成功地低温制备出ＡｌＮ多晶膜。实验表明,当脉冲能量密度ＤＥ＝１．０Ｊ·ｃｍ－２,脉冲频率ｆ＝５Ｈｚ,氮气气压ＰＮ２＝１．３３×１０４Ｐａ,基底温度ｔｓｕｂ＝２００℃,放电电压Ｖ＝６５０Ｖ,基靶距离ｄＳ－Ｔ＝４ｃｍ时薄膜的生长速度等于６ｎｍ／ｍｉｎ。ＡｌＮ薄膜的折射率为２．０５,和基底的取向关系分别为：ＡｌＮ（１１０）∥Ｓｉ（１１１）和ＡｌＮ（１００）∥Ｓｉ（１００）。